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Jem 100cx 2

Manufactured by Hitachi
Sourced in Japan

The JEM-100CX II is a transmission electron microscope (TEM) manufactured by Hitachi. It is designed to provide high-resolution imaging and analysis of a wide range of materials at the nanoscale level.

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6 protocols using jem 100cx 2

1

Comprehensive Materials Characterization

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The morphologies of the samples were investigated by field-emission scanning electron microscopy (FE-SEM, Hitachi SU-8010), equipped with energy-dispersive X-ray spectroscopy (EDX) and transmission electron microscopy (TEM, JEM-100CX II). The crystal structures were characterized by powder X-ray diffraction (XRD, PNAlytical X'Pert PRO) with Cu Kα radiation. Nitrogen adsorption/desorption measurements were carried out by Micromeritics ASAP 2020. The specific surface areas were calculated by the multipoint Brunauer-Emmett-Teller (BET) method.
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2

Comprehensive Physicochemical Characterization of Samples

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Fourier transform infrared (FTIR) spectra of the samples were recorded over the range of 400–4000 cm−1 using a Bruker (Alpha 200486) FTIR spectrometer. The crystalline structure of the prepared samples was characterized by X-ray diffractometer (Ultima-IV, Rigaku Corporation, Tokyo, Japan) using Cu Kα radiation. The microscopic analysis was carried out using a scanning electron microscope (Hitachi, S3000H. Japan) and a transmission electron microscope (JEM-100 CX II). Thermal analysis (TGA/DTA) was carried out using a Simultaneous Thermal Analyzer (STA, Linseis, USA 6807/8835/16). An accurately weighed sample was placed in an alumina crucible and heated from room temperature to 973 K at a heating rate of 283 K min−1. The size distributions and zeta potential (ζ) of the particles were determined with an Anton Paar Litesizer 500 by the DLS technique. Before DLS was carried out, each sample was sonicated for 10 minutes to obtain a fine suspension of the samples for better results. The surface area of the samples was measured by nitrogen adsorption–desorption isotherms using the Brunauer–Emmett–Teller (BET; Micromeritics ASAP 2020) method.
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3

Visualizing Nanodroplet Structures with Microscopy

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A scanning electron microscope was utilized to investigate the CEO-NE formulations (Hitachi High Technologies, USA). To visualize the nanodroplets’ outer surface and physical size, the samples were placed on a polycarbonate substrate, dried at room temperature, and then placed in a critical dryer. The samples were then coated with gold and examined [35 (link)]. Transmission electron microscopy was utilized to obtain data regarding the structure of CEO-NE (TEM) (JEM-100CXII, Hitachi Co. Ltd., Japan). Briefly, a droplet of CEO was placed on a copper wire with a carbon film and then stained with a 2 wt% solution of phosphotungstic acid for 2 min. The stained droplets were air-dried for 10 min and then analyzed using TEM at an accelerating voltage of 200 kV [36 (link),37 (link)].
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4

Comprehensive Characterization of Obtained Samples

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FE‐SEM (Hitachi SU‐8010) and TEM (JEM‐100CX II) equipped with EDX were employed to characterize the morphologies of the obtained samples. The composition of samples was analyzed by X‐ray diffractometer (PANalytical X'Pert Pro, Cu Kα‐irradiation, λ = 0.15 404 nm) and XPS (Thermo Scientific, ESCALAB250Xi). The FTIR spectroscopy was conducted on a FTIR spectrometer (Nicolet, iS50).
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5

Preparing TEM Samples from Freeze-Dried Products

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To prepare the samples for examination with a transmission electron microscope (TEM), 1 mg of the freeze-dried product was first dispersed in 600 L of Milli-Q water, and then 1 drop of this solution was placed on a copper grid. Subsequently, the analysis was performed. The sample was dried by air and then examined with the help of an electron transmission microscope (JEM-100CXII, Hitachi Co., Ltd., Tokyo, Japan).
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6

Characterization of FLS@MnO2 Nanostructures

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An Adwa AD11P pH-meter (Romania) was used to measure pH values. The UV-Vis and luminescence measurements were carried out by Shimadzu UV-Vis (1601/PC, Japan) and a SCINCO FS/2 FluoroMate (Korea) spectrometers, respectively. Fourier-transform infrared (FT-IR) spectra were carried out by Nicolet™ iS™10 FTIR, Slovenia in the range of 400–4000 cm−1. The surface morphology images of FLS@MnO2 NS was done by scanning electron microscope (SEM), Hitachi and Transmission Electron Microscope (TEM, JEM-100CX II, USA). The phase crystallinity profile of FLS@MnO2 NS was studied utilizing a Philips X-ray diffractometer (1710 PW, Cu Kα radiation λ = 1.5405 Å, 40 kV voltage, 30 mA current, and 0.06° min−1 scanning rate, UK). Elemental analysis was performed using OXFORD INA energy dispersive X-ray instrument (EDX). The powder X-ray diffraction (PXRD) was scanned by Philips X-ray diffractometer PW 1710 supplied with 40 kV operating applied voltage, 30 mA current, 0.06° min−1 scanning rate in the 2θ range of (4–60°) and Cu Kα radiation (λ = 1.5405 Å).
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