The crystalline structures of samples were performed by a powder X-ray diffraction (XRD; Bruker DAVINCI D8 ADVANCE). The surface morphology of the catalysts was revealed by a scanning electron microscope (SEM; Quanta 200, FEI, American). The microstructures of the samples were characterized by transmission electron microscope (TEM; Talos F200X, FEI Company, USA) and high-resolution TEM (HRTEM). The corresponding elemental mapping of the sample was obtained on the TEM with an energy-dispersive X-ray (EDX) analyser. The chemical state of the analysis of the elements was performed by an X-ray photoelectron spectroscopy (XPS; ESCALAB 250Xi, Thermo Fisher). The UV-vis absorption spectra were investigated by using ultraviolet-visible diffuse reflectance (DRS, Metash UV-8000). The recombination characteristics of photo-generated carriers of samples were collected by steady photoluminescence (PL) spectra on a spectrophotometer (Edinburgh FS5) under 365 nm excitation. The nitrogen adsorption–desorption isotherms of the samples were tested using a gas adsorption analyzer (Autosorb iQ2, Quantachrome sorptometer, Osaka, Japan). The specific surface areas and pore size distribution of the samples were obtained by the Brunauer–Emmett–Teller (BET) method and the Barrett–Joyner–Halenda (BJH) method, respectively.
D8 advance davinci
Manufactured by Bruker
Sourced in United States
The D8 Advance Davinci is a X-ray diffractometer designed for advanced materials analysis. It provides high-resolution X-ray diffraction measurements for a wide range of applications.
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Lab products found in correlation
Uv 8000, by Metash (1 mentions)
Escalab 250xi, by Thermo Fisher Scientific (1 mentions)
Talos f200x, by Thermo Fisher Scientific (1 mentions)
Quanta 200, by Thermo Fisher Scientific (1 mentions)
Nicolet 6700, by Thermo Fisher Scientific (1 mentions)
Talos f200x g2, by Thermo Fisher Scientific (1 mentions)
Tga 8000, by PerkinElmer (1 mentions)
Super x, by Bruker (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
500 mhz spectrometer, by Bruker (1 mentions)
Jsm 6400, by JEOL (1 mentions)
Silicon crystal zero diffraction plate, by MTI Corporation (1 mentions)
Axis ultra dld, by Shimadzu (1 mentions)
Evo40 microscope, by Zeiss (1 mentions)
Tristar 2 plus, by Micromeritics (1 mentions)
10 protocols using d8 advance davinci
1
Comprehensive Characterization of Catalytic Materials
2
Synthesis and Characterization of MgFe-LDH
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The MgFe-LDH (LDH) was prepared by separate nucleation and aging steps [35 (link)]. The Mg(NO3) 2·6H2O and Fe(NO3) 3·9H2O and the NaOH and Na2CO3 were separately dissolved in 100 mL of water. The two solutions were simultaneously added to a colloid mill rotating at 3000 rpm and mixed for 1 min. The resulting slurry was moved to a flask and aged at 80 °C for 24 h. The final precipitate was filtered and washed. The LDH was dried at 60 °C after being washed successively with water and ethanol. The X-ray diffraction (XRD) patterns of the samples were obtained using a Bruker DAVINCI D8 ADVANCE diffractometer with a scan range of 5–75°.
3
Comprehensive Nanoparticle Characterization
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We obtained transmission electron microscopy (TEM; Talos F200X G2, Thermo Fisher, USA) images to reveal the morphology of the NPs. We measured the hydration particle sizes and zeta potentials using a dynamic light scattering spectrometer (NanoZS, Malvern, UK). Fourier-transform infrared spectroscopy (Nicolet 6700, Thermo Fisher, USA) and thermogravimetric analysis (TGA 8000, PerkinElmer, Norwalk, CT, USA) were performed to analyze the surface-coating molecules. The X-ray diffractions of the nanoparticles were characterized following freeze-drying (D8 Advance Davinci, Bruker, Fremont, CA, USA).
4
Quantify Cement Crystalline Components
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In order to quantify the amount of crystalline non-hydrated cement components, powder X-ray diffraction measurements were performed. Corundum (α-alumina) was used as an internal standard. The samples for XRD measurements were prepared by grinding the cement material together with corundum by hand using a mortar and pestle. The measurements were performed at room temperature, with the diffraction angle 2θ between 10° and 75° on a Bruker D8 Advance DaVinci diffractometer with Bragg–Brentano geometry, using CuKα radiation (λ = 1.54187 Å). The X-ray powder diffraction pattern was collected over the course of one hour.
5
Crystalline State Determination of PKPI
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To determine the crystalline state of untreated and SC-CO2-treated PKPI samples, XRD patterns were taken using an X-ray diffractometer (Model: D8 Advance DAVINCI, Bruker AXS Inc., Madison, WI, USA) by following the method outlined by Malik and Saini [34 (link)]. Diffractograms were recorded between 5–40° (2θ) at a rate of 3.2°/min with a step size of 0.0131°. The collected data were processed using XPert High Score plus software to determine the crystallinity.
