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Jem 2100f field emission electron microscope

Manufactured by JEOL
Sourced in Japan

The JEM-2100F is a field emission electron microscope manufactured by JEOL. It is designed to provide high-resolution imaging and analysis capabilities for a variety of research and industrial applications. The JEM-2100F utilizes a field emission gun to generate a high-brightness electron beam, enabling high-resolution imaging and analysis of samples at the nanoscale level.

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22 protocols using jem 2100f field emission electron microscope

1

Visualizing Extracellular Vesicle Morphology

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To visualize the morphology of P-EV, D-EV, and BD-EV, we fixed samples with 0.5% glutaraldehyde solution overnight for TEM. Subsequently, we centrifuged the samples at 13,000g for 3 min and dehydrated the pellets in absolute ethanol for 10 min and then dropped them onto formvar-carbon–coated copper grids (Ted Pella Inc., Redding, CA, USA). We stained the samples with 1% phosphotungstic acid for 1 min and washed them with absolute ethanol. We stored the grids in a desiccator before analysis and then observed the samples on a JEM-2100F field emission electron microscope (JEOL Ltd., Japan). For cryo-TEM analysis, P-EV, D-EV, and BD-EV were collected on lacey carbon grid (Electron Microscopy Sciences, Hatfield, PA, USA). The grids were stored in liquid nitrogen and then transferred to a cryo-specimen holder and maintained at −180°C. Images were collected on the Tecnai Twin transmission electron microscope operating at 200 kV.
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2

Nanomaterial Characterization by Advanced Electron Microscopy

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Transmission electron microscopy (TEM) was carried out on a JEM-2100 electron microscope, operating at an acceleration voltage of 100 kV. Scanning transmission electron microscopy (STEM) was carried out on a JEM-2100F field-emission electron microscope, operating at an acceleration voltage of 200 kV. SEM images are captured with a JEOL Field Emission SEM. The concentration of the precursor PQDs solution was calibrated with reference to the mass of lead measured by an inductive coupled plasma optical emission spectrometer (Agilent 710). X-ray diffraction (XRD) patterns were acquired with a Bruker AXS D2 phaser X-ray diffractometer equipped with a Cu Kα radiation source (λ = 1.54 Å) at 40 kV and 30 mA. Infrared absorption spectroscopy was carried out on a BRUKER Vertex Fourier Transform Infrared spectrometer. UPS and XPS measurements were carried out on a VG ESCALAB 220i-XL surface analysis system equipped with a He discharge lamp (hν = 21.2 eV) and a monochromatic Al–Kα X-ray gun (hν = 1486.6 eV).
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3

Cryo-EM of Virus-Induced Multivesicular Bodies

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An experimental sample of a multivesicular body (MVB) (Figure 2) was prepared by high-pressure freezing and freeze substitution as in [24] (link). The sample was used to study breakages in the membranes of virus-induced MVB and intraluminal vesicles suggesting genome release to the cytoplasm. Also, two specific targets, echovirus 1 and α2β1-integrin receptor, were labeled with gold particles of 14nm and 6 nm of size, respectively, to study the localization and distribution of these targets in the virus-induced MVB. A series of single axis TEM images were obtained with the JEM-2100F Field Emission Electron Microscope (JEOL Ltd., Tokyo, Japan) at a voltage of 200 kV. It comprises 124 images of the MVB taken at an interval of approximately 1° in the angular range [−65°, +58°], with the magnification of 10k. Before reconstruction, the projection images were aligned by cross-correlation using the 14nm gold particles as markers. The dimensions of the original projection images were 4096×4096 which were cropped to size 958×712 pixels used for reconstruction. The pixel size was 1nm.
The projection data and reconstructions of all datasets are available at our supplementary data site: http://pioms.ucdavis.edu/pone/smap-em.
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4

Comprehensive Material Characterization Protocol

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SEM was performed on a JEM-7610F Schottky field emission scanning electron microscope (JEOL, Ltd.) operated at an accelerating voltage of 5.0 kV, and TEM was conducted on the JEM-2100F field emission electron microscope (JEOL, Ltd.) operated at an accelerating voltage of 200 kV. The SEM and TEM samples were prepared by dropping the ethanol suspension onto the copper grid and drying it in a vacuum desiccator. HPLC was performed on an Agilent 1260 HPLC system (Agilent Technologies) equipped with an Aminex HPX-87H column (Bio-Rad) and a refractive index detector, using 5.0 mM H2SO4 as the eluent. FTIR spectra were measured in the attenuated total reflection mode using a Nicolet iS50 FTIR spectrometer (Thermo Fisher Scientific). 1H NMR and 13C NMR (400 MHz) spectra were recorded using an AVANCE III NMR spectrometer (Bruker). % transmittance was measured using an S-3100 UV-visible scanning spectrophotometer (SCINCO). X-ray diffraction (XRD) data were measured using a powder type sample on a D/Max 2500V X-ray diffractometer (Rigaku). TGA curves were measured using a DSC 2010/SDT 2960 analyzer (TA Instruments) at a rate of 10 °C min−1 under N2 gas. Elemental analysis (EA) was conducted on a FlashEA 11.
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5

