Su8010

The morphological and chemical properties of the outer surfaces of the two Col/Hap composite granule samples (AI 20 min 5Cy Col/Hap and AI 60 min 5Cy Col/Hap) were examined using SEM (SU8010; Hitachi High-Tech Co., Tokyo, Japan) and EDS (JSM-7100F; Joel Co., Tokyo, Japan) (n = 1) at an accelerating voltage of 10 kV.
The outer and cross-sectional surfaces of three types of dried gelatin-infiltrated granules (Col control + AG, AI 20 min 5Cy Col/Hap + AG and AI 60 min 5Cy Col/Hap + AG) were examined (n = 1 for both) using SEM (SU8010; Hitachi High-Tech Corp., Tokyo, Japan) at an accelerating voltage of 15 kV after plasma coating with OsO₄.

The size and shape of the Ag nanostructures were observed using scanning electron microscopy (SEM, SU-8010, Hitachi, Tokyo, Japan), and the composition of the structures was determined through energy-dispersive X-ray spectroscopy (EDS, SU-8010, Hitachi, Tokyo, Japan). Surface morphology of the dendritic forest-like Ag nanostructures was intensively investigated by an atomic force microscope (AFM, Digital Instruments Dimension 3100, Veeco Instruments Inc., Santa Barbara, CA, USA) in tapping mode where scanned areas were set to (1 × 1) micrometer. Debris were carefully avoided in order to obtain high resolution clear images for further roughness analysis. The roughness of the prepared dendritic forest-like Ag nanostructures was evaluated using a surface profiler (XP-2, Ambios Technologies, Santa Cruz, CA, USA). With constant pressure and moving rate, the diamond tip of surface profilomer was scanning cross the surface of specimen to obtain the surface roughness. X-ray diffraction (XRD) was achieved using a diffractometer (D8 Discover, Bruker, Billerica, MA, USA) with Cu Kα radiation (λ = 0.15418 nm). High-resolution inductively coupled plasma (ICP) mass spectrometry (Element 2, Thermo Fisher Scientific, Waltham, MA, USA) was used to measure the weight of Ag nanostructures deposited on a Si wafer.

The morphological and microstructural properties of the compounds and TIMs were characterized using an optical microscope (Nikon, Tokyo, Japan, SMZ745T) and a high-resolution field-emission scanning electron microscope (FE-SEM) (Hitachi, Tokyo, Japan, SU8010). Optical image processing was conducted using the ImageJ software (v1.53e) to analyze the alignment of the metal particles. The size of the EGaIn and Cu particles in toluene was measured using a laser diffraction particle size analyzer (Beckman Coulter, Brea, CA, USA, LS 13 320). The selected samples were frozen using liquid nitrogen and shattered to pieces to observe the cross-section of the EGaIn-Cu/PDMS TIMs via SEM. The elemental composition of the EGaIn-Cu/PDMS TIMs was analyzed using energy-dispersive spectroscopy (EDS) (Hitachi, SU8010). The thermal conductivity of the TIMs was analyzed at 25 °C under atmospheric pressure in a nitrogen environment, using laser flash analysis (LFA) (Netzsch, Selb, Germany, LFA