X max50

The elemental composition of the cuticle of cicada ovipositors was acquired using energy dispersive x-ray spectroscopy (EDS) (X-Max50, Oxford Instruments). The elemental composition was determined by analyzing a defined region of the ovipositor with EDS for 10 minutes (20 kV, spot size 61, magnifications >200x). The percentage weight for each detected element (determined by Aztec software) was recorded. We analyzed ten dorsal and seven ventral locations along the length of each ovipositor (Supplementary Fig. S2). On the dorsum, six locations were analyzed in the rasping region, including three measurements near the distal tip (one measurement on a GIX, two measurements on a GVIII), and three measurements near the middle (one on a GIX, two on a GVIII). In addition, two measurements at the middle of the total ovipositor length (one on a GIX, one on a GVIII) and two measurements at the base of the ovipositor (one on GIX, one on GVIII) were recorded. On the ventral side of the ovipositor we measured two locations on a GIX in the rasping region, one at the distal tip and the other near the middle. The GVIII was measured at five locations, including the distal tip, the middle of the rasping region, the ventral lobe (=tongue-like slice)^{27 (link)} (near where the eggs exit the ovipositor), the middle of the ovipositor length, and the base of the ovipositor (Supplementary Fig. S2).

The plan-view and cross-section microstructure of the employed membrane film were characterized after the permeation experiments by scanning electron microscopy (SEM) using secondary electrons (SE) or backscattered electrons (BSE), with an FEI 650 NOVA NanoSEM instrument (FEI Company, Hillsboro, OR, USA) combined with energy dispersive spectroscopy (EDS) (X-MAX50, Oxford Instruments, Abingdon, Oxfordshire, UK).

SEM observations of the powder samples as well as TCP, 0.1SrTCP, and 0.5SrTCP ceramics were performed using a Tescan VEGA3 (Tescan, Czech) scanning electron microscope equipped with an Oxford Instruments X-Max 50 silicon drift energy-dispersive X-ray spectrometry (EDXs) system with AZtec (Oxford Instruments NanoAnalysis, France) and INCA software (JANA, Inc., Universal City, TX, USA) (Base Product package). Samples were coated with a thin layer of carbon for the SEM examinations. SEM images were acquired using secondary electron and backscattered electron imaging techniques. The EDX analysis results were based on the Ca_K, Sr_K, and P_K edge lines. The oxygen content was not quantified by EDX.

Surface properties were characterized in order to study surface morphology and chemistry. An optical 3D surface measurement system by Alicona Imagining GmbH (InfiniteFocus G5) was employed to analyze the depth, roughness and profile of the laser fabricated patterns. Laser confocal microscopy Keyence VK-X1000 (KEYENCE CORPORATION, Osaka, Japan) was used for measuring the specific parameters of surface roughness.
The changes in the wetting characteristics of laser treated and post-process samples were analyzed through measurement of the static contact angle using the sessile drop method with a video-based static contact angle computing device (OCA 15 from Data Physics Instruments). Droplets of distilled deionized water were applied in a volume of 8 μL. The contact angle values are the averages of three measurements. The total measurement time was 55 days. After this period, the samples were cleaned ultrasonically for 15 min in deionized water. Then, the samples were dried, and the static contact angles were measured again.
A Zeiss field-emission scanning electron microscope (FESEM; ULTRA PLUS, Jena, Germany) equipped with an energy-dispersive spectrometer from Oxford Instruments (EDS; X-Max 50) was used to detect changes in surface chemistry. In addition, Raman spectroscopy was employed to identify the form of titanium oxide.