Merlin compact scanning electron microscope
The Merlin Compact is a scanning electron microscope (SEM) designed by Zeiss. It provides high-resolution imaging capabilities for various applications. The core function of the Merlin Compact SEM is to generate detailed images of sample surfaces by scanning them with a focused electron beam.
Lab products found in correlation
8 protocols using merlin compact scanning electron microscope
Visualizing P. indica Colonization in Wheat Roots
Characterization of MWCNT/WPU Coating
When the test on the wear was finished, the surface morphology of the wear track was observed with a VEGA3 XMU SEM (TESCANSCAN, Brno, Czech) to characterize the effect of ES on the wear resistance of the water-based conductive coating.
Characterization of CuO Nanostructures
Microstructure Analysis of HPIDF/F-HPIDF
Morphological and Crystalline Analysis of Ag Powders and CNT/Ag/AgCl
Physicochemical Characterization of CuCo-PTC MOF
Comprehensive Characterization of Nanostructured Materials
Morphometric Analysis of Drosophila Sex Combs
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