Phi 5000 versaprobe

The morphology of the obtained products was analyzed through a Zeiss Ultra-Plus field emission scanning electron microscope (FESEM) with an accelerating voltage of 3 kV. Powder X-ray diffraction (PXRD) was carried out on an analytical X’Pert Pro MRD equipped with Cu Kα as the X-ray source (λ = 0.15418 nm) at a scan rate of 0.033°/s in the 2θ range 10−80°. X-ray photoelectron spectroscopy (XPS) data were recorded using an ULVAC-PHI PHI 5000 VersaProbe X-ray photoelectron spectrometer with Al Kα X-ray beams as the excitation source.

All photochromism studies of PHI were performed using a white LED (HAYASHI-REPIC, LA-HDF 100NA) as a visible light source.
UV–Vis measurements (V-650 spectrometer, JASCO) of PHIG were performed on samples placed between two quartz plates to combine transmission and diffuse reflection methods. The time variation of specific wavelengths about the PHIG sample between the glass plates was measured using a spectrometer (BIM-6002A, Brolight) in a homemade dark box. The KBr pellet method was used to record FT-IR spectra of the powder samples. XRD analyses were carried out using a diffractometer (Ultima IV, Rigaku) with a Cu Kα radiation source (λ = 0.15496 nm).
Electric current measurements were performed on PHIG pasted on patterned ITO substrate using a source-measure unit (6487, Kethley) under constant voltage (0.5 V) generated by a DC power source (R6144, Advantest).
XPS measurements were performed on PHIG using a PHI 5000 Versa Probe (Ulvac-Phi) instrument with monochromatic Al Kα (hν = 1486.6 eV) radiation as the excitation source. The XPS spectra were analyzed with Voigt functions in the XPSPEAK41 software program (written by Raymund W. M. Kwok). PHIG[blue] was probed using a blue laser (λ = 473 nm, KYOCERA SOC, J010BS).

The composition and morphology of the samples were characterized by X-ray photoelectron spectroscopic (XPS) (PHI 5000 VersaProbe (ULVAC-PHI, Chigasaki, Japan) and scanning electron microscopy (SEM; Philips XL 30 FEG, Eindhoven, The Netherlands), respectively. The electrical conductivities and Seebeck coefficients of the samples were measured simultaneously (in a vacuum atmosphere from 300 K to 370 K) on a MRS-3L thin-film thermoelectric test system (Wuhan Giant Instrument Technology Co., Ltd, Wuhan, China). The thermal conductivities of the samples were measured by a transient hot-wire method at room temperature (TC3000E thermal conductivity meter, Xiatech Electronics Co., Ltd., Xi’an, China).

Atomic force micrographs were acquired in non-contact mode with a ppp-NCHR 5M probe (Nanosensors) attached to a XE-100 microscope (Park Systems). The Raman spectra were acquired using a Renishaw In-Via system with a 532 nm excitation laser. The XRD profiles were obtained using a Dmax2500/PC (Rigaku) spectrometer operated at 40 kV, 200 mA, and 8 kW using a Cu target (1.5406 Å) at a scan rate of 2° min⁻¹. The XPS profiles were acquired using a PHI 5000 VersaProbe (Ulvac-PHI) system at a base pressure of 6.7 × 10⁻⁸ Pa using a monochromated Al Ka (1486.6 eV) anode (25 W, 15 kV) with a spot size of 100 μm × 100 μm. The transmittance data were recorded on a Cary 5000 (Varian) spectrometer from 175 nm to 3300 nm at a scan rate of 600 nm·min⁻¹ at a resolution of 1.0 nm. The optical spectrum, its characteristics, and those of the pulse waveform, were respectively measured using an autocorrelator (25 fs resolution, HAC-200, Alnair Labs), an optical spectrum analyzer (0.02 nm resolution, C-band scan range, SW7370C, Yokogawa), and an oscilloscope (DSO 5054A, Agilent Technology).

Transmission electron microscope (JEOL, JEM-2100F, Tokyo, Japan) equipped with an energy dispersive X-ray (EDS) were employed to analyze the nanostructure, morphology, and composition of the as-prepared nanoparticles. Powder X-ray diffraction (XRD) (Bruker, MA, USA) was conducted using a Rigaku D/MAX-2200PC X-ray diffractometer with Cu-Kα radiation (λ = 0.154 nm) at a scan rate of 6°/min. The chemical states of the as-prepared nanoparticles were investigated by X-ray photoelectron spectroscopy (XPS, ULVAC PHI, PHI 5000 VersaProbe, Osaka, Japan). The dissolution amount of nanoparticles was measured via inductively coupled plasma (ICP) (LEEMAN, Direct Reading Echelle ICP, OH, USA) spectrometer.

The crystal structure of the nanofibrous hydrogels was examined by X-ray analysis. X-ray diffractograms were obtained by two theta (2θ) scanning with the PHI 5000 VersaProbe (Ulvac-PHI, Japan) using monochromatized AlKα X-ray with a spatial resolution of 10 μm and 0.48 eV resolution conditions.