6
Characterization of Synthesized Catalysts via Advanced Microscopy and Spectroscopy
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The morphology measurement of the synthesized catalysts was performed by SEM (GeminiSEM 300). HRTEM images, HAADF-STEM images, and STEM-EDS mapping images were obtained by an FEI Titan G2 microscope equipped with an aberration corrector for probe-forming lens and a Bruker SuperX energy dispersive spectrometer operated at 300 kV. The Pt contents in the catalysts were measured by inductively coupled plasma optical emission spectrometry. The XPS spectra of elementals were tested by a surface analysis system (ESCALAB250Xi). The phase and crystal information were obtained by Cu Kα radiation in an X-ray diffractometer (XRD, Bruker, D8 Advance Davinci). The EXAFS measurement of the PtSA-NiO/Ni, PtSA-NiO, and PtSA-NiO/Ni at the Pt L3-edge was performed at 1W1B station at the Beijing Synchrotron Radiation Facility. Data analysis and fitting were performed with Athena and Artemis in the Demeter package.
7
Characterization of BC, PBC-2, and nZVI@PBC-20
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Some important properties of BC, PBC-2, and nZVI@PBC-20 were characterized. The surface and morphology of samples were observed by a scanning electron microscope (SEM, FEI Nova NanoSem 450, FEI, OR, USA). A transmission electron microscope (TEM, JEM-2100F, JEOL, Shizuoka, Japan) equipped with energy dispersive spectroscopy (EDS) was selected for further morphology and elemental distribution tests. The surface functional groups were characterized by a Fourier transform infrared spectroscope (FTIR, IS50, Thermo, MA, USA). The structures and crystal phases were investigated by an X-ray powder diffractometer (XRD, D8 ADVANCE Da Vinci, Bruker, Karlsruhe, Germany) using Cu-Kα radiation at 40 kV/30 mA.
8
Determining Point of Zero Charge of AB
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The
solid addition method was used to determine the point of zero charge
(pHPZC) of AB.52 (link) Several 0.1
mol/L KNO3 solutions were adjusted at pH values between
2 and 8 by adding 0.1 HNO3 or NaOH. Each solution with
0.1 g of AB was placed in a sealed flask under constant stirring (150
rpm). After 48 h, the final pH was measured. The plot of ΔpH
(pHf – pH0) against the initial pH (pH0) was made to obtain pHPZC.
AB characterization
was carried out before and after the adsorption experiments by SEM,
XRD, and solid-state 13C CP/MAS NMR. The morphology of
the biosorbent was evaluated by using a scanning electron microscope,
JEOL JSM-6400 (US). EDS microanalysis was conducted to identify the
elements in AB. The samples were weighed (0.2 g) and characterized
with an X-ray diffractometer, Bruker D8 Advance Da Vinci (USA), using
Cu Kα radiation at a step size of 0.03°. Nuclear magnetic
resonance analysis was performed using CP/MAS for 13C nuclei
in a 500 MHz spectrometer (Bruker, USA).
solid addition method was used to determine the point of zero charge
(pHPZC) of AB.52 (link) Several 0.1
mol/L KNO3 solutions were adjusted at pH values between
2 and 8 by adding 0.1 HNO3 or NaOH. Each solution with
0.1 g of AB was placed in a sealed flask under constant stirring (150
rpm). After 48 h, the final pH was measured. The plot of ΔpH
(pHf – pH0) against the initial pH (pH0) was made to obtain pHPZC.
AB characterization
was carried out before and after the adsorption experiments by SEM,
XRD, and solid-state 13C CP/MAS NMR. The morphology of
the biosorbent was evaluated by using a scanning electron microscope,
JEOL JSM-6400 (US). EDS microanalysis was conducted to identify the
elements in AB. The samples were weighed (0.2 g) and characterized
with an X-ray diffractometer, Bruker D8 Advance Da Vinci (USA), using
Cu Kα radiation at a step size of 0.03°. Nuclear magnetic
resonance analysis was performed using CP/MAS for 13C nuclei
in a 500 MHz spectrometer (Bruker, USA).
9
Magnesium Deposition on Copper Substrate
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XRD measurements were obtained using a Bruker D8 Advance Davinci with a SOL-XE energy dispersive x-ray detector. Measurements were taken in the range of 20 and 70°, with a step size of 0.004°, and a step time of 2.5 s. Only copper was used as the substrate for magnesium deposition for XRD measurements. Measurements were taken on a silicon crystal zero diffraction plate from MTI Corporation.
10
Comprehensive Characterization of Synthesized Powders
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The chemical composition
and the morphology of the synthesized powders were investigated by
energy-dispersive X-ray spectroscopy (EDX) and scanning electron microscopy
(SEM), using a Zeiss EVO 40 microscope. Gas porosity and specific
surface area of the powders were explored using a Micromeritics TriStar
II Plus automated gas sorptometer. X-ray powder diffraction (XRPD)
data were collected at room temperature on a Bruker D8 Advance Da
Vinci diffractometer. X-ray photoelectron spectroscopy (XPS) analyses
were performed using a Kratos AXIS Ultra DLD. XPS quantification was
performed using the instrument sensitivity factors and high-resolution
scans.
All specifications about instruments, equipment, data
collection, and evaluation are reported in theSupporting Information .
and the morphology of the synthesized powders were investigated by
energy-dispersive X-ray spectroscopy (EDX) and scanning electron microscopy
(SEM), using a Zeiss EVO 40 microscope. Gas porosity and specific
surface area of the powders were explored using a Micromeritics TriStar
II Plus automated gas sorptometer. X-ray powder diffraction (XRPD)
data were collected at room temperature on a Bruker D8 Advance Da
Vinci diffractometer. X-ray photoelectron spectroscopy (XPS) analyses
were performed using a Kratos AXIS Ultra DLD. XPS quantification was
performed using the instrument sensitivity factors and high-resolution
scans.
All specifications about instruments, equipment, data
collection, and evaluation are reported in the
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