The scaffolds containing cells were first fixed (2.5% glutaraldehyde; 0.1 M sodium cacodylate buffer) for 1 hour at room temperature and stored at 4°C (in the same solution) until used. The samples were then washed (0.1 M sodium cacodylate buffer), post-fixed (1% osmium tetroxide; 0.1 M sodium cacodylate buffer) for 40 min, and washed again. The samples were dehydrated with a series of ethanol solutions with increasing concentrations (30%, 50%, 70%, 90%, and 100%), dried using a critical point (Leica EM CPD300), and coated with gold (Leica EM ACE200). The samples were analyzed using a JSM6010 PLUS-LA (JEOL) scanning electron microscope. For energy-dispersive X-ray spectroscopy (EDS), the post-fixation step with osmium tetroxide was omitted, and the samples were coated using carbon.
Jsm 6010plus la
The JSM-6010PLUS/LA is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a LaB6 electron source, which provides improved brightness and resolution compared to conventional tungsten filament sources. The JSM-6010PLUS/LA is capable of magnifications up to 100,000x and can accommodate a variety of sample types, from solid materials to biological specimens.
Lab products found in correlation
26 protocols using jsm 6010plus la
SEM Imaging of SiOC Scaffolds with/without Cells
The scaffolds containing cells were first fixed (2.5% glutaraldehyde; 0.1 M sodium cacodylate buffer) for 1 hour at room temperature and stored at 4°C (in the same solution) until used. The samples were then washed (0.1 M sodium cacodylate buffer), post-fixed (1% osmium tetroxide; 0.1 M sodium cacodylate buffer) for 40 min, and washed again. The samples were dehydrated with a series of ethanol solutions with increasing concentrations (30%, 50%, 70%, 90%, and 100%), dried using a critical point (Leica EM CPD300), and coated with gold (Leica EM ACE200). The samples were analyzed using a JSM6010 PLUS-LA (JEOL) scanning electron microscope. For energy-dispersive X-ray spectroscopy (EDS), the post-fixation step with osmium tetroxide was omitted, and the samples were coated using carbon.
Microstructural Analysis of Zirconia-Reinforced Filler Metal
Microscopic Analysis of PBT Composites
Cell Preparation for Scanning Electron Microscopy
Surface Morphology and Crystallinity Analysis
Scanning Electron Microscopy of Cells
Scanning Electron Microscopy of Yeast Cells
Characterization of Hydrolyzed and Ultrasonicated DSNPs
Microscopic Imaging and SEM Analysis
Morphological Characterization of Thin Films
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