The ultraviolet-visible (UV-vis) light absorption spectra of the films were measured using a UV-vis spectrophotometer (Agilent 8453, Agilent technologies, Santa Clara, CA, USA) to evaluate the absorption property of the films. The X-ray diffraction (XRD) patterns of the samples were obtained using a XRD Rigaku DMAX 2200 system (Rigaku, Tokyo, Japan) with Cu Kα (λ = 0.15406 nm) as the X-ray source. The specific Brunauer–Emmett–Teller (BET) surface areas of the samples were investigated using an ASAP 2020 (Micromeritics, Atlanta, GA, USA) apparatus. An infrared spectrometric analyzer (Vertex 70, Bruker, Ettlingen, Germany) was used to record the Fourier transform infrared (FTIR) spectra. The top and cross-sectional morphologies of the samples were examined by field emission scanning electron microscopy (FESEM, Hitachi S-4700, Tokyo, Japan) operated at 10 kV. The steady-state photoluminescence (PL) spectra were determined using a QuantaMaster TM 50 PTI (Birmingham, New Jersey, NJ, USA). A sun simulator (Polaromix K201, Solar simulator LAB 50, McScience K3000, McScience, Gyeonggi-do, Korea) with an irradiance of 100 mW cm−2 (AM 1.5G) was used to simulate solar irradiation. The external quantum efficiency (EQE) was measured using McScience K3100 measurement system (McScience, Gyeonggi-do, Korea).
Xrd dmax 2200 system
Manufactured by Rigaku
Sourced in Japan
The Rigaku DMAX 2200 is an X-ray Diffraction (XRD) system designed for materials analysis. The system uses X-rays to determine the crystal structure and chemical composition of solid materials. It provides detailed information about the atomic and molecular structure of a wide range of materials, including metals, ceramics, polymers, and pharmaceuticals.
Automatically generated - may contain errors
2 protocols using xrd dmax 2200 system
1
Characterization of Thin Film Materials
2
Characterization of Photovoltaic Thin Films
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The UV–vis
absorption spectra were measured using an Agilent 8453 UV–vis
spectrophotometer (Agilent 8453, Agilent Technologies, Santa Clara,
CA). The XRD patterns of the films were obtained using an XRD Rigaku
DMAX 2200 system (Rigaku, Tokyo, Japan) with Cu Kα (λ
= 0.15406 nm) as the X-ray source. An infrared spectrometric analyzer
(Vertex 70, Bruker, Ettlingen, Germany) was used to record the FTIR
spectra. The cross-sectional morphology and the surface of the films
were characterized using a field emission scanning electron microscope
(Hitachi S-4700, Tokyo, Japan) operated at 10 kV. The steady-state
PL spectra of the films were determined using a QuantaMaster TM 50
PTI (Birmingham, New Jersey). The J–V curves of PSCs were measured under 1 sun illumination
(AM1.5G, 100 mW·cm–2), using a solar simulator
(Polaromix K201, Solar simulator LAB 50, McScience K3000, McScience,
Gyeonggi-do, Korea). The size of PSCs was calculated with an area
of 0.053 cm2 using a metal mask. The EQE was measured on
a computer test controlling system (McScience, Gyeonggi-do, Korea)
containing a xenon lamp power source.
absorption spectra were measured using an Agilent 8453 UV–vis
spectrophotometer (Agilent 8453, Agilent Technologies, Santa Clara,
CA). The XRD patterns of the films were obtained using an XRD Rigaku
DMAX 2200 system (Rigaku, Tokyo, Japan) with Cu Kα (λ
= 0.15406 nm) as the X-ray source. An infrared spectrometric analyzer
(Vertex 70, Bruker, Ettlingen, Germany) was used to record the FTIR
spectra. The cross-sectional morphology and the surface of the films
were characterized using a field emission scanning electron microscope
(Hitachi S-4700, Tokyo, Japan) operated at 10 kV. The steady-state
PL spectra of the films were determined using a QuantaMaster TM 50
PTI (Birmingham, New Jersey). The J–V curves of PSCs were measured under 1 sun illumination
(AM1.5G, 100 mW·cm–2), using a solar simulator
(Polaromix K201, Solar simulator LAB 50, McScience K3000, McScience,
Gyeonggi-do, Korea). The size of PSCs was calculated with an area
of 0.053 cm2 using a metal mask. The EQE was measured on
a computer test controlling system (McScience, Gyeonggi-do, Korea)
containing a xenon lamp power source.
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