Rtespa
The RTESPA is a laboratory equipment product from Bruker. It is designed for conducting various analytical and research tasks. The core function of the RTESPA is to provide a platform for sample analysis and data collection, without further interpretation or extrapolation on its intended use.
8 protocols using rtespa
Atomic Force Microscopy of Silver Nanoparticles
Atomic Force Microscopy of Metastatic Tissue
Surface image quality was optimised by lowering the scan rate to 0.2 Hz. All images were acquired with 50 μm × 50 μm scan sizes, 512 × 512 data point resolution, and a pixel size of 97.7 nm. In addition to height, amplitude and phase images were also recorded. The AFM was installed on a vibration isolation table (minus k technology BM-10, Inglewood, CA, USA) to compensate for regular environmental vibrations and placed inside an acoustic enclosure (Ambios technologies Isochamber, Santa Cruz, CA, USA) for thermal and building vibration isolation. The AFM imaging was performed in air at a constant ambient temperature.
Nanowizard AFM Characterization of Violin Samples
Atomic Force Microscopy of Cancer Cells
Nanoscale Imaging of Symptomatic and Asymptomatic Carotids
3D-AFM image of atheromatous plaque.
Hydrophobicity and Mechanical Characterization of Electrospun Fibers
The mechanical properties of polymer fiber mats were measured with atomic force microscopy (AFM) (BioScope Catalyst; Bruker, Bilerca, MA, USA). All measurements were taken in Peak Force QNM imaging mode. Polymer fiber mats were characterized using spherical borosilicate cantilevers with spring constants of 5.6 N/m, radius of 12 μm, and resonant frequency of 300 kHz (RTESPA, Bruker). Spring constant and tip radius were calibrated on a polydimethylsiloxane (PDMS) reference sample having a known Young’s Modulus of 3.5 MPa. Average Young’s modulus measurements of the fiber mats were taken from 3 separate samples from 4 different sections each. All measurements were performed on dry samples.
Evaluating Collagen Fibril Structure
Characterization of Nanomaterial Surfaces
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