of all samples was measured by TEM (Hitachi, H-9500, 300 kV). SEM
(Hitachi, Regulus 8200, 200 keV) was used to obtain the surface topography
of samples. The information of functional groups of samples was measured
by FTIR (BRUKER, TENSOR II) at a resolution of 4 cm–1 and a scanning range from 500 to 4000 cm–1. The
crystal information of samples was measured by XRD (Shimadzu, 6100)
at 3°/min and a 2θ range from 15° to 60°. Raman
analysis (Renishaw inVia, 532 nm wavelength) was used to obtain the
carbon structures of samples. N2 adsorption/desorption
analysis was measured using the N2 absorption apparatus
(ASAP2020) under 77 K, and the parameters of the pore structure were
calculated by corresponding formulas in the previous literature.37 (link),38 (link)