S 4300 field emission gun scanning electron microscope

Manufactured by Hitachi

The Hitachi S-4300 is a field emission gun scanning electron microscope (FEG-SEM) that provides high-resolution imaging of samples. It features a field emission electron gun, which generates a finely focused electron beam for high-resolution imaging. The S-4300 is capable of achieving a resolution of up to 1.5 nm, making it suitable for a wide range of applications that require detailed surface analysis.

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Lab products found in correlation

Model desk 2, by Hitachi (2 mentions) Spurr s resin, by Ted Pella (1 mentions) Jem 1400 tem, by JEOL (1 mentions)

2 protocols using s 4300 field emission gun scanning electron microscope

Structural Analysis of Remineralized Dentin

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Selected specimens (n = 2 per group) from the artificial lesion and remineralization groups were evaluated by scanning electron microscopy to characterize structural variations of remineralized dentin lesions. Specimens were coated with a 10–20 nm thick Au thin film using a sputter coater (Denton Vacuum Inc., Model # Desk II, Moorestown, NJ) and imaged using a Hitachi S-4300 field emission gun scanning electron microscope (Hitachi High Technologies America, Pleasanton, CA) at an accelerating voltage of 10 kV and using working distances larger than 12 mm, in general.

Chien Y.C., Tao J., Saeki K., Chin A.F., Lau J.L., Chen C.L., Zuckermann R.N., Marshall S.J., Marshall G.W, & De Yoreo J.J. (2017). Using biomimetic polymers in place of noncollagenous proteins to achieve functional remineralization of dentin tissues. ACS biomaterials science & engineering, 3(12), 3469-3479.

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Structural Characterization of Samples

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Selected samples (n = 2 per group) from each group were evaluated by SEM and TEM to characterize structural variations. For SEM, samples were coated with a 10–20 nm thick Au thin film using a sputter coater (Denton Vacuum Inc., Model # Desk II, Moorestown, NJ) and imaged using a Hitachi S-4300 field emission gun scanning electron microscope (Hitachi High Technologies America, Pleasanton, CA) at an accelerating voltage of 10 kV at working distances of <12 mm. For TEM, samples were further trimmed and embedded after ethyl alcohol and acetone dehydration in Spurr’s resin (Ted Pella, Redding, CA). Unstained, 70- to 80-nm-thick sections were examined by means of a JEM-1400 TEM (JEOL, Tokyo, Japan) at 120 kV following the general procedures described previously [16 (link)].

Nurrohman H., Carneiro K.M., Hellgeth J., Saeki K., Marshall S.J., Marshall G.W, & Habelitz S. (2017). The role of protease inhibitors on the remineralization of demineralized dentin using the PILP method. PLoS ONE, 12(11), e0188277.

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