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Sigma field emission scanning electron microscope

Manufactured by Zeiss
Sourced in Germany

The Sigma field emission scanning electron microscope is a high-performance imaging tool designed to provide detailed analysis of surface structures and compositions. It utilizes a focused electron beam to scan the surface of a sample, generating high-resolution images and data. The Sigma FESEM offers exceptional resolution and imaging capabilities, making it a valuable instrument for a wide range of applications in materials science, nanotechnology, and other fields that require advanced microscopy analysis.

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20 protocols using sigma field emission scanning electron microscope

1

Microsphere Morphology Characterization by SEM

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The morphology of the microspheres
was determined using a Sigma Field Emission Scanning Electron Microscope
(Zeiss FESEM and Bruker EDS). The samples were prepared by drying
the microspheres in vacuum at 40 °C for 2–3 h; they were
then transferred to the surface of the sample holder. Scanning electron
microscopy (SEM) analyses were subsequently conducted, with the chamber
pressure set at 1.01 × 10–5 Torr. The samples
were directly analyzed on a carbon background and scanned using a
1.50 kV electron beam with a secondary electron detector. The images
were viewed at 15 000× and 33 000× magnifications.
The particle size, that is, the diameter, was estimated using ImageJ
software by randomly selecting and averaging the sizes of at least
100 particles.
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2

Single Particle Optical Characterization and Correlative SEM

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The methods used in the single particle measurements were previously described.27 (link) Nanoparticles were dropcast onto clean coverslips and single particle optical characterization was performed using a home-built stage scanning confocal microscope with a Nikon 60× oil objective (NA 1.49) and a 976 nm fiber coupled laser at 500 kW/cm2. Custom Matlab code was used to identify an individual point spread function for each particle and perform a 2D Gaussian fit to determine the upconversion emission rate.
For correlative SEM, nanoparticles were dropcast onto a glass coverslip with a labeled grid pattern. The sample was first imaged by the confocal microscope, followed by sputter-coating a 2 nm gold–palladium layer to prep for SEM. Nanoparticles were imaged using a Zeiss Sigma Field Emission Scanning Electron Microscope (Carl Zeiss Microscopy, Germany) and InLens SE (Secondary Electron) detection, utilizing the grid pattern as a guide.
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3

TEM and SEM Imaging of Sponge Tissue

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Tissue samples were fixed for 12 h at 4 °C, rinsed three times with PHEM buffer (1.5× PHEM and 9 % (w/v) sucrose) and post fixed for 1.5 h with 1 % (w/v) osmium tetroxide in Milli-Q water. Samples were dehydrated in a graded series of ethanol and embedded in EPON Araldite. Embedded tissue was sectioned perpendicular to the surface of the sponge. Ultrathin (120 nm) and semithin (500 nm) sections were cut using a Reichert Ultracut S microtome. Ultrathin sections were transferred to finder grids (Electron Microscopy Sciences, Hatfield, PA, USA), stained with uranyl acetate and lead citrate, and imaged at 100 kV accelerating voltage using a Philips CM10 transmission electron microscope (TEM). These high-resolution images provided an initial characterisation of the tissue structure of both sponges, particularly regarding symbiont density and location (Fig. 1b, e). Semithin sections were transferred to silicon wafers, stained as above, and imaged with a Zeiss Sigma field emission scanning electron microscope (SEM) at 8 kV. Electron microscopy was performed at the Electron Microscopy Centre Amsterdam (EMCA). Regions of interest were identified by SEM and sample maps made to guide NanoSIMS analysis. One replicate per species and food source from incubations at T0, T0.25, T0.5, T3, and T48 was selected for NanoSIMS analysis.
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4

Scanning Electron Microscopy and XPS Analysis

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The morphology of the materials was observed by a Sigma field emission scanning electron microscope (Zeiss, Germany). X-ray photoelectron spectroscopy measurement was performed on an ESCALAB 250Xi electron spectrometer (Thermo Scientific, Waltham, MA, USA) using a radiation source of Al Kα radiation with the energy of 1486.6 eV.
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5

Scanning Electron Microscopy of Fixed Cells

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Cells were fixed and cut and mounted for scanning electron microscopy as previously described19 (link). Samples were analysed in a Sigma Field Emission scanning electron microscope (Carl Zeiss) operating at 5kV. Digital images were recorded using Carl Zeiss (SmartSEM) software.
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6

