XPS analyses were carried out using Physical Electronics PHI 5600-ci equipment (Chanhassen, MN, USA). A standard aluminum X-ray source (1486.6 eV) was used to record survey spectra with charge compensation. Detection was carried out at an angle of 45° concerning the surface normal, and the analyzed area was 0.5 mm2. Three measurements for each sample were taken to confirm the homogeneity of the chemical composition.
Phi 5600 ci
Manufactured by Physical Electronics
Sourced in United States
The PHI 5600-ci is a high-performance X-ray photoelectron spectroscopy (XPS) system designed for surface analysis and characterization. It provides precise and reliable data on the chemical composition and electronic structure of materials. The system features advanced capabilities for data acquisition and analysis, enabling researchers to gain a comprehensive understanding of their samples.
Automatically generated - may contain errors
5 protocols using phi 5600 ci
1
X-ray Photoelectron Spectroscopy Analysis
2
Comprehensive Material Characterization Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
XRD [Co Kα radiation (λ = 1.7890 Å); X’Pert PRO MPD, Philips] was used to analyze the crystal structures. Raman spectra were collected using a Raman microscope with a laser wavelength of 600 nm (LabRAM HR Evolution, HORIBA Scientific). The microstructure and morphology were characterized by field-emission SEM (DSM 982 Gemini, Germany) and TEM (FEI Titan ChemiSTEM 80-200). XPS was done using monochromatized Al-Kα radiation and a hemispherical analyzer at a pass energy of 29 eV (PHI 5600 CI, Physical Electronics, USA).
3
Surface Chemistry Analysis by XPS
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The analysis of the surface chemistry of the deposited layers was performed by x-ray photoelectron spectroscopy (XPS) in a Phi 5600 CI (Physical Electronics) system using monochromatic Al-K α x-rays (excitation energy 1486.6 eV) with a power of 240 W at an acceleration voltage of 8 kV. The resolution of the spectrometer was about 2 eV. The evaluation of the spectra was performed with CasaXPS software (version 2.2.67). To correct the shift of the spectra due to the charging of the surfaces, the energy scale was calibrated on the basis of the Ca 2p3/2 peak on the theoretical binding energy for brushite of 347.2 eV. The quantitative elemental composition was calculated from the peak areas using element-specific sensitivity factors and the transfer function of the spectrometer.
4
XPS Analysis of Chemical Bonding
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The chemical bonding states and atomic concentration are detected by using a XPS instrument (PHI 5600-CI, Physical Electronics, USA) with non-monochromatic Mg-Kα (1253.6 eV, 400 W), at the incident angle of 54°. The atomic concentration is calculated with standard single element sensitivity factors.
5
Characterization of GO-PEI-FeNPs Composite
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The GO–PEI–FeNPs composite was imaged with a JEOL JSM7600F (Peabody, MA, USA) scanning electron microscope (SEM). Raman spectroscopy was conducted using a Renishaw InVia Raman microscope (Ulm, Germany) with a 488 nm laser to confirm the integrity of the GO structure. Attenuated total reflectance–Fourier transform infrared spectra (ATR–FTIR) were recorded with a Nicolet 6700 (Madison, WI, USA) to identify bonding between PEI and GO. X-ray diffraction (XRD) with a Bruker D8 Advance (D-5000) (Bruker, MA, USA) was performed to study the phase composition of the iron nanoparticles. The chemical composition of the sample was investigated by X-ray photoelectron spectroscopy using XPS (PHI 5600-ci, Physical Electronics, Eden Prairie, MN, USA). The adsorption behavior of endocrine disruptors from the GO–PEI–FeNPs composite was studied by measuring unabsorbed amounts of analyte in solution via UV–VIS with a LAMBDA 750 UV/Vis/NIR spectrometer (Perkin Elmer, Waltham, MA, USA).
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!