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20 protocols using miniflex 2 x ray diffractometer

1

LDPE Composite Morphology Analysis

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The morphology of LDPE composites was investigated using XRD measurements. A MiniFlexII X-ray Diffractometer (Rigaku, Tokyo, Japan) was equipped at room temperature to perform XRD analysis of the neat LDPE and LDPE-based composite films. This technique was employed with a Cu-Kα source (λ = 1.5404 Å). It was performed at 50 kV and 20 mA [38 (link),39 (link),40 (link)]. The results were achieved in a 2θ range from 2° to 80°, with a 0.1° step size.
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2

Characterization of Composite Nanofibers

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The crystallinity
of the composite and carbonized nanofibers was investigated through
a powder X-ray diffractometer (Rigaku Miniflex II X-ray diffractometer,
Ni-filtered Cu Kα radiation, λ = 1.5406 Å). For morphological
and roughness studies of the synthesized nanofibers, the sample was
prepared in the powder form. Subsequently, the samples were coated
with a platinum thin layer via a sputtering technique to make the
surface conductive and to avoid any possible charging effect while
performing SEM analysis. The coated samples were then loaded into
the SEM measurement chamber under high vacuum and were examined at
a high voltage of about 3–10 kV. The morphology was examined
using a scanning electron microscope (JSM-5910 JEOL Japan). IR transmission
spectra were collected in the range of 400–4000 cm–1 using a PerkinElmer Spectrum Two FTIR spectrometer, equipped with
a universal attenuated total reflection accessory. An EDX electron
spectrometer (INCA 200, Oxford Instruments, UK) was used for elemental
analysis and their compositions.
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3

Phytochemical Analysis of Acacia racemosa

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Fourier Transform Infrared Spectrophotometer (FTIR) Cary 630 was carried out at room temperature by standard KBr method. Infra-red spectra of silica powder produced by different parts of the A. racemosa were recorded, analysed and represented in graphical form with Origin pro 8.6 software. MiniFlex II X-ray diffractometer, Rigaku was used for determining the XRD pattern of phytoliths from different parts of the plant. Origin pro 8.5 was used for making graphs and PCPDF-WIN Software was used for data analysis.
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4

Comprehensive Characterization of Materials

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Scanning electron microscopy (SEM) and SEM-energy dispersive X-ray spectroscopy (EDX) were carried out on a JEOL, JSM-7600 F instrument. Transmission electron microscopy (TEM) was carried out on a JEOL, 2000FX, 200 kV electron microscope. Magnetic susceptibilities were measured on a superconducting quantum interference device (SQUID) magnetometer, Quantum Design, MPMSXL-5. IV properties were measured using a electrochemical analyzer, BAS, Model ALS/DY2323 BI-POTENTIOSTAT. The temperature dependence of the electrical resistivity was measured by means of a Keithley, 2182 A Digital Nanovoltmeter. X-ray photo-electron spectroscopy was carried out a Thermo Scientific, ThetaProbe Angle-Resolved X-ray Photoelectron Spectrometer System. Thermogravimetric analysis (TGA) was carried out on a SEIKO, EXSTAR TG/DTA 6300 thermogravimetric analyzer. Micro Raman spectroscopy was performed on a Jasco, NRS-3100 spectrometer, with a 532 nm excitation source. Fourier transform infrared spectroscopy was performed on a PerkinElmer, Spectrum Two spectrometer. Powder X-ray diffraction (PXRD) patterns were obtained on a Rigaku, MiniFlex II X-ray diffractometer.
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5

Structural Characterization of Coatings

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The structure and morphology of the coatings were studied using a Zeiss Merlin scanning electron microscope (Carl Zeiss Microscopy GmbH, Jena, Germany). For X-ray spectral microanalysis and the construction of element maps, we used the EDX console (Oxford Instruments INCAx-act) for a Zeiss Merlin scanning microscope. The MiniFlex II X-ray diffractometer (Rigaku Corporation, Japan) was used for X-ray phase analysis (λ = 1.5406 Å).
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6

X-ray Diffraction Analysis of Samples

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Samples were analyzed using a Miniflex II X-ray diffractometer (Rigaku, Neu-Isenburg, Germany) with Ni-filtered Cu Kα radiation (1.54 Å). The tube voltage and tube current used were 30 kV and 25 mA respectively. The samples were analyzed on a silicon zero-background sample holder in the reflection mode. Diffraction patterns were collected for 2θ ranging from 5° to 40° at a step scan rate of 0.05° per second.
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7

X-ray Diffraction Analysis of MCC Beads

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Materials were analyzed using a Miniflex II X-ray diffractometer (Rigaku, Neu-Isenburg, Germany) with Ni-filtered CuK α radiation (1.54 Å). The tube voltage and current were 30 kV and 25 mA, respectively. In the case of coated and uncoated MCC beads, these were lightly ground in a pestle and mortar prior to analysis and all samples were analyzed on a zero background silicon sample holder in reflection mode. Diffraction patterns were obtained for 2θ between 2 and 40° at a step scan rate of 0.05° per second.
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8

PXRD Analysis of LID:DA Compositions

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Room-temperature PXRD was performed using a Rigaku Miniflex II X-ray
diffractometer (Japan). Cu Kα (1.54 Å) was used as a radiation
source. The scan rate of 0.05°/s at the range of 2–40
2θ degrees was employed. The tube voltage and tube current used
were 30 kV and 15 mA, respectively. Freshly ground LID:DA in a range
of molar compositions were analyzed. In addition, equimolar LID:DA
compositions were heated in an oven at 60 °C until molten, followed
by slow cooling and drying under vacuum at room temperature for 60
h. The melt–cool samples were then analyzed by PXRD.
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9

Powder XRD Protocol: Rigaku MiniFlex II

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The powder XRD measurement was carried
out on a benchtop MiniFlex II X-ray Diffractometer (Rigaku), from
5° to 50° with a turning speed of 2.5°/min.
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10

Synthesis and Characterization of PANI/SA Nanocomposite

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The PANI/SA nanocomposite was synthesized by a chemical oxidative polymerization method using APS as the oxidant with minor modification of the procedure reported elsewhere.26 (link) In a typical method, 0.1 g of SA was dissolved in 200 mL of 0.1 M NaOH at 60 °C for 6 h. Then, 0.5 mL of aniline was added to the above solution at 35 °C with stirring for 1 h and the resulting solution was cooled to 0 °C. The pH value was adjusted to 7 by adding 0.1 M HCl, and then aqueous solution of APS (0.9 g of APS) along with 2 mL of 0.1 M HCl was added to the solution mixture at 0 °C, and stirred for 24 h. The resulting product was collected by centrifugation and washed with deionized water several times and finally, PANI/SA was dried at 50 °C in a vacuum desiccator. The nanocomposite was characterized by TGA, FTIR, X-ray diffraction (XRD), TEM and Scanning Electron microscopy (SEM). FTIR spectra were obtained by using a PerkinElmer Spectrum-2000 (FTIR) spectrophotometer between 400 and 4000 cm−1. The SEM measurements were carried out using the Zeiss EVO50 scanning electron microscope. The X-ray diffraction patterns were recorded on a Rigaku Miniflex II X-ray diffractometer using CuKα as the source. TEM images were observed on a Jeol JEM F-200 transmission electron microscope.
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