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Jec 3000fc

Manufactured by JEOL
Sourced in Japan, United States

The JEC-3000FC is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging of a variety of samples. It features a cold field emission electron source, providing high brightness and excellent image quality. The JEC-3000FC is capable of achieving a resolution of up to 1.0 nm and can be used for various applications, including materials science, nanotechnology, and life sciences.

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45 protocols using jec 3000fc

1

Membrane Surface Characterization Protocol

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The chemical oxygen demand (COD) and suspended solids (SS) were determined by using standard method.32 All experiments were performed in duplicate, and the averages were recorded with deviations of less than 5%. The surface morphologies of original and modified membranes were observed using a scanning electron microscope (SEM, JSM-7610F, JEOL, Japan). The operating conditions of the SEM instrument are shown as follows: accelerating voltage = 5.0 kV, emission current = 55 μA, work distance = 6.6 mm. To prepare SEM samples, the membranes were firstly dried in a desiccator (45 °C) for 72 h and fixed on a copper sheet, then coated with gold by a precision etching coating system (JEC-3000FC, JEOL, Japan). An atomic force microscopy (AFM, Bioscope, Veeco, USA) was employed to characterize the roughness of membrane surface. The functional groups of membrane surfaces were identified using an attenuated total reflectance Fourier transform infrared (ATR-FTIR) spectroscope (Nicolet6700, Thermo Scientific, USA).
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2

Morphological and Elemental Analysis of CP Particles

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Morphological appearances of CP samples were observed by Variable Pressure Scanning Electron Microscopy (VPSEM) (Zeiss LEO 1455, Carl Zeiss AG, Oberkochen, Germany), and the composition of elements was identified through Energy Dispersive X-ray (EDX) microanalysis (INCA V5.2, Oxford Instruments plc, Oxfordshire, UK). CP particles were mounted on aluminium stubs (12 mm diameter) using conductive carbon tape and sputter-coated with gold using Auto Fine Sputter Coater (JEC-3000 FC, JEOL Ltd., Tokyo, Japan) for 3 min. Mounted stubs samples were accommodated on the VPSEM stage operated at a probe current of 12–13 μA and beam voltage of 5–20 kV and viewed in varying magnification ranges. In the EDX analysis, the gold element was established as the standard for beam optimisation and spectrums indicate the elements detected in the samples.
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3

Otolith Preparation and SEM Imaging

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Otoliths (pebble stones: Lapillus, flat stones: Sagitta, stellates: Asteriscus) were extracted from adult WT and stm−/− mutants. The FEs were removed from eggs in water and washed with ultrapure water. Eggs with FEs were washed with ultrapure water. Samples were washed with ultrapure water and then critical point dried using a freeze dryer (Aqua FD-6500; SUN Technologies, Kyoto, Japan). Dried samples were coated with 5 nm platinum using an autofine coater (JEC-3000FC; JEOL, Tokyo, Japan). Subsequently, the FEs were observed with s.e.m. (JSM-6510LV; JEOL).
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4

Inhibition of Dual-Species Biofilm Formation

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Sterilized round glass coverslips were placed in 24 microwell plates and immersed with S. mutans and S. sanguinis in BHI media containing 2% sucrose, various concentrations of PSNC (the final concentrations of PSNC were 5 and 2.5 mg/ml) as well as PBS (control). The plates were incubated under anaerobic conditions for 24 h and 48 h at 37°C. After the incubation period, the coverslips were rinsed with PBS to remove unattached cells and fixed with 2.5% glutaraldehyde (Sigma-Aldrich, St Louis, MO, USA) overnight at 4°C. The coverslips were washed twice with PBS, subsequently dehydrated in a series of 50–100% ethanol solutions, and dried using a vacuum system (Buehler Cast n'Vac 1000, USA). The samples were sputter-coated with gold (JEOL 780174712) in an auto-fine coater (JEOL JEC-3000FC, USA) and then observed using a JSM-6510LA SEM. The assay was performed in triplicate.
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5

Nanofiber Microstructure Analysis by SEM

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The nanofiber microstructure was analyzed by JEOL JSM–6510 scanning electron microscope (SEM). The samples were mounted on metal stubs and sputter-coated with platinum for 120 s with JEOL JEC−3000FC auto fine coater.
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6

Platinum Coating Characterization of HPMC Particles

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The HPMC samples were coated with a thin
layer of platinum (thickness
∼50 Å) using an ion-beam sputter (JEC-3000FC, JEOL Co.,
Ltd., Japan) for 4 min at 8 × 10–3 MPa, 15
mA current, and 100% turbo speed. The surface morphology of the coated
particles was observed using SEM (JSM-7800F, JEOL Co., Ltd., Japan)
at a magnification of 200 times with an accelerating voltage of 5.0
kV and a spot size of 3.0 under EBSD mode.
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7

SEM Analysis of Nanofiber Morphology

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The prepared blank and drug-loaded nanofibers were characterized, in terms of surface morphology and diameter, using the scanning electron microscopy (SEM) instrument (JSM-IT500HR SEM, JEOL Inc., Peabody, MA, USA) at a 5 kV accelerating voltage and average measurements of 70 fibers for each fibrous system. The fabricated nanofibers were collected directly onto aluminum foil, and platinum (2 nm) was used to coat the samples in a JEC-3000FC auto fine coater (JEOL Inc., Peabody, MA, USA). The nanofibers diameter analysis was measured using ImageJ software (National Institute of Health, Bethesda, MD, USA).
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8

Surface Morphology Analysis of Hair and Bioplastic Films

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Field Emission Scanning Electron Microscope was utilized to analyze the surface morphology of the hair fragments at various stages of the studies. Morphological characteristics of the bioplastic films obtained with different plasticizers were also revealed by using FESEM analysis. Before analysis the samples were platinum coated with the help of JEOL, JEC-3000FC auto fine platinum coater. Analysis was made FESEM-JEOL 7610F PLUS at magnifications ranging from ×300 to ×3000 in both lower electron imaging (LEI) and secondary electron imaging (SEI) mode as suitable depending on the sample in study.
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9

Femtoliter Chamber Array Characterization

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A thin platinum layer was formed on the surface of the femtoliter chamber array via sputtering (JEC-3000FC, JEOL). High magnification and resolution images of the femtoliter chamber array were captured using a scanning electron microscope (JSM-IT210, JEOL) with 20 kV acceleration in a high vacuum environment.
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10

Cell Viability Analysis on L-929 and MG-63 Cells

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This experiment used L-929 and MG-63 for the cell viability analysis. The cell culture medium was DMEM containing 1% antibiotics and 10% FBS, and the density was 2 × 104 cells/mL/6-well plate cultured on a test piece of 2 cm × 2 cm (=4 cm2) with a thickness greater than 1 mm. The medium was cultured for 48 h at a temperature of 37 °C under 5% CO2. Next, 4% neutral buffered formaldehyde (Uni-Onward, New Taipei City, Taiwan) was used to fix the solution for 15 min, after which alcohol of various concentrations was added to dehydrate the sample for 10 to 15 min. A critical point dryer (780-A, Samdri, Rockville, MD, USA) was then used to dry the sample. Finally, a coating machine (JEC-3000FC, JEOL, Tokyo, Japan) was employed for coating the sample with a layer of platinum, and a scanning electron microscope (SEM; JSM-IT 200, JEOL, Tokyo, Japan) was used to photograph the L-929 and MG-63 on six sets of test pieces at 1000× magnification.
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