Cm20 tem
The CM20 TEM is a transmission electron microscope (TEM) manufactured by Philips. It is a versatile instrument used for high-resolution imaging and analysis of materials at the nanoscale level. The CM20 TEM provides detailed structural and compositional information about a wide range of samples, including biological specimens, inorganic materials, and semiconductors.
Lab products found in correlation
12 protocols using cm20 tem
Comprehensive Characterization of CDHA Nanocarriers
Characterization of Ion-Induced Artefacts in FIB-TEM Specimens
Characterization of Crystalline Materials
Comprehensive Membrane Characterization
Characterization of MWCNT-7 Nanotubes
Characterization of Upconversion Nanoparticles
Negative Staining of Nanoliposomes for TEM
Microstructure and Mechanical Properties of Mg-Ca-Al Alloy
Samples for optical microscopy and electron backscatter diffraction (EBSD) analysis were prepared by mechanical grinding and polishing followed by electrolytical polishing using the electrolyte AC2 (Struers). Transmission electron microscopy (TEM) samples were prepared from 3 mm discs by mechanical grinding and twin-jet polishing until perforation using a solution of 3% perchloric acid in ethanol as electrolyte.
Tensile testing was done at room temperature and an initial strain rate of 10−4 s−1 using an electromechanical testing machine (DZM) with an accuracy of 0.17 MPa. Texture measurements were performed on a Bruker D8 Advance x-ray diffraction instrument. EBSD measurements were conducted using a Zeiss FIB XB1540 SEM and TEM observation were performed on a Philips CM20 TEM.
Comprehensive Nanoparticle Characterization Protocol
Visualizing Nanoparticles with TEM
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