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Spm data processing software

Manufactured by Bruker

The SPM Data Processing software is a tool designed for the analysis and processing of data acquired by Scanning Probe Microscopy (SPM) instruments. It provides a comprehensive set of functionalities for the visualization, processing, and analysis of SPM data, enabling users to effectively extract relevant information from their measurements.

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5 protocols using spm data processing software

1

High-Resolution Atomic Force Microscopy

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Atomic force microscopy (AFM)
images were obtained with a JPK NanoWizard Ultra Speed instrument,
and the images were processed on JPK SPM Data Processing software.
The experiments were performed using a silicon probe (AC240TS, Asylum
Research) with 300 kHz nominal resonance frequency. The images were
scanned in an intermittent contact mode at room temperature with 512
× 512 pixels.
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2

Atomic Force Microscopy of Elastin-Like Proteins

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Samples for AFM were prepared by drop-casting 20 µL of 37°C 2 µM ELP or ELP/ELP-Bet v 1 on a silicon oxide wafer (Siegert Wafer) with a 285 nm thermal oxide layer or on a mica disc (V1 grade; Muscovite). The samples were dried at 37°C for 30 minutes. AFM images were recorded using a JPK NanoWizard Ultra Speed microscope and the obtained data was processed using the JPK SPM Data Processing software. All experiments were performed using a silicon probe (Olympus, OMCL-AC160TS) with a nominal resonance frequency of 300 kHz. The images were all scanned and recorded (with a resolution of 512x512 pixels) in intermittent contact mode in air at room temperature.
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3

Atomic Force Microscopy for Spheroid Elasticity

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The DLD-1 spheroids apparent Young’s modulus (E, in Pa) was
calculated by fitting each recorded force-indentation curve with the Hertz
contact mechanics model for a rigid spherical probe indenting an infinite
isotropic elastic half-space: FHertz=4ERδ3/23(1v2)
In the above equation, F is the
applied force, E is the elastic Young’s
modulus, υ is the Poisson’s
ratio (assumed to be 0.5 for soft material), Ris the radius of the AFM probe (17.5 μm), and
δ is the spheroid indentation.
AFM data analysis was performed using the JPK SPM Data Processing software.
A 2 μm deformation range was selected from near the maximum
indentation to fit the Hertz model.
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4

Patterned Surface Characterization by SEM and AFM

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Patterned surfaces were characterized by SEM using
a Mira3 scanning electron microscope and a VEGA microscope (TESCAN
Brno, s.r.o.) and by AFM using a NanoWizard 3 instrument (JPK Instruments)
and a Dimension FastScan instrument (Bruker) for high resolution.
For AFM, the scanning frequency was set at 1 kHz for a resolution
of 512 × 512 pixels and 0.5 kHz for a resolution of 1024 ×
1024 pixels. The final images were processed and analyzed with SPM
data processing software (JPK Instruments).
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5

Atomic Force Microscopy Imaging Protocols

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This 4.6. AFM microscopy AFM images were performed on a JPK NanoWizard Ultra Speed machine and the images were processed using a JPK SPM Data Processing software. The experiments were performed using a silicon probe (AC240TS, Asylum Research) with 70 kHz nominal resonance frequency. The images were scanned in an intermittent contact mode in air at room temperature with 512 × 512 pixels.
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