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Ion sputter jfc 1100

Manufactured by JEOL
Sourced in Japan, United States

The Ion Sputter JFC-1100 is a device designed for the deposition of thin conductive films on samples. It utilizes an ion beam to sputter target materials onto the sample surface, creating a thin, uniform coating. The core function of this equipment is to prepare samples for various analytical techniques, such as scanning electron microscopy (SEM), by improving their electrical conductivity.

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14 protocols using ion sputter jfc 1100

1

Detailed Genital Observation Protocol

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External characters were observed under a stereoscopic microscope (Olympus SZX10). Genital structures were placed on a cavity slide glass with 50% glycerol solution and observed with an optical microscope (Nikon Eclipse E400). The genitalia slide was prepared in the following steps: The removed abdomen was placed in a 200 µl PCR tube filled with 10% solution of potassium hydroxide (KOH) and kept in heated water for about seven minutes. After rinsing in 70% ethanol solution, the abdomen was dissected by cutting its lateral side using fine insect pins. The genitalia were transferred to a cavity slide glass with 50% glycerol solution for observation. After the observation, the genitalia and abdomen were mounted in Euparal on cover glasses each glued to a piece of cardboard, and pinned with the specimens.
Photographs of adults were taken with digital camera (Canon EOS 7D), and composite images were produced using automontage software Combine ZM. These images were retouched using Photoshop 6.0 (Adobe Systems Inc.).
The larvae were preserved in 70% ethanol (Stehr 1987 ), and the dissected specimens were mounted in Euparal. Two larval specimens were dehydrated with absolute ethanol and sputter-coated with gold-palladium with a JEOL Ion Sputter JFC-1100 for examination with a scanning electron microscope (SEM). SEM photographs were taken using JSM-5600LV.
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2

SEM Analysis of Polymer-MWCNT-G. oxydans Samples

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The surface morphology of the sample was examined by scanning electron microscopy (SEM). Samples of the initial polymers, polymers with oxidized MWCNTs, and polymers with oxidized MWCNTs and membrane fraction of G. oxydans were fixed at 4 °C for 12 h in 0.05 M sodium cacodylate buffer (pH 6.8) containing 1.5% glutaraldehyde and then post-fixed at 20 °C for 3 h in the same buffer supplied with 1% OsO4. The samples were coated with gold after dehydration (Fine Coat Ion Sputter JFC-1100, Tokyo, Japan) and examined with a scanning microscope JSM-6510LV (JEOL, Tokyo, Japan).
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3

Microstructural Analysis of Digested Yam

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The yam samples were carefully cut into small pieces (3 × 3 × 1 mm) and digested under similar conditions as described in Section 2.4. The yam pieces before digestion (G0) and the digested samples at G60, G120, I60 and I120 were collected and immediately stored at −80 °C until the freeze drying of samples was performed. Then, the freeze-dried samples were sputter-coated with gold (Ion sputter JFC-1100, Jeol, Tokyo, Japan), and the microstructures were observed using scanning electron microscope (SEM) (SU1510, Hitachi, Tokyo, Japan) at an accelerating voltage of 5 kV.
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4

Scanning Electron Microscopy of Biofilms

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The surface morphology of the biofilms was examined using scanning electron microscopy (SEM). Samples of the cells placed on membrane filters were fixed in glutaraldehyde vapor for 24 h at 4 °C and post fixed in OsO4 vapor for 3 h at 20 °C. After dehydration in propylene oxide vapor, the samples were coated with gold (Fine Coat Ion Sputter JFC-1100, Tokyo, Japan) and examined under a scanning microscope JSM-6510LV (JEOL, Tokyo, Japan).
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5

Scanning Electron Microscopy of Cell Surface

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The surface morphology of the cells was examined with scanning electron microscopy (SEM). Samples of the cells placed on membrane filters were fixed at 4 °C for 24 h in glutaraldehyde vapor and post fixed at 20 °C for 3 h in OsO4 vapor. After dehydration in propylene oxide vapor, the samples were coated with gold (Fine Coat Ion Sputter JFC-1100, Tokyo, Japan) and examined under a scanning microscope JSM-6510LV (JEOL, Tokyo, Japan).
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6

