Pw 1710

XRD patterns of the powdered sample and the crystallinity of pure FLB and its complexes were determined using a RIGAKU diffractometer (Japan) fitted with a curved monochromatic graphite crystal, an automatic divergence slit, and a PW/1710 automatic controller. The target used was CuK-based radiation operating at 40 KV and 40 mA (~1.5418 Å). The XRD patterns were obtained via continuous-mode scanning from 4° to 140° with 2° variation.

The crystallinities of the pure drug and its SD or solid inclusion complexes were investigated using PXR diffractometry. Powder sample X-ray diffraction patterns were obtained using a RIGAKU diffractometer (Japan) fitted with a curved monochromatic graphite crystal, an automatic divergence slit, and a PW/1710 automatic controller. Cu Kα radiation (λ ∼ 1.5418 Å) served as the X-ray source, and measurement conditions were as follows: voltage, 40 KV; current, 40 mA. The patterns of diffraction were achieved using the continuous mode of scanning in step sizes of 2 °C from 4 °C to 140 °C.