An X-ray photoelectron spectroscopy (XPS, K-ALPHA) from Thermo Scientific, Waltham, Massachusetts, United States, was employed to analyze the material’s chemical state and elemental composition using Al monochromatic X-ray source. The extent of nitrogen sorption of the material was quantified by sorption isotherm using an instrument of Micromeritics TriStar II 3020 analyzer from Norcross, Georgia, United States at −196 °C. The materials were pre-treated by deaeration at 150 °C for 12 h before the trigger of the analysis. A 3D high-resolution X-Ray Diffractometer (XRD, EMPYREAN, Malvern Panalytical, Malvern, United Kingdom) was used to analyze the crystal structure of the materials by Cu Kα radiation (λ = 1.54056 Å). A laser Raman spectrophotometer (NRS-5100, JASCO Inc., Easton, MD, USA) was utilized to assume the material’s structural footprint precisely using the laser excitation line at 532 nm. The material’s morphological characterization was conducted by an FE-SEM (Field emmision scanning electron microscope, HITACHI, SU-70, Tokyo, Japan) and HR-TEM (high-resolution transmission electron microscope, FEI Company, TECNAI F20 UT, Hillsboro, OR, USA).
Tristar 2 3020 analyzer
Manufactured by Micromeritics
Sourced in United States
The TriStar II 3020 analyzer is a high-performance surface area and porosity analyzer from Micromeritics. It is capable of performing nitrogen adsorption and desorption measurements, providing data on specific surface area, pore size distribution, and pore volume of solid materials.
Automatically generated - may contain errors
Lab products found in correlation
Tecnai g2 f20 s twin, by Thermo Fisher Scientific (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Su 70, by Hitachi (1 mentions)
Nrs 5100, by Jasco (1 mentions)
Evo 10, by Zeiss (1 mentions)
Sta 409, by Netzsch (1 mentions)
Phi 5600, by Physical Electronics (1 mentions)
D max 2400, by Rigaku (1 mentions)
Tensor 27 spectrometer, by Bruker (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Sta 409 pc luxx, by Netzsch (1 mentions)
Phi 5000c esca system, by PerkinElmer (1 mentions)
Vista mpx, by Agilent Technologies (1 mentions)
Quantax 400 edx, by Bruker (1 mentions)
Xrd 6100, by Shimadzu (1 mentions)
Zetasizer nano zs90, by Malvern Panalytical (1 mentions)
S 4800, by Hitachi (1 mentions)
Fei nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Xrd 6000, by Shimadzu (1 mentions)
Phi 5000c esca, by PerkinElmer (1 mentions)
13 protocols using tristar 2 3020 analyzer
1
Comprehensive Material Characterization
2
Characterization of Sc-MOF@SiO2 Core-Shell Nanostructures
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The particle size distribution and morphology of the products were determined using a scanning electron microscope (SEM) (EVO 10, Carl Zeiss AG, Jena, Germany). FTIR spectroscopy was performed on a Nicolet-6700 FTIR spectrometer with a wavenumber range of 400–4,100 cm−1. TGA was measured using a Netzsch Thermoanalyzer STA 409 in an Ar atmosphere at a heating rate of 5°C/min. The BET surface areas of Sc-MOF@SiO2 core shell nanostructures were determined using a Micromeritics TriStar II 3020 analyzer.
3
Characterization of Nanostructured Materials
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Transmission electron microscopy (TEM) was performed on a FEI Tecnai G2 F20 S-TWIN (Hillsboro, OR, USA) operated at 200 kV. X-ray photoelectron spectroscopy (XPS, Physical Electronics PHI 5600, Chanhassen, MN, USA) measurement was carried out with a multi-technique system using an Al monochromatic X-ray at a power of 350 W. Nitrogen adsorption/desorption isotherms were measured at 77 K using a Micromeritics TriStar II 3020 analyzer (Norcross, GA, USA). Before the measurements, the samples were outgassed for 12 h in the degas port of the adsorption apparatus, at 473 K for the calcined samples. The total surface area was analyzed with the well-established Brunauer-Emmett-Teller (BET) method, and the pore size distribution was calculated on the basis of adsorption branches of nitrogen isotherms using the Barrett-Joyner-Halenda (BJH) method.
