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Mlct c cantilever

Manufactured by Bruker

The MLCT-C cantilever is a type of lab equipment designed for use in atomic force microscopy (AFM) applications. It functions as a probe to measure surface topography and other sample properties at the nanoscale level. The MLCT-C cantilever is made of silicon nitride and features a V-shaped geometry.

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2 protocols using mlct c cantilever

1

Cellular Membrane Mechanics Analysis

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A commercial atomic force microscope system (Dimension ICON, Bruker-Nano) was used to measure all the cellular surface plasma membrane properties. As previously published (42 (link)), an MLCT-C cantilever was used to measure the Young’s modulus of cells, with a spring constant at 0.01 N/m calibrated via the thermal tune method (Bruker-Nano). To avoid the substrate effect and keep consistency of the measurement conditions, all the measurements were performed at the top of the cell over the cell nucleus. The probe radius was calibrated by using a tip-radius calibration sample, and a silicon sample was used as the hard reference sample for all the indentation measurements. To minimize the cantilever drift due to the temperature fluctuation caused by the heating of the laser, the system was thermally equilibrated at 37°C for 40 minutes before the measurements.
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2

AFM Imaging of AMN-Based Films

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AMN based films deposited on silicon wafers from 10 mg•mL -1 AMN solutions were rinsed with distilled water and dried under a stream of filtered air before imaging in the contact mode with a MLCT-C cantilever (nominal spring constant = 10 mN•m -1 ) using a Nanoscope III atomic force microscope (Bruker, Mannheim, Germany). Images were analysed with the Nanoscope Analysis software after flattening to determine the mean squared roughness of the AMN based films.
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