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Carbon tabs 9 mm

Manufactured by Agar Scientific
Sourced in United Kingdom

Carbon Tabs 9 mm are circular discs made of compressed carbon. They serve as a support material for specimens in electron microscopy applications.

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3 protocols using carbon tabs 9 mm

1

Bread Surface Structural Analysis

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Bread samples were freeze-dried, mounted on stubs (G 306; 10 mm × 10 mm Diameter; Agar Scientific, Stansted, UK) and fixed using carbon tape (G3357N; Carbon Tabs 9 mm; Agar Scientific, Stansted UK). Mounted bread samples were sputter-coated with a gold-palladium alloy (ratio of 80: 20), using a Polaron E5150 sputter coating unit, and imaging was captured with a JEOL Scanning Electron Microscope (JSM-5510, Jeol Ltd., Tokyo, Japan). Settings for analysis were as follows: 5 kV 185 voltage, 20 mm working distance and a magnification factor of 1000.
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2

Structural Characterization of Plant Proteins

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Scanning electron microscopy (SEM) was used to image the ultrastructure of PPI, SPI and EverPro, according to the method reported by Atzler et al. [31 (link)]. Ingredients were mounted on stubs (G 306; 10 mm × 10 mm Diameter; Agar Scientific, Essex, UK) and fixated using carbon tape (G3357N; Carbon Tabs 9 mm; Agar Scientific, Essex, UK). The samples were then sputter coated with a gold–palladium alloy (ratio of 80/20), using a Polaron E5150 sputter coating unit, and imaging was executed with a JEOL scanning electron microscope (JSM-5510, Jeol Ltd., Tokyo, Japan). The following settings were applied for the analysis: 5 kV voltage, 20 mm working distance and a magnification factor of 50 and 1000.
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3

Analyzing Crumb Structure via SEM

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Images of the crumb structure were taken using Scanning Electron Microscopy (SEM). Therefore, freeze-dried crumb was mounted on stubs (G 306; 10 mm × 10 mm Diameter; Agar Scientific, UK) and fixated using carbon tape (G3357N; Carbon Tabs 9 mm; Agar Scientific, UK). Mounted samples were sputter coated with a gold-palladium alloy (ratio of 80/20), using a Polaron E5150 sputter coating unit, and imaging was executed with a JEOL Scanning Electron Microscope (JSM-5510, Jeol Ltd., Tokyo, Japan). The following settings were applied: 5 kV voltage, 20 mm working distance and a magnification factor of 1000.
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