4
Structural and Elemental Analysis of Sulfur-Enriched Porous Wood
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The structures of OMPW were obtained by scanning electron microscopy (SEM, JEOL 6300F, JEOL, Tokyo, Japan). The porous structure and elemental analyses of OMPW and sulfer/OMPW (S/OMPW) was characterized by transmission electron microscopy (TEM, JEOL JEM-2100F, JEOL, Tokyo, Japan). The Fourier transform infrared (FTIR) spectrum was recorded with a Bruker Tensor 27 Spectrometer (Bruker, Ettlingen, Germany). X-ray diffractometer (XRD) patterns were carried out on a Rigaku D/Max-2400 (Rigaku, Tokyo, Japan). Thermogravimetric analysis (TGA, STA 409 PC Luxx, Netzsch, Selb, Germany) was performed under Ar atmosphere to determine the S content of the S/OMPW composite. Nitrogen (77 K) adsorption-desorption isotherms were conducted using a Micromeritics Tristar II 3020 analyzer (Micromeritics, Norcross, GA, USA). X-ray photoelectron spectroscopy (XPS) investigation was carried out by using a PHI model 5700 spectrometer (Physical Electronics, Chanhassen, MN, USA).
5
Comprehensive Characterization of Porous Materials
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Element Vario EL
III analyzer was employed to measure the sulfur content. An inductively
coupled plasma optical emission spectrometer (Varian VISTA-MPX) was
used to calculate the ytterbium loading. Rigaku D/maxr B diffractometer
with Cu Kα radiation was chosen to collect X-ray powder diffraction
(XRD) data. Micromeritics TriStar II 3020 analyzer was used to analyze
N2 adsorption–desorption isotherms at 77 K. Brunauer–Emmett–Teller
(BET) and Barrett–Joyner–Halenda models were chosen
to measure specific surface area (SBET) and average pore diameter (DP) of different
samples, respectively. A JEOL JEM-2011 transmission electron microscope
was used to analyze the porous structure of the samples. A Thermo
Nicolet Magna 550 spectrometer was employed to collect Fourier transform
infrared (FT-IR) spectra. The Perkin-Elmer PHI 5000C ESCA system was
used to calculate the binding energy of different elements. All of
the binding energy values in the obtained X-ray photoelectron spectra
were calibrated by using C 1s = 284.6 eV as a reference. A Hiden Isochema
IGA-002 intelligent gravimetric analyzer was chosen to analyze the
surface hydrophobicity.
III analyzer was employed to measure the sulfur content. An inductively
coupled plasma optical emission spectrometer (Varian VISTA-MPX) was
used to calculate the ytterbium loading. Rigaku D/maxr B diffractometer
with Cu Kα radiation was chosen to collect X-ray powder diffraction
(XRD) data. Micromeritics TriStar II 3020 analyzer was used to analyze
N2 adsorption–desorption isotherms at 77 K. Brunauer–Emmett–Teller
(BET) and Barrett–Joyner–Halenda models were chosen
to measure specific surface area (SBET) and average pore diameter (DP) of different
samples, respectively. A JEOL JEM-2011 transmission electron microscope
was used to analyze the porous structure of the samples. A Thermo
Nicolet Magna 550 spectrometer was employed to collect Fourier transform
infrared (FT-IR) spectra. The Perkin-Elmer PHI 5000C ESCA system was
used to calculate the binding energy of different elements. All of
the binding energy values in the obtained X-ray photoelectron spectra
were calibrated by using C 1s = 284.6 eV as a reference. A Hiden Isochema
IGA-002 intelligent gravimetric analyzer was chosen to analyze the
surface hydrophobicity.
6
Characterization of PVDF/meso-TiO2 Hybrid Membranes
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SEM images were obtained on a HITACHI-3400 equipped with Quantax-400 EDX (Bruker. Ins. Germany). As-prepared PVDF/meso-TiO2 hybrid mesoporous membranes were embedded in an epoxy resin and cut by mechanical polishing for the TEM measurements. High resolution transmission electron microscopy (HRTEM) images were collected using Tecnai G2 F20 S-Twin (FEI Co. USA) microscope operated at 200 kV. WAXRD patterns were recorded on PW3040/60 X’Pert PRO X-ray (Panalytical. Ins. Netherlands). Nitrogen adsorption–desorption isotherms were obtained by a Tristar II 3020 analyzer (Micromeritics, USA). BJH methods were used to estimate the pore size. The contact angle between water and the external surface of membrane was measured to evaluate the membrane hydrophobicity using a JC2000D1 contact angle meter (Shanghai Zhongchen Digital Technic Apparatus Co., Ltd, China).