Scanning Electron Microscopy of Leaf Fragments

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For scanning electron microscopy (SEM) 4 mm2 leaf fragments, with the middle vein and part of the leaf blade, previously fixed in FAA, were dehydrated with a series of alcohols and acetone and submitted to a dryness critical point with liquid CO2. Dry fractions of the sieved leaf waste were directly attached to SEM stubs by using a carbon double-adhesive disc. Samples of leaf fragments and fractions of the powder were coated with gold-palladium by using a Fine Coat Ion Sputter JEOL JFC-1100. The observations were made under a scanning electron microscope (Carl Zeiss Supra 55VP, Oberkochen, Germany) from the Integral Center for Electron Microscopy (UNT-CONICET).
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7

SEM Preparation of Plant Samples

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For scanning electron microscopy (SEM), samples were fixed in glutaraldehyde phosphate 5% buffered with 0.1 M sodium cacodylate at pH 7, and post-fixed in 1.5% osmium tetroxide buffered with 0.1 M sodium cacodylate at pH 7.2. Primordia and mature leaf segments were dehydrated in a graded acetone solutions series, submitted to a critical point drying by using CO2 and coated with gold (Fine Coat Ion Sputter JEOL JFC-1100). SEM of gold-coated samples was performed by using a ZEISS SUPRA-55 VP field emission scanning electron microscope at Centro Investigación y Servicios de Microscopía Electrónica (CISME), CONICET-UNT.
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8

Yeast Glucose Uptake Assay

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The assay was carried out according to Bhutkar et al. (2017) . To prepare the suspension, commercial yeast was washed three times with distilled water and then centrifuged (3000 x g, 5 min) until the supernatant was clear. Then, a 10% (v/v) S. cerevisiae cells suspension was prepared in distilled water. One hundred microliter of this suspension was contacted with increasing concentrations of PEE (10–100 mg/mL) (before and after simulated GD digestion). Then, 1mL of 20 mM glucose solution was added to this mixture, incubated for 1 h at 37 °C and centrifuged at 2500 x g for 5 min. The glucose concentration in the supernatant was determined by enzymatic glycemia kit. The percentage of increase in glucose consumption by S. cerevisiae cells was calculated using the following formula:
For scanning electron microscopy, yeasts with and without treatment were coated with gold (Fine Coat Ion Sputter JEOL JFC-1100). ZEISS SUPRA-55 VP field emission scanning electron microscope was used. The micrographs were taken for each sample at a magnification of 10,000 and 50,000.
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9

Morphological Analysis of Red Chilto Fruit Powders

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The fruits of Solanum betaceum (red variety) were harvested at the ripening stage in which they are consumed in Finca del Obispo, Villa Jardín de Reyes, Jujuy, Argentina, in December 2016. Skin, pulp and seeds were separated, freeze-dried and powdered. The powders were vacuum packed and stored at -20 °C. Scanning electron microscopy (SEM) of each powder was carried out. SEM of gold-coated (Fine Coat Ion Sputter JEOL JFC-1100) samples was performed by using a ZEISS SUPRA-55 VP field emission scanning electron microscope at Centro Integral de Microscopía Electrónica (CIME), CONICET-UNT. The micrographs were taken for each sample at a magnification of 10,000 and 50,000 (Figure 1).

I) Red chilto fruit; II) (A)Seed; (B) pulp and (C) skin powder; III) Scanning electron micrographs of (A) seed powder; (B) pulp powder and (C) skin powder.

Figure 1
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10

Basidiomata and Sclerotia Morphology Analysis

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Colors of basidiomata and sclerotia were described according to the color identification chart of the Royal Botanic Garden Edinburgh (Flora of British Fungi) (Anonymous, 1969 ). Basidiospores from fresh specimens were mounted in water for light microscopic examination. About 30 basidiospores were randomly chosen for determination of length and width excluding the apiculus. Surface features of basidiomata and sclerotia were observed by phase-contrast microscopy and scanning electron microscopy (SEM). For SEM, basidiomata and sclerotia were cut on a piece of double-sided adhesive tape attached to a specimen holder and then coated with platinum-palladium using a JFC-1100 Ion Sputter (JEOL, Tokyo, Japan). They were examined using a JSM-T330A SEM (JEOL) operating at 10 kV.
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