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7 protocols using regulus 8200

1

Comprehensive Characterization of Material Microstructure

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The microstructure
of all samples was measured by TEM (Hitachi, H-9500, 300 kV). SEM
(Hitachi, Regulus 8200, 200 keV) was used to obtain the surface topography
of samples. The information of functional groups of samples was measured
by FTIR (BRUKER, TENSOR II) at a resolution of 4 cm–1 and a scanning range from 500 to 4000 cm–1. The
crystal information of samples was measured by XRD (Shimadzu, 6100)
at 3°/min and a 2θ range from 15° to 60°. Raman
analysis (Renishaw inVia, 532 nm wavelength) was used to obtain the
carbon structures of samples. N2 adsorption/desorption
analysis was measured using the N2 absorption apparatus
(ASAP2020) under 77 K, and the parameters of the pore structure were
calculated by corresponding formulas in the previous literature.37 (link),38 (link)
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2

V-CNT Characterization Techniques

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The surface morphology
of the V-CNT was examined by field emission scanning electron microscopy
(Regulus 8200, Hitachi). The crystal structure was characterized by
an X’Pert Pro MPD X-ray diffractometer (Panalytical, Holland).
Optical absorption rate (A %) was recorded by a UV–vis–NIR
spectrometer equipped with an integrating sphere (Lambda 750s, PerkinElmer).
A contact angle detector (DSA 30, Krüss) was used to characterize
the surface-wetting property of the sample. The ion concentration
of water was tracked by inductively coupled plasma atomic emission
spectrometry (ICP-OES, ThermoFisher Scientific iCAP 7400).
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3

Characterization of Porous Materials

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SEM (Hitachi,
Regulus 8200, 200 keV) and TEM (Hitachi, H-9500, 300 kV) used to obtain
the surface morphology and microstructure of the samples. The pore
structure of the samples was characterized by a nitrogen adsorption
analyzer (Micromeritics instrument, ASAP2020) at −196 °C
in liquid nitrogen. The adsorption/desorption isotherms, pore size
distribution curves, and specific pore parameters (including specific
surface area, total/micropore/medium and large pore volume, average
pore size, etc.) were obtained.34 (link),35 (link) The microcrystalline
structure and phase composition of the sample were characterized by
Raman spectroscopy (Renishaw inVia, 532 nm wavelength) and XRD (Shimadzu,
6100). A thermogravimetric analyzer (Beijing Hengjiu, HCT-4) was used
to monitor the weight loss of the samples from room temperature to
1000 °C at 5 °C/min under a N2 atmosphere of
400 mL/min. The conversion and normalized reaction rates of samples
were calculated by Xt = Wt/W0 and Kt =
(dXt/dt)/(1 – Xt) to evaluate the reactivity of different samples. Where, Xt was the carbon conversion
rate, W0 was the initial mass of the sample, Wt was the sample mass at time t, Kt was the
normalized reaction rate (min–1), dXt/dt was
the reaction rate, and Xt was the carbon conversion rate of the sample measured at time t.
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4

Fracture Morphology Analysis of PVA Films

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The fracture morphology analysis of the PVA-based films was observed by a cold field emission scanning electron microscope (Hitachi Regulus 8200, Japan).
The section in the direction of film thickness was placed up and attached to the conductive tape on the sample stand. The gold plating on the section of the film sample was conducted under the condition of 20 mA of gold spraying current and less than 7 Pa of vacuum degree for 80~100 seconds. The working voltage of the scanning electron microscope was 5kv.
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5

Preparation and Scanning Electron Microscopy

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Each sample tissue was cut into small pieces (approximately 0.4 cm × 0.2 cm × 0.1 cm), and fixed with 4% glutaraldehyde for 24 h. Thereafter, the samples were washed for 3 h with phosphate buffer solution (pH 7.2), 10 min each time. Then, samples were dehydrated with 30%, 50%, 60%, 70%, 80%, 90%, 95%, and 100% alcoholic solution, 15 min per gradient. After that, a critical point dryer (Leica CPD 030, USA) with CO2 was used for sample drying. Before testing, stick the dried samples to the sample stage and make group records. The samples were sprayed with an ion sputtering instrument (HITACHI MC1000, Japan) and observed with a cold field-emission scanning electron microscope (HITACHI Regulus 8200, Japan).
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6

Fluorescence and Barrier Properties of Carbon Quantum Dot Films

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A ZF-1 three-use ultraviolet analyzer (Hangzhou Qiwei Instrument Co., Ltd., Hangzhou, China) was used in this study to see if the produced CQDs and the corresponding films had fluorescence effects. Photoluminescence performance of the CQDs and films was investigated with a fluorescence spectrometer (Model LS-55, PerkinElmer, Waltham, MA, USA). The ultraviolet-visible spectroscopy (UV-vis) absorption spectra were recorded on a Lambda 950 spectropolarimeter (PerkinElmer). FT-IR spectra of the film samples were acquired with a Fourier transform spectrometer (NICOLET IS10, Thermo Scientific, Inc., Waltham, MA, USA) operating in the Smart iTR diamond ATR mode and the range from 500 cm−1 to 4000 cm−1. Barrier properties of the films to light (200–2500 nm) was tested by a U-4001 spectrophotometer (Hewlett-Packard Co., Santa Clara, CA, USA). A cold field emission scanning electron microscope (Regulus 8200, Hitachi, Tokyo, Japan) was used to analysis the fracture morphology of the films. The water resistance of films was expressed by the water absorption. The samples with a size of 2 cm × 2 cm were first dried at 100 °C for 24 h, then weighed (W1) and soaked in distilled water (50 mL) for 24 h. After drying its surface, the sample was weighted again (W2), and the water absorption (A) of the sample was calculated by Equation (2): A=W2W1W1×100%
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7

Comprehensive Characterization of MAFs

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Scanning electron microscope characterizations are performed using a Regulus8200 cold-field emission scanning electron microscope (Hitachi, Japan). Samples are prepared by drop-casting on the conductive tape, dried, and then plasma sputtering–coated with gold. Transmission electron microscope, HAADF-STEM, and elemental mapping characterizations are performed using a Tecnai G2 F20 U-TWIN field-emission transmission electron microscope (FEI, USA) equipped with EDAX Genesis 2000 XMS accessory. Samples are prepared by drop-casting on the carbon-coated copper grid. UV-visible optical spectra are recorded using a UV-2450 spectrophotometer (Shimadzu, Japan). Excitation and emission spectra are recorded using an RF-5301PC fluorescence spectrophotometer (Shimadzu, Japan). Hydrodynamic diameter and zeta-potential distribution profiles are measured by a Zetasizer Nano ZS instrument (Malvern, UK). Fluorescent lifetime profiles and absolute QY of different MAFs are measured by an FLS980 transient steady-state fluorescence spectrometer (Edinburgh Instruments, UK). PXRD characterizations are performed using a D/MAX-TTRIII (CBO) instrument (Rigaku, Japan). XPS characterizations are performed using an ESCALAB 250Xi instrument (Thermo Fisher Scientific, USA). FTIR spectra are measured by a Spectrum One instrument (PerkinElmer, USA).
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