5500 scanning probe microscope

For the macroscopic observation, an epi-fluorescence microscope (IX51W, Olympus, Inc., Tokyo, Japan) equipped with 60× water immersion objective (N.A. 1.00) was used. The spatial resolution at a wavelength of 560 nm was approximately 350 nm based on the Rayleigh criterion. For SPT, an inverted fluorescence microscope (IX-71, Olympus, Inc.) equipped with 100× oil immersion objective (N.A. 1.45) was used. With the light excitation by 532 nm laser, the obtained diffusion of fluorescent probes in the bilayer was recorded by EM-CCD camera (iXon DU-897, Andor Technology, Ltd., Belfast, UK) at the frame rate of 30 frames/s (fps) or 500 fps. The effective pixel size of the SPT recording was 275.86 nm. We observed the surface structure of the PI+PC-SLBs by AFM (5500 Scanning Probe Microscope, Agilent Technologies, Inc., Santa Clara, CA, USA) with magnetic AC mode before and after addition of FBP-17. For AFM imaging, TYPE VI MAC Lever (Agilent Technologies, Inc.) with typical spring constant of 0.2 N/m was used. The epi-fluorescence microscope and AFM observations were performed at an ambient temperature of 23 °C.

AFM images were produced using an Agilent 5500 scanning probe microscope. Raman and PL spectroscopy were conducted using Invia Raman Microscope (Renishaw) system with a 532 nm excitation wavelength at 20 mW power and 50X objective. XPS has been performed using a Thermo fisher scientific Thetaprobe system. SEM was performed using a Joel JSM-7500F FEG-SEM. The preparation of the lamella was performed using a Zeiss NVision 40 CrossBeam FIB system. TEM was performed in the Loughborough Materials Characterisation Centre using an FEI Tecnai F20. Electrical measurements were performed in air using an Agilent 4155C semiconductor parameter analyser connected to a cascade micropositioning stage.