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9 protocols using axis ultra dld instrument

1

Comprehensive Characterization of Organosilane Nanoparticles

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The OSNP were imaged with a JEOL JEM-1200 EXII transmission electron
microscope (TEM) operating at 120 kV. A JEM-2100F operating at 210
kV was also used for some samples. The hydrodynamic radius and zeta
potential were measured with a Zetasizer from Malvern via dynamic
light scattering (DLS). The N2 adsorption–desorption
isotherms at 77 K were measured on a Micrometitics ASAP 2020 system.
FT-IR spectrum was performed on a Spectrum Two spectrometer from PerkinElmer.
The nitrogen in the OSNP was analyzed using a PerkinElmer CHN analyzer.
Solid-state 29Si NMR spectra were recorded using a Bruker
AMX-600 spectrometer. X-ray photoelectron spectroscopy (XPS) analysis
was performed using a Kratos Axis Ultra DLD instrument with monochromatic
Al (Ka) radiation. The data were analyzed using Casa-XPS software,
and two different components were fit to the N 1s signals. The energy
difference between these components was fixed at 1.8 eV.42 (link) An inductively coupled plasma optical emission
spectrometer (ICP-OES, Optima 3000DV, PerkinElmer) was used to quantify
the loss of OSNP during desorption. The pH was measured with a Milwaukee
MW 102 pH/Temp Meter. All absorbance measurements used a SpectraMax
M5 spectrophotometer from Molecular Devices.
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2

Characterization of CDDP-OLA Nanoparticles

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A total of 10 µL of freshly made CDDP-OLA NPs was dropped onto copper grids with a carbon film and left to stand for 10 min. A transmission electron microscope (Tecnai G2 Spirit Biotwin; FEI, Hillsboro, OR, USA) was utilized, with the voltage set at 120 kV, to image the dimensions and form of CDDP-OLA NPs. Dynamic light scattering (DLS; Zetasizer Nano ZS90, Malvern, England) was utilized at a temperature of 25°C to evaluate the size distribution of CDDP-OLA NPs in hydrodynamic fluid with 2 mL of the solution in disposable plastic cuvettes. The FT-IR spectra of CDDP-OLA NPs at 303, 333, 363, 393 and 423 K were determined using an FT-IR spectrometer (Nicolet 6700, ThermoFisher Scientific, Waltham, MA, USA). The scanning parameters were as follows: scan frequency range, 400–4,000 cm−1; resolution, 4.0 cm−1; and scan times, 32. A 400 MHz nuclear magnetic resonance (NMR) spectrometer (Avance III 400 MHz, Bruker, Germany) was used to measure the 1H NMR spectra at various temperatures: 303, 333, 363, and 393 K. Deuterium dimethylsulphoxide (DMSO-d6) was used to dissolve the samples. With an ultraviolet (UV)-visible (Vis) Spectrophotometer (UV-1800, Shimadzu, Japan), measurements in the UV-Vis spectrum were performed using cuvettes with a 1-cm light path. The platinum (Pt) atom was detected using an AXIS UltraDLD instrument (Kratos, Japan).
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3

Comprehensive Catalyst Characterization

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X-ray diffraction (XRD) experiments were carried out with Bruker D8 Advance diffractometer. The elemental content was determined by Shimadzu ICPS-7500 equipment. The morphology and structure of catalysts were studied on JEOL JEM-2010 high-resolution transmission electron microscope. AC-HAADF-STEM images and EDS mapping data were performed on JEOL JEM-ARM200F. The CO pulses chemisorption experiments were conducted on Micromeritics Autochem II 2920. Quasi in situ XPS measurements were recorded on Kratos Axis Ultra DLD Instrument. The pre-treated sample was placed in a glove box and transferred into a sample rod in a N2 atmosphere. In situ/Operando XAFS at Ir L3-edge and Ce L3-edge measurements were recorded at the beamline BL11B of the Shanghai Synchrotron Radiation Facility (SSRF), Shanghai Institute of Applied Physics, Chinese Academy of Sciences (CAS). In situ/operando DRIFTS were studied on a Bruker TENSOR II infrared spectrometer with a MCT detector. The detailed experimental methods are present in the Supplementary Information.
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4

Characterization of BCF x Powders

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The phase composition of BCFx powders was analyzed using an X-ray diffractometer (XRD, Bruker AXS D8 Advance) with a Cu-Kα radiation (λ = 1.5418 Å) source in the 2θ range of 20–80°. The microstructure of the cells was observed using scanning electron microscopy (SEM) (Supra 55 Sapphire Carl ZEISS). The conductivity of BCFx was measured using standard four-probe method with a Keithley 2700 digital multimeter. The BCFx powders were pressed at a pressure of 230 MPa and then sintered at 900 °C for 12 h to obtain the rectangular bars (12 × 2 × 1.5 mm). Thermal expansion coefficients (TECs) of BCFx were recorded with a dilatometer (SETARAMM Setsys 18) within a temperature range of 50–800. X-ray photoelectron spectra (XPS) were conducted on a Kratos Axis Ultra DLD instrument with a radiation source of Al Kα (1486.6 eV). Electron paramagnetic resonance (EPR) spectra were performed with Bruker EPR100d X-band spectrometer. Thermogravimetric (TG) tests were performed using TG/DTA 6300 thermal analyzer (PerkinElmer, USA) in air atmosphere in temperature range of 50–800 °C. The oxygen non-stoichiometry value (δ) of samples at elevated temperatures was calculated by thermogravimetric analysis (TGA) and iodometric titration data.
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5

