Miniflex 2 x ray diffractometer
The Miniflex II is a compact and versatile X-ray diffractometer manufactured by Rigaku. It is designed for phase identification and quantification of crystalline materials. The Miniflex II utilizes Cu Kα radiation and features a goniometer, X-ray generator, and a detector to collect and analyze diffraction patterns from samples.
Lab products found in correlation
20 protocols using miniflex 2 x ray diffractometer
LDPE Composite Morphology Analysis
Characterization of Composite Nanofibers
of the composite and carbonized nanofibers was investigated through
a powder X-ray diffractometer (Rigaku Miniflex II X-ray diffractometer,
Ni-filtered Cu Kα radiation, λ = 1.5406 Å). For morphological
and roughness studies of the synthesized nanofibers, the sample was
prepared in the powder form. Subsequently, the samples were coated
with a platinum thin layer via a sputtering technique to make the
surface conductive and to avoid any possible charging effect while
performing SEM analysis. The coated samples were then loaded into
the SEM measurement chamber under high vacuum and were examined at
a high voltage of about 3–10 kV. The morphology was examined
using a scanning electron microscope (JSM-5910 JEOL Japan). IR transmission
spectra were collected in the range of 400–4000 cm–1 using a PerkinElmer Spectrum Two FTIR spectrometer, equipped with
a universal attenuated total reflection accessory. An EDX electron
spectrometer (INCA 200, Oxford Instruments, UK) was used for elemental
analysis and their compositions.
Phytochemical Analysis of Acacia racemosa
Comprehensive Characterization of Materials
Structural Characterization of Coatings
X-ray Diffraction Analysis of Samples
X-ray Diffraction Analysis of MCC Beads
PXRD Analysis of LID:DA Compositions
diffractometer (Japan). Cu Kα (1.54 Å) was used as a radiation
source. The scan rate of 0.05°/s at the range of 2–40
2θ degrees was employed. The tube voltage and tube current used
were 30 kV and 15 mA, respectively. Freshly ground LID:DA in a range
of molar compositions were analyzed. In addition, equimolar LID:DA
compositions were heated in an oven at 60 °C until molten, followed
by slow cooling and drying under vacuum at room temperature for 60
h. The melt–cool samples were then analyzed by PXRD.
Powder XRD Protocol: Rigaku MiniFlex II
out on a benchtop MiniFlex II X-ray Diffractometer (Rigaku), from
5° to 50° with a turning speed of 2.5°/min.
Synthesis and Characterization of PANI/SA Nanocomposite
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