Comprehensive Structural Analysis of Material

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The morphology of the prepared material was observed by a Sigma field emission scanning electron microscope (Zeiss, Oberkochen, Germany). The elemental species energy-dispersive X-ray spectroscopy analysis was examined by a field emission electron probe microanalyzer (JXA-8530F Plus, JEOL, Tokushima, Tokyo, Japan). X-ray photoelectron spectroscopy measurement was taken by an ESCALAB 250 Xi electron spectrometer (Thermo Scientific, Waltham, MA, USA) using a radiation source of Al Kα radiation with the energy of 1486.6 eV. An ICS 2500 chromatography system (Dionex, CA, USA) with Dionex CarboPac PA 20 (3 × 150 mm) separation column and PA 20 guard (3 × 30 mm) column was used in this study. The mobile phase was 12 mM potassium hydroxide and the flow rate was 0.4 mL/min. The detection was carried out by an integrated pulsed amperometry cell equipped with a working gold electrode and a combined pH–Ag/AgCl reference electrode.
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7

Structural and Electrical Characterization of Cu-intercalated NbS2

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SEM images of the samples were obtained by a Sigma field-emission scanning electron microscope (Zeiss Ltd.) operated at 20 kV. XRD and in situ XRD analyses were performed on a SmartLab (Rigaku) with filtered Cu Kα radiation (Rigaku D/max-2500, λ = 1.5405 Å). In situ XRD was performed by sequential scans, with each scan collected at a scanning rate of 50° min−1. TEM images, STEM images, and EDS were acquired using an FEI Tecnai F-20 microscope. Samples were dispersed in ethanol and dropped onto molybdenum grids and then attached to the double-tilted sample holder. To confirm the compositional distribution and molar ratio of Cu:NbS2 of nano-CuxNbS2, EDS was carried out to map the distribution of Cu, Nb, and S under the STEM mode. EPMA (JXA-8530F Plus) was applied to analyze the concentration of Cu in the intercalated TMD compounds. The synchrotron XAFS was collected at Beamline 11-ID-C in Advanced Photon Sources, Argonne National Laboratory. Magnetization measurements were performed using Magnetic Property Measurement System by Quantum Design. The electrical conductivity in the z-direction of 2H-NbS2 and CuxNbS2 were measured using a Keithley 4200 parameter analyzer.
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8

Cryo-TEM and SEM Characterization of Samples

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The SEM experiments
were performed on a Zeiss Sigma field-emission scanning electron microscope.
The samples were lyophilized before the SEM observation. Before the
examination, the solid sample was placed on a double-sided sticky
carbon tape mounted on aluminum sample holders, and then it was sputter-coated
with a thin layer of gold using an SCD 005 cool sputter coater (Bal-Tec)
at 30 mA and ∼7 Pa for 80 s.
cryo-TEM was performed as
follows: A small drop of the sample (3–5 μL) was deposited
on the surface of a TEM copper grid covered by a holey carbon film
at 30 °C. After blotting away the excess solution to form a thin
liquid film, the grid was immediately plunged into liquid ethane cooled
by liquid nitrogen (−175 °C). The specimens were maintained
at approximately −173 °C and imaged using a transmission
electron microscope Tecnai G20 TWIN at an accelerating voltage of
200 kV under low-dose conditions.
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9

Scanning Electron Microscopy of Fixed Cells

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Cells were fixed and cut and mounted for scanning electron microscopy as previously described19 (link). Samples were analysed in a Sigma Field Emission scanning electron microscope (Carl Zeiss) operating at 5kV. Digital images were recorded using Carl Zeiss (SmartSEM) software.
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10

3D Ultrastructural Imaging of Biological Samples

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Placed in a silicon wafer, the region of interest (ROI) in the sections was identified by visualizing blood vessel land marks. Electron micrographs at higher resolution (4 nm pixel size, 1 µs dwell time) were obtained with a Sigma Field Emission Scanning Electron Microscope (7 KeV; Zeiss) using back-scatter signal detector. All image stacks obtained were then digitally processed, aligned and reconstructed in Fiji (NIH) using the TrackEM2 plugin41 (link).
The time required for the procedures were 9 hours on the first day (from the fixation to DAB development), 3–4 hours on the second day (Osmium impregnation), 5–6 hours on the third day (Dehydration), 5 hours on the fourth day (Dehydration). After 2–3 days of embedding and 4–12 hours of sectioning and staining, imaging of the samples required up to one month and tracing required 1d to a month, depending on the thickness and resolution of the sample.
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