Characterization of SiO2 Nanoparticles

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The sizes and morphologies of the SiO2 NPs were evaluated by transmission electron microscopy (TEM; Tecnai F20, Philips, Netherlands, 200 kV) and field-emission scanning electron microscopy (FE-SEM; JEOL JSM-7001F). The crystal structures of the SiO2 NPs were examined by powder X-ray diffraction (XRD) using monochromic Cu-Kα radiation (Rigaku Smart Lab, Japanese Neo Confucianism, Japan) at 40 kV and 300 mA. To investigate the chemical states of the SiO2 NPs an X-ray photoelectron spectrophotometer (XPS) was employed. XPS analyses of the nanoparticles were conducted by Axis Ultra DLD instrument (Kratos Analytical, Manchester, UK).
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6

X-ray Photoelectron Spectroscopy of Cerium Nanoparticles

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XPS measurements
were carried out using a VG microlab Auger spectrometer with a 310-F
analyzer using unmonochromatized Al Kα photons (1486.6 eV).
The energy resolution was approximately 1.9 eV for the experimental
settings used, as determined from the full width at half-maximum of
the peak-fitted Au 4f7/2 line. Each Ce 3d scan had a pass
energy of 20 eV, step length of 0.1 eV, and dwell time of 500 ms.
The nanoparticle samples were deposited on a TL-1 cleaned gold substrate.
The acquired Ce 3d spectra were aligned to the Au 4f7/2 peak (84.0 eV), and the photo cross section for the gold substrate
in the Ce 3d region was subtracted.
XPS measurements of the
reference samples Ce(III)acetate and Ce(IV)oxide nanopowder were carried
out using an AXIS UltraDLD instrument from Kratos Analytical and analyzed
with monochromatic Al Kα (1486.6 eV) radiation. Energy resolution
for the experimental settings was determined to be 0.8 eV, utilizing
full width at half-maximum of the peak-fitted Au 4f7/2 line.
The samples were drop-casted on a TL-1 cleaned gold substrate.
The gold substrates were produced by evaporating 2000 Å gold
onto a (111) Si surface precoated with a 25 Å thick layer of
Ti.
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7

XPS Analysis of Mineral Particle Composition

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The surface elemental composition of mineral particles was analyzed using X-ray photoelectron spectroscopy (XPS) with an Axis Ultra DLD instrument (Kratos Analytical, Manchester, UK) equipped with monochromatic AlKα radiation (1486.6 eV; emission current: 20 mA, voltage: 6 kV). Samples were prepared by affixing air-dried minerals onto a bar (sample area: 50 mm2) using indium foil (Plano GmbH, Wetzlar, Germany). Survey spectra were obtained in the binding energy range of 1200–0 eV (with a 1 eV resolution) under a pressure of 4 × 107 Pa. The measurements utilized a pass energy of 160 eV, a dwell time of 500 ms, and comprised three sweeps per measurement cycle at a take-off angle of 0°. For each sample, three spectra were recorded at different locations (spot size: 300 × 700 µm). After charge correction for the Si 2p peak of quartz (103 eV), the spectra were analyzed using Vision 2 software (Kratos Analytical, Manchester, UK). Surface elemental composition was quantified in terms of atom percentage (at.-%) using the relative sensitivity factors incorporated in the software. For additional details regarding the fitting procedure, please refer to Woche et al.58 .
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8

Spectroscopic and Microscopic Characterization of Materials

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1H nuclear magnetic resonance (NMR) and Fourier
transform infrared
(FT-IR) spectral measurements were carried out using an AV300 M spectrometer
(Bruker Biospin) and Spectrum 65 FT-IR spectrometer (PerkinElmer)
equipped with an attenuated total reflection apparatus, respectively.
Chemical shifts of protons are reported in parts per million (δ
scale) downfield from tetramethylsilane (TMS). Chemical shifts for
the carbon resonances are reported in parts per million (δ scale)
downfield from TMS. Centrifugation was carried out using a Himac CF
15R centrifuge (Hitachi). X-ray photoelectron spectroscopy (XPS) was
performed using an AXIS-ULTRADLD instrument (Shimadzu,
Co., Japan). Thermogravimetric analysis (TGA) was conducted using
an Exstar TG/DTA6300 analyzer (Seiko Instruments, Inc.) at a heating
rate of 10 °C min–1 under an air flow of 200
mL min–1. Scanning transmission electron microscopy
(STEM) and transmission electron microscopy (TEM) measurements were
performed using an SU9000 microscope (Hitachi High-Technologies) operated
at 30 kV and a JEM-2010 microscope (JEOL) operated at 120 kV, respectively.
A copper grid with a carbon support (Okenshoji) was used for the STEM
and TEM observations. Gas adsorption (77 K, 1 × 10–8 < P/P0 < 1) measurements
were conducted on a Belsorp mini analyzer (BEL Japan, Inc.) after
pretreatment at 300 °C for 12 h under high vacuum.
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9

Characterization of Laser-Induced Carbon Samples

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The morphology
of the laser-induced
samples was investigated with SEM (Zeiss Auriga, Germany) at 5 kV.
The micro- and nano-structure of nanolignin and laser-induced samples
was examined using TEM (Zeiss Libra 200MC, Germany) at 200 kV. The
laser-carbonized samples were scraped from the laser-irradiated patterns
and sonicated in ethanol before measurements. An X-ray diffractometer
(Rigaku, Japan) was used to measure the XRD patterns of the carbonized
samples. XPS was carried out using an AXIS UltraDLD instrument (Shimadzu,
Japan). The Raman spectra were observed on a Raman microscope (DXR2xi,
Thermo Scientific, USA) at 532 nm. The sheet resistance was measured
with an M-6 handheld four-point probe tester (Xi’an, China).
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