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Mfp 3d microscope

Manufactured by Oxford Instruments
Sourced in United States

The MFP-3D microscope is a high-performance atomic force microscope (AFM) designed for nanoscale imaging and characterization. It provides precise three-dimensional surface topography measurements with high resolution. The MFP-3D microscope is capable of operating in various imaging modes to accommodate a wide range of sample types and applications.

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11 protocols using mfp 3d microscope

1

Atomic Force Microscopy Imaging Protocol

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AFM imaging was performed using a MFP-3D microscope (Asylum Research, Goleta, CA, USA) in a tapping mode with a typical scan rate of 0.5 Hz. Images were taken in air using sharpened silicon cantilevers, SSS-SEIHR (Nanosensors, Neuchâtel, Switzerland), with guaranteed tip radius < 5 nm or standard cantilevers, OMCL-AC200TS (Olympus, Tokyo, Japan), with a typical tip radius of 7 nm. FemtoScan Online software (http://www.femtoscanonline.com) was used to filter, analyze and present the AFM images. SPM Image Magic software (https://sites.google.com/site/spmimagemagic) was used for a semi-automatic measurement of the height of visualized objects.
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2

Analytical Techniques for Material Characterization

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1H NMR spectra were recorded using a 400 MHz Bruker AVANCE
III NMR spectrometer (Karlsruhe, Germany). The X-ray photoelectron
spectroscopy (XPS) was performed with a Thermo ESCALAB 250Xi instrument.
Fourier transform infrared (FT-IR) spectra were recorded using an
IRAffinity-1 spectrometer (Shimadzu, Japan). The atomic force microscope
(AFM) measurements were performed in a liquid pool using the Asylum
Research MFP-3D microscope by the in situ technique.
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3

Measuring Protein Unfolding Forces by AFM

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AFM measurements were performed using a G51–G57 construct with two cysteine residues incorporated at the C terminus, to allow attachment to the gold-covered surfaces via gold-thiol covalent attachment. All AFM measurements were carried out in 20 mM Tris (pH 7.5), 150 mM NaCl, at 25 °C, using an Asylum Research MFP-3D microscope. Silicon nitride cantilevers with nominal spring constant of 30 pN nm−1 (Bruker MLCT) were used and calibrated using the thermal method68 . One hundred-microlitre protein solution (250 μg ml−1 in AFM buffer) was adsorbed onto a gold surface and the AFM cantilever tip was used to pick it up by nonspecific adhesion, and then retracted at a constant speed (200, 800, 1,500, 3,000 and 5,000 nm s−1), measuring the force exerted by the protein in the process. Three independent experiments (different cantilevers and surfaces) were performed for each pulling speed. The unfolding force for all events from acceptable traces were measured and their force-extension profiles fitted to the worm-like chain model69 (with the persistence length fixed to 400 pm) using the IGOR Pro 6 software (WaveMetrics) to obtain ΔLc values. The data from triplicates were pooled and the force and ΔLc probability histograms were generated for each retraction rate. The modal force and ΔLc values were calculated from Gaussian fits to the histograms using Mathematica 10 (Wolfram Research).
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4

Atomic Force Microscopy of Purified GNPs

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Five microliters of an aqueous solution of the purified GNP were deposited onto positively charged aminopropylytriethoxy silane (APS) mica surface for 2 min, washed with water and dried under argon atmosphere. AFM was carried out with MFP-3D microscope (Asylum Research, Santa Barbara, CA, USA) mounted on inverted optical microscope (Olympus, Center Valley, PA, USA) operated in tapping mode. The imaging in air was performed with regular etched silicon probes (TESP) with a spring constant of 42 N/m.
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5