Transmission Electron Microscopy Imaging of EVs

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To verify the presence of intact EVs, transmission electron microscopy image analysis was performed. EVs were fixed with 0.5% glutaraldehyde solution overnight. The fixed EVs were centrifuged at 13,000 × g for 3 min. Then the supernatant was removed. Next, the samples were dehydrated in absolute ethanol for 10 min and placed on formvar-carbon-coated copper grids (TED PELLA, Inc., Redding, CA, USA). The grids were contrasted with 1% phosphotungstic acid for 1 min and then washed several times with absolute ethanol solution. The grids were dried off completely and then examined with a JEM-2100 F field emission electron microscope (JEOL Ltd., Japan). For cryo-TEM of the EVs, the EVs were added onto the lacey carbon grid (Electron Microscopy Science, Hatfield, PA, USA). The grid was frozen in liquid nitrogen. The samples were analyzed with a Tecnai F20 Twin transmission electron microscope.
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6

Transmission Electron Microscopy and Dynamic Light Scattering

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Transmission electron microscopy (TEM) images were obtained using a JEM-2100F Field Emission Electron Microscope (JEOL, Ltd., Tokyo, Japan) and a field emission Magellan 400 microscope (FEI Company, Hillsboro, OR, USA). Dynamic light scattering (DLS) measurement was carried out on Zetasizer Nano ZS90 (Malvern, Worcestershire, UK).
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7

Comprehensive Characterization of CZTS Thin Films

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Powder X-ray diffraction (PXRD) patterns of samples were performed on a Bruker D8 ADVANCE diffraction system (Bruker AXS GmbH, Karlsruhe, Germany) using Cu Kα radiation (λ = 1.5406 Å), operated at 40 kV and 40 mA with a step size of 0.02°. The morphology of the pure CZTS sample was observed by using a scanning electron microscope (SEM, Nova Nano 430, FEI, Holland). Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) images were obtained by using a JEOL JEM-2100 F field emission electron microscope (JEOL Ltd., Akishima, Tokyo, Japan). The Raman spectrum of the sample was recorded on a microscopic Raman spectrometer (LabRAM Aramis, Horiba Jobin Yvon Inc., Edison, NJ, USA). The diffuse reflectance spectrum (DRS) of the CZTS sample was obtained by using a Shimadzu U-3010 spectrophotometer (Shimadzu Corporation, Nakagyo-ku, Kyoto, Japan) equipped with an integrating sphere assembly.
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8

Characterization of MNCs via X-ray Diffraction

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X-ray diffraction method was employed to authenticate the formation of GO, LZFO MNPs, CHLZFO, and CHLZFO-GO MNCs. XRD instrument used was PANalytical X’Pert Pro X-ray diffractometer (India), using Cukα1 radiation (λ = 1.5406 Å) operating at working voltage of 45 kV and working current of 40 mA in the 2ϴ range of 5.070–90.010° at step size 0.02°. Both the lattice constant and the crystallite size for prepared samples were determined using Debye–Scherrer equation. Morphological studies were performed by JEM-2100F Field Emission Electron Microscope and JEOL JSM-7600F Field Emission Scanning Electron Microscope (FESEM) (Saudi Arabia). Furthermore, magnetic characterizations were studied using EV9 Vibrating Sample Magnetometer (EV9 VSM), MicroSense (India), by applying ± 2 Tesla field at ambient temperature.
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9

Comprehensive Structural Characterization of Materials

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The FT-IR spectra of the samples were recorded using the NEX-US670 spectrometer (Madison, WI, USA) under environmental conditions, with a resolution of 4 cm−1 in the wave number range of 4000–400 cm−1. Scanning electron microscopy and EDS mapping experiments were conducted using GeminiSEM 500 (Oberkochen, Germany). The transmission electron microscopy (TEM) experiments were performed using a JEM-2100F field emission electron microscope (JEOL, Tokyo, Japan) with an accelerated voltage of 200 kV, including a probe corrector. Solid State Nuclear Magnetic Resonance (SSNMR) 13C NMR spectra were recorded using a Brock AVANCE III 600 M device. The specific surface area was calculated using the Brunauer–Emmett–Teller (BET) method, and the aperture distribution was analyzed using the non-local density function theory. The X-ray photoelectron spectroscopy (XPS) analysis was carried out using an ESCALAB 250 spectrometer (Waltham, MA, USA).
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10

Transmission Electron Microscopy of Extracellular Vesicles

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To verify the presence of intact EVs, transmission electron microscopy image analysis was performed. EVs were fixed with 0.5% glutaraldehyde solution overnight. The fixed EVs were centrifuged at 13,000 × g for 3 min. Then the supernatant was removed. Next, the samples were dehydrated in absolute ethanol for 10 min and placed on formvar-carbon-coated copper grids (TED PELLA, Inc., Redding, CA, USA). The grids were contrasted with 1% phosphotungstic acid for 1 min and then washed several times with absolute ethanol solution. The grids were dried off completely and then examined with a JEM-2100 F field emission electron microscope (JEOL Ltd., Japan). For cryo-TEM of the EVs, the EVs were added onto the lacey carbon grid (Electron Microscopy Science, Hatfield, PA, USA). The grid was frozen in liquid nitrogen. The samples were analysed with a Tecnai F20 Twin transmission electron microscope.
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