AFM imaging was performed using a MFP-3D microscope (Asylum Research, Goleta, CA, USA) in a tapping mode with a typical scan rate of 0.5 Hz. Images were taken in air using sharpened silicon cantilevers, SSS-SEIHR (Nanosensors, Neuchâtel, Switzerland), with guaranteed tip radius < 5 nm or standard cantilevers, OMCL-AC200TS (Olympus, Tokyo, Japan), with a typical tip radius of 7 nm. FemtoScan Online software (http://www.femtoscanonline.com ) was used to filter, analyze and present the AFM images. SPM Image Magic software (https://sites.google.com/site/spmimagemagic ) was used for a semi-automatic measurement of the height of visualized objects.
Sss seihr
Manufactured by Nanosensors
Sourced in Germany
The SSS-SEIHR is a high-precision laboratory instrument designed for the analysis and characterization of nanoscale materials. It utilizes advanced scanning electron imaging and high-resolution spectroscopy techniques to provide detailed information about the surface and composition of samples at the nanometer scale.
Automatically generated - may contain errors
3 protocols using sss seihr
1
Atomic Force Microscopy Imaging Protocol
2
High-Resolution AFM Imaging Techniques
3
Imaging of Protein Monomers and Polymers
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For imaging fg monomers and soluble polymers, adsorption to polystyrene (PS) and to trioctylmethylamine (TOMA) coated silica wafers was used and imaging was carried out by topographic and lateral atomic force microscopy (AFM) scanning as described (Koo et al. 2010 (link); Galanakis et al. 2021 (link)). For enhanced image resolution, a modified graphite (MG) surface (water droplet angle 45.5° ± 0.5°, n = 3) was used as described (Protopopova et al. 2014 ) Briefly, a 2-μl aliquot of fg 5 μg/ml solution was applied for 5–15 s, immediately diluted with 100 μl deionized water for 10 s, dried by forced air, and scanned by AFM in tapping mode using super-sharpened cantilevers, SSS-SEIHR (Nanosensors, Germany) with a tip radius < 0.5 nm, and the MFP-3D AFM microscope (Asylum Research, Oxford Instruments, USA).
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