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Ta tga5500

Manufactured by TA Instruments
Sourced in United States

The TA TGA5500 is a thermogravimetric analyzer (TGA) designed for high-performance thermal analysis. It measures the weight changes of a sample as a function of temperature or time in a controlled atmosphere. The TGA5500 provides accurate and reliable data on thermal stability, composition, and decomposition of materials.

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3 protocols using ta tga5500

1

Comprehensive Materials Characterization Protocol

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IR spectra were obtained with a Thermo Scientific Nicolet iS50R. The transmission spectra of different samples were measured with the transmission mode. And the conversions during material curing were measured with the ATR mode. Nuclear magnetic resonance (NMR) was obtained using a Bruker DRX 500 MHz. Scanning Electron Microscope (SEM) images were taken using FEI Inspect Scanning Electron Microscope. The surface profile was measured by Zygo Newview 8300 white light interference microscope. The thermogravimetric analysis (TGA) was carried out with TA TGA 5500 (10 °C/min, 35 °C to 800 °C) and the differential scanning calorimetry (DSC) was carried using TA DSC 2500 (20 °C/min, –60 °C to 200 °C).
The authors affirm that human research participants [or their parents/guardians] provided informed consent for publication of the images in Fig. 4.
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2

Comprehensive Characterization of Adsorbents

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The true content of Fe on the adsorbents was measured using inductively coupled plasma spectrometry (ICP-MS: Agilent 7800, USA). To analyze the crystal phases of all adsorbents, a Smartlab 9 kW advance powder X-ray Cu Kα radiation diffractometer (Japan) was used to record the X-ray diffraction (XRD) patterns of the samples, with the voltage at 40 kV, current at 40 mA, and the range of scan angle (2θ) set as 5–90°. The morphology and microstructure of the adsorbents were studied using field emission scanning electron microscopy (SEM) on a ZEISS Sigma 300 (Germany). The Fourier transform infrared spectra of all adsorbents were recorded by a Thermo Scientific Nicolet iS50 FT-IR spectrometer (USA) in the range of 4000–450 cm−1. The X-ray photoelectron spectroscopy (XPS) measurements of all adsorbents were carried out on a Thermo Scientific K-Alpha spectrometer (UK) equipped with a monochromatic Al K radiation source (1486.6 eV), and the values of binding energies were calibrated using the criterion reference of the C 1s signal at 284.8 eV. The thermogravimetric (TG) analysis of all adsorbents was carried out under a nitrogen atmosphere at a heating rate of 10 °C min−1 using a TA TGA5500 (USA).
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3

Thermal Stability of PLA Films

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The thermal stability was performed on a thermogravimetric analysis instrument (TA TGA5500, USA). Thermal analysis was conducted to investigate the influence of the addition of active compound on the thermal stability of the PLA film. Approximately 5 mg of film samples were heated from 30 to 600°C at a heating rate of 10°C/min under a nitrogen atmosphere.
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