S 4800 field emission scanning electron microscope sem
The S-4800 field emission scanning electron microscope (SEM) is a high-performance imaging tool designed for detailed analysis of materials at the nanoscale level. It utilizes a field emission electron source to generate a focused electron beam, which is then scanned across the sample surface to produce high-resolution images.
Lab products found in correlation
8 protocols using s 4800 field emission scanning electron microscope sem
Aligned AuNPs on Graphene Characterization
Synthesis and Characterization of Waste-Derived Nanoporous Carbons
A Hitachi S–4800 field-emission scanning electron microscope (SEM, Tokyo, Japan) operated at 20 kV was used to obtain the morphology of the prepared carbons. X-ray diffraction (XRD) analyses were performed by a Bruker D8 diffractometer (Bruker, Karlsruhe, Germany) using the CuKa radiation. Fourier transform-infrared (FT–IR) spectra were recorded using a Nicolet iS10 FT–IR spectrophotometer (Thermo Fisher, Waltham, MA, USA).
Comprehensive Characterization of CD Systems
Multimodal Characterization of Catalysts
Fluorescent Microsphere Drug Characterization
Morphological Characterization of Astelia and Collospermum
Morphological characters that varied at or below the genus rank were measured or scored for all
scanning electron microscope
Characterizing Rigid Polyurethane Foams
Characterization of Crystalline Phases and Optical Properties
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