Multipak v8.1c software

XPS characterization of the polymer surface was performed to determine changes in the chemical composition after APPJ treatment using an XPS (TFA XPS Physical Electronics, Münich, Germany). The samples were excited with monochromatic Al Kα_1,2 radiation at 1486.6 eV over an area with a diameter of 400 µm. Photoelectrons were detected with a hemispherical analyser positioned at an angle of 45° with respect to the normal of the sample surface. To determine the variation of the oxygen concentration over the sample surface, carbon C1s and oxygen O1s spectra were measured in the middle of the treated sample, as well as at various positions over the sample surface (an array of measured points with a distance of 5 mm). In such a way a similar 2D mapping was performed as for wettability measurements. The spectra were measured at a pass-energy of 23.5 eV using an energy step of 0.1 eV. An additional electron gun was used for surface neutralization during the XPS measurements. The measured spectra were analyzed using MultiPak v8.1c software (Ulvac-Phi Inc., Kanagawa, Japan, 2006) from Physical Electronics, which was supplied with the spectrometer. Because of time-consuming experiments, the XPS spectra were acquired only on the limited number of the samples.

The surface composition of uncoated and coated polymer foils was compared through using a TFA XPS instrument (Physical Electronics Inc., Chanhassen, MN, USA). The ultimate pressure in the XPS vacuum chamber was ~6 × 10⁻⁸ Pa. The samples were irradiated with X-rays from monochromatic Al Kα1,2 radiation at 1486.6 eV. The diameter of the analysis area was 400 µm.
The photoelectrons were detected with a hemispherical analyzer located at a take-off angle of 45° with respect to the normal sample surface. Survey-scan spectra were acquired at a pass energy of 187.85 eV, while, for C 1s, individual high-resolution spectra were taken at a pass energy of 29.35 eV with a 0.125-eV energy step. An additional electron gun was used for charge neutralization. All spectra were referenced to the main C 1s peak of the carbon atoms, which was assigned a value of 284.8 eV. The spectra were analyzed using MultiPak v8.1c software (Ulvac-Phi Inc., Kanagawa, Japan, 2006) from Physical Electronics, which was supplied with the spectrometer.

Samples were analyzed by a high-resolution XPS instrument «TFA XPS Physical Electronics» (Physical Electronics Inc., Chanhassen, MN, USA). The base pressure in the XPS analysis chamber was about 6 × 10⁻⁸ Pa. The samples were excited with monochromatic Al K_α1,2 radiation at 1486.6 eV over an area of 400 µm². Photoelectrons were detected with a hemispherical analyzer positioned at an angle of 45° with respect to the normal of the sample surface. XPS survey spectra were measured at a pass energy of 187 eV using an energy step of 0.4 eV, while high-resolution C1s spectra were measured at a pass energy of 23.5 eV using an energy step of 0.1 eV. An additional electron gun was used for surface neutralization during XPS measurements. The measured spectra were evaluated using MultiPak v8.1c software (Ulvac-Phi Inc., Kanagawa, Japan, 2006), which was supplied with the spectrometer.