Comprehensive Materials Characterization Protocol

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The structural morphology and the in-detail inter-stacked structure of the samples was examined by FE-SEM (JSM 6701F, JEOL) and TEM (FEI Tecnai G2, PHILIPS). Atomic force microscopy (AFM) images were obtained using MFP3D microscope (Asylum Research). For the preparation of TEM and AFM samples, the powder sample was sonicated in ethanol for 5 min and the suspension was dropped on a Cu grid for TEM and on the freshly carved mica for AFM sample. The crystal structures of the materials were determined by a Rigaku XRD system equipped with Cu K α radiation (λ = 0.15406 nm). Pore structure of the samples was characterized by physical adsorption of N2 at 77 K using a BELSORP-max nitrogen adsorption apparatus (Japan Inc.). The specific surface area was calculated with Brunauer-Emmett-Teller (BET) method from the N2 adsorption isotherm. The electrical conductivity of the samples was measured using the four-point probe method (Keithley 2400) using pelletized samples.
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6

Atomic Force Microscopy Characterization

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Atomic force microscopy (AFM) measurements were carried out with an MFP-3D microscope (Asylum Research, Santa Barbara, CA) at 20 C using MSCT cantilevers from Veeco with a nominal spring constant of 0.01 N/m. Ramp velocities were kept constant and set to 2 μm/s.
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7

Atomic Force Microscopy of Ion Emitters

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Knob densities on IEs were measured by AFM essentially as described by Quadt et al. (7 (link)). AFM images were captured either with an MFP-3D microscope (Asylum Research, Santa Barbara, CA, USA) or a Multimode8 AFM (Bruker Nano Inc., Santa Barbara, CA, USA). We used copper grids to locate the IEs via an integrated optical microscope. Images were captured in air under ambient conditions with tapping mode and using a silicon microcantilever (OMCL-AC160TS-W2; Olympus) with a spring constant of 42 N/m and a resonant frequency of ~300 kHz. The images were 512 by 512 pixels and captured at scan speeds of 0.5 to 2.0 Hz, depending on the scan size (0.25 to 15 µm). Scan speeds were optimized individually to minimize noise and integral and proportional gains.
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8

Atomic Force Microscopy of Fibrinogen and Fibrin Oligomers

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AFM imaging of fibrinogen or fibrin oligomers was performed on the surface of modified hydrophilized graphite (Klinov et al., 2007 ; Protopopova et al., 2015 (link)). Three microliters of a sample solution prepared as described above was applied on the modified graphite surface and kept for 15 s at room temperature. A ~50× volume drop of fresh Milli-Q water was then carefully placed above the sample solution for 10 s and then removed with a flow of air making the surface ready for imaging. The AFM imaging was performed using a MFP-3D microscope (Asylum Research – Oxford Instruments) in AC mode with a typical scan rate of 0.8 Hz. Images were taken in air using SSS-SEIHR cantilevers (Nanosensors) with a tip radius of 3 ± 2 nm. FemtoScan Online software (http://www.femtoscanonline.com) was used to filter and analyze the AFM data.
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9

Atomic Force Microscopy of Modified Graphite

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AFM imaging was performed on the surface of modified hydrophilized graphite (Protopopova et al., 2015 (link)). 3 μl of a sample solution was applied on the modified graphite surface and kept for 15 s at room temperature. A ~50x volume drop of fresh milli-Q water was then carefully placed above the sample solution for 10 s and then removed with a flow of air making the surface ready for imaging. The AFM imaging was performed using a MFP-3D microscope (Asylum Research - Oxford Instruments, USA) in AC mode with a typical scan rate of 0.8 Hz. Images were taken in air using super-sharp cantilevers with a tip radius about 1 nm (Klinov et al., 1998 (link)). Femto-Scan software (http://www.femtoscanonline.com) was used to filter and analyze the AFM data.
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10

High-Resolution AFM Imaging Techniques

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AFM imaging was performed using a MFP-3D microscope (Asylum Research – Oxford Instruments, USA) or an Ntegra Prima microscope (NT-Mdt, Russia) in a tapping mode with a typical scan rate of 0.8 Hz. Images were taken in air using sharpened silicon cantilevers SSS-SEIHR (Nanosensors, Germany) with a guaranteed tip radius <5 nm or homemade super-sharp cantilevers with a tip radius about 1 nm.46 (link) FemtoScan Online software (http://www.femtoscanonline.com) was used to filter and analyze the AFM data.
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