Jem 2100f field emission electron microscope
The JEM-2100F is a field emission electron microscope manufactured by JEOL. It is designed to provide high-resolution imaging and analysis capabilities for a variety of research and industrial applications. The JEM-2100F utilizes a field emission gun to generate a high-brightness electron beam, enabling high-resolution imaging and analysis of samples at the nanoscale level.
Lab products found in correlation
22 protocols using jem 2100f field emission electron microscope
Visualizing Extracellular Vesicle Morphology
Nanomaterial Characterization by Advanced Electron Microscopy
Cryo-EM of Virus-Induced Multivesicular Bodies
The projection data and reconstructions of all datasets are available at our supplementary data site:
Comprehensive Material Characterization Protocol
Transmission Electron Microscopy Imaging of EVs
Transmission Electron Microscopy and Dynamic Light Scattering
Comprehensive Characterization of CZTS Thin Films
Characterization of MNCs via X-ray Diffraction
Comprehensive Structural Characterization of Materials
Transmission Electron Microscopy of Extracellular Vesicles
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!