Atr pro450 s

The morphologies of precipitates from 1.5SBF at different pH were observed by SEM (SU8010; Hitachi High-Technologies Corporation, Tokyo, Japan) employing an acceleration voltage of 4.0–10.0 kV and TEM (JEM-2100F; JEOL Ltd., Tokyo, Japan) operated at 200 kV. The particle size distribution of precipitates was calculated from SEM and TEM images using ImageJ [28 ]. FT-IR spectra of the precipitates were obtained by a single reflection attenuated total reflection (ATR) using an FT-IR 6200 equipped with ATR PRO450-S (JASCO Corporation, Tokyo, Japan). XRD was performed using a SmartLab II instrument (Rigaku, Tokyo, Japan) with Cu-Kα radiation (tube voltage: 40 kV, tube current: 45 mA, and step width: 0.02°).

Gas chromatography (GC) analysis was performed on Shimadzu GC-2014 equipped with FID detector. Fourier transform infrared (FT-IR) was measured by JASCO ATR PRO450-S with Ge. X-ray diffraction (XRD) was measured by PANalytical Co. X’ part PRO using Cu Kα radiation (λ = 1.541 Å) in the 2θ range of 2–75°. The operating tube current and voltage were 40 mA and 40 kV, respectively. The data was collected at the step size of 0.017° and the type of scan was continuous. Energy dispersive X-ray spectroscopy (EDX) was measured by SHIMADZU. Co. Rayny EDX-700HS. The operating tube current and voltage were 100 μA and 15 kV, respectively. Rh was used as X-ray tube. Solid state13 C NMR spectra were obtained by JEOL JNM-ECA400. Scanning electron microscopy (SEM) was performed on the JEOL JSM-6701F scanning electron microscope operating at 5 kV. Freeze-dried of GO was made by using an ADVANTEC DRZ350WC. Electrical conductivity was measured by using MITSUBISHI CHEMICAL ANALYTECH MCP-T610.

The morphology of the films was evaluated using scanning electron microscopy (SEM, SU8010; Hitachi High Technologies Corp., Tokyo, Japan) employing an acceleration voltage of 4 kV. The specimens were coated with Pt–Pd using a magnetron sputter (MSP-1S; Vacuum Device Inc., Ibaraki, Japan) to prevent charge-up of the samples. The thickness of the films was calculated from SEM images using ImageJ [23 (link)]. Data were obtained for at least ten points and are shown as the mean ± SD. Fourier transform infrared (FT-IR) spectra of CHI powder, a protonated CHI film, each anionic polysaccharide powder, and polysaccharide composite films were obtained by a single reflection attenuation total-reflection (ATR) method using an FT-IR 6200 combined with an ATR PRO450-S (JASCO Corp., Tokyo, Japan). To obtain a protonated CHI film, 10 mg/mL CHI solution in 1% (vol./vol.) aqueous acetic acid were cast on the PTFE films and dried for 24 h at 37 °C.

Proton nuclear magnetic resonance (¹H-NMR) spectra were acquired using a JNM-ECA500 spectrometer (500 MHz NMR, JEOL RESONANCE Inc., Tokyo, Japan). Size exclusion chromatography (SEC) was employed to determine the average molar mass using a Prominence Nano system (Shimadzu Corp., Kyoto, Japan) equipped with UV (SPD-20A) and refractive index detectors (RID-20A) and two columns (7.8 mm × 30 cm, 8 µm, G4000H and G3000H, TSKgel, Tosoh Corp., Tokyo, Japan). Scanning probe microscopy (SPM) was performed using an SPA400 (Seiko Instrument Inc., Chiba, Japan) apparatus, and the SPM phase-difference images were analyzed using the Gwyddion 2.58 instrument. The 3D models were observed using a VHX6000 microscope (Keyence Corp., Osaka, Japan). The width and length were measured from a top-view photograph of the fabricated object observed under the microscope. The height was measured from the side-view photograph of the fabricated object. Attenuated total reflectance Fourier-transform infrared (ATR-FTIR) data were acquired using an FT-IR6200 instrument equipped with an ATR PRO450-S (JASCO Corp., Tokyo, Japan).