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Icpoes 730 spectrometer

Manufactured by Agilent Technologies

The ICPOES 730 spectrometer is a laboratory instrument designed for the analysis of elemental composition. It utilizes inductively coupled plasma optical emission spectroscopy (ICPOES) technology to detect and quantify the presence of various elements in samples. The core function of the ICPOES 730 is to provide accurate and reliable elemental analysis across a wide range of applications.

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2 protocols using icpoes 730 spectrometer

1

Multimodal Characterization of Catalysts

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Phase and crystal analysis of the samples was carried out via X-ray powder diffraction (XRD) studies, which were performed using a Philips X'pert pro MPD Super diffractometer equipped with Cu Kα radiation (λ = 1.5418 Å). The morphologies of the catalysts were analyzed using a Hitachi S-4800 field emission scanning electron microscope (SEM). The microstructures of the catalysts were characterized using high-resolution transmission electron microscopy (HRTEM, JEM-2100UHR) with an acceleration voltage of 200 kV. Energy dispersive spectroscopy (EDX) for mapping and cross-section compositional line profile analysis was carried out using FEI Tecnai G2 F20 S-Twin HRTEM apparatus at 200 kV. X-ray photoelectron spectroscopy (XPS) data were obtained using a Thermo Fisher ESCALAB 250 analyzer (Thermo Fisher Scientific, USA) with aluminum Kα radiation. Chemical component analysis was carried out via inductively coupled plasma-atomic emission spectrometry (ICP-OES) using an Agilent ICPOES 730 spectrometer. The Brunauer–Emmett–Teller (BET) surface areas of samples were measured with Micromeritics ASAP 2020 nitrogen adsorption apparatus via N2 physisorption at 77 K.
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2

Characterization of Mb-Cu Nanoconjugates

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FTIR spectroscopy was carried out on a Spectrum Two Spectrometer operating at a resolution of 4 cm−1 over 4000–450 cm−1; the sample for FTIR spectroscopy was lyophilized and ground with KBr to prepare KBr pellets.
TEM was performed on a JEOL JEM-2100F transmission electron microscope. The suspension was spotted on formvar-coated Ni or Cu grids, and the samples on Ni or Cu grids were then dried under vacuum.
XPS was performed using K-Alpha X-ray photoelectron spectroscopy (Thermo Fisher Scientific, USA). Binding energies were referenced to the C 1s line at 284.8 eV from adventitious carbon. The samples for XPS were re-dissolved with deionized water three times to get rid of the unattached Mb–Cu molecules.
ICP-AES was performed on an Agilent ICP-OES 730 Spectrometer operating with a plasma gas flow of 15 L/min, an auxiliary gas flow of 1.5 L/min, and an atomizing gas pressure of 200 kPa. The sample for ICP-AES was dissolved in double-distilled water and lyophilized.
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