X tool

TGA (DTG-60A, Shimadzu) was conducted from room temperature to 700 °C at a heating rate of 10 °C min⁻¹ in an Ar atmosphere. XRD analysis of the products was performed using an X-ray diffractometer (SmartLab, Rigaku) with Cu Kα radiation. Raman spectra were recorded with a combined Raman FT-IR spectrometer (LabRAM ARAMIS IR2, HORIBA Jobin Yvon). The surface chemistry was investigated using X-ray photoelectron spectroscopy (XPS, X-TOOL, ULVAC). The morphologies, microstructure, and EDS of HCl-TW-Car and TW-Car samples were investigated by FE-SEM (Quanta 250 FEG, FEI) and TEM (JEM-2100F, JEOL). The BET surface area, total pore volume, and average pore diameter of the products were determined using nitrogen adsorption/desorption isotherm measurements (Tristar 3000, Micromeritics). Elemental analysis was performed using an elemental analyzer (TruSpec Micro, LECO).

The measurement of functional group characteristics on the sorbents was carried out using Fourier transform infrared spectroscopy (FT-IR, Agilent Cary 630 FTIR, Agilent Technology, Santa Clara, CA, USA). FT-IR analyses of adsorbents were conducted within the wavenumber range of 650–4000 cm^–1 in the attenuated total reflectance (ATR) mode with scanning number of 100 and 0.9 cm⁻¹ scanning resolution. Furthermore, to analyze minute changes in the functional groups of the sorbents, the XPS signals for N_1s and Cl_2p of the PVC and PEI-PVC were analyzed via XPS (X-TOOL, ULVAC-PHI, Kanagawa, Japan).

XRD patterns were recorded using an X‐Ray diffractometer (Rigaku, Smart Lab). The sheet resistance of different electrodes was measured by a probe tester (CMT‐SR2000N, AIT Co. Ltd.), and transmittance spectra were recorded with a UV‐Vis spectrometer (Lambda‐35, PerkinElmer). The surface morphology of electrodes after organic layer deposition was recorded using the AFM (Park XE‐100) in the tapping mode. Current profiles at LRS and HRS were measured by the C‐AFM technique (Park system XE‐100). XPS measurements of MXene and its composites were investigated using an X‐ray photoelectron spectroscope (X‐tool, ULVAC‐PHI). The photovoltaic characteristics in the forward bias were achieved by solar cell I–V test system (K3000, McScience) through Keithley 2400 source measurement unit under AM 1.5 (100 mW cm⁻²). EQE spectra of OSCs were measured by the solar cell IPCE measurement system (K3100, McScience). The electrical and synaptic properties were measured using ArC ONE (UK) and Keithley 4200A instruments.