7
Comprehensive Characterization of Adsorbent Material
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FT-IR spectrum of the sample was performed with an FT-IR spectrometer (AVATAR 360, Nicole company, Brunswick, NC, United States). A minimum of 32 scans was signal-averaged with a resolution of 2 cm−1 in the 4000~400 cm−1 ranges. X-ray diffraction (XRD) analysis of the material was conducted on X-ray powder diffraction (XRD-6100, Shimadzu company, Kyoto, Japan) with a scanning rate of 5°/min. The morphology of the as-prepared adsorbent was characterized by scanning electron microscope (SEM, S-4800, Hitachi company, Tokyo, Japan). The specific surface area and the pore diameter distributions were calculated using Brunauer–Emmett–Teller (BET) nitrogen adsorption-desorption isotherms and the Barrett–Joyner–Halenda (BJH) method, respectively by using a Micromeritics TriStar II 3020 analyzer (Micromeritics Instrument Corporation, Gwinnett, GA, US) at 77 K. The zeta potential of material was tested by using a Zeta potential analyzer (Zetasizer Nano ZS90, Malvern Instruments Ltd., Worcestershire, UK).
8
Characterization of Sr/ZrO2 Catalyst
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Fourier-transform infrared spectroscopy (FTIR) analysis with a Thermo-Nicolet 6700P Spectrometer, Thermo Fisher Scientific, Waltham, MA, USA, was used to detect the functional groups of 7% Sr/ZrO2. The wavelength of FTIR was set in the range of 800 to 4000 cm−1. To study the surface morphology of the catalyst, scanning electron microscopy (SEM) (FEI Nova 450 NanoSEM, Thermo Fisher Scientific, Waltham MA, USA,) was used. To identify the effect of strontium on the crystallinity of ZrO2, X-ray diffraction (XRD) was used. For XRD (Equinox 2000, Thermo Fisher Scientific, USA), the range of 2θ = 2°–116° was selected using Cu-Kα radiation (λ = 0.145 nm). For surface area and porosity analysis, a Micromeritics TriStar II-3020 analyzer (Micromeritics, Norcross, GA, USA) was used to obtain N2 adsorption/desorption isotherms of the catalyst at 77.3 K. The Brunauer–Emmett–Teller (BET) adsorption approach was used to infer the surface area. The pore surface area and volume were determined using the t-plot method.
9
Characterization of Ni-Mo Catalyst Nanostructures
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The X-ray diffraction (XRD) patterns of the catalysts were characterized with a powder X-ray diffractometer (Shimadzu XRD 6000). The surface morphologies of the catalysts were obtained using an emission scanning electron microscope (SEM-SU8010). High-resolution transmission electron microscopy (HRTEM) and elemental mapping were performed with a Tecnai F20 instrument at 200 kV. The surface area and pore size were analyzed on a Micromeritics TriStar II 3020 analyzer. The oxidation states of the chemical species were characterized using a X-ray photoelectron spectrometer (XPS) on the PHI5000 Versaprobe system. The contents of Ni and Mo were obtained from an inductively coupled plasma mass spectrometer (ICP-MS, Thermo Scientific XSeries-2).
The hydrogen temperature-programmed reduction (H2-TPR) was performed on a PCA-1200 instrument. The NiMoOx/MC-PL catalyst was pretreated under an Ar atmosphere (30 mL min−1) at 100 °C for 30 min. The samples were then reduced with 7% H2/Ar mixed gas (30 mL min−1) from 25 °C to 700 °C.
The hydrogen temperature-programmed reduction (H2-TPR) was performed on a PCA-1200 instrument. The NiMoOx/MC-PL catalyst was pretreated under an Ar atmosphere (30 mL min−1) at 100 °C for 30 min. The samples were then reduced with 7% H2/Ar mixed gas (30 mL min−1) from 25 °C to 700 °C.
10
Argon Adsorption and Desorption Analysis
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The argon adsorption and desorption
isotherms for
each sample were measured at 77 K to determine the surface area, total
pore volume, and average pore size through a Micromeritics Tristar
II 3020 analyzer (Micromeritics, USA). Prior to the argon adsorption
and analyses using the liquid nitrogen, the samples were degassed
pretreatment under vacuum at 353 K for 8 h.
isotherms for
each sample were measured at 77 K to determine the surface area, total
pore volume, and average pore size through a Micromeritics Tristar
II 3020 analyzer (Micromeritics, USA). Prior to the argon adsorption
and analyses using the liquid nitrogen, the samples were degassed
pretreatment under vacuum at 353 K for 8 h.
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