Jec 3000fc
The JEC-3000FC is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging of a variety of samples. It features a cold field emission electron source, providing high brightness and excellent image quality. The JEC-3000FC is capable of achieving a resolution of up to 1.0 nm and can be used for various applications, including materials science, nanotechnology, and life sciences.
Lab products found in correlation
45 protocols using jec 3000fc
Membrane Surface Characterization Protocol
Morphological and Elemental Analysis of CP Particles
Otolith Preparation and SEM Imaging
Inhibition of Dual-Species Biofilm Formation
Nanofiber Microstructure Analysis by SEM
Platinum Coating Characterization of HPMC Particles
layer of platinum (thickness
∼50 Å) using an ion-beam sputter (JEC-3000FC, JEOL Co.,
Ltd., Japan) for 4 min at 8 × 10–3 MPa, 15
mA current, and 100% turbo speed. The surface morphology of the coated
particles was observed using SEM (JSM-7800F, JEOL Co., Ltd., Japan)
at a magnification of 200 times with an accelerating voltage of 5.0
kV and a spot size of 3.0 under EBSD mode.
SEM Analysis of Nanofiber Morphology
Surface Morphology Analysis of Hair and Bioplastic Films
Femtoliter Chamber Array Characterization
Cell Viability Analysis on L-929 and MG-63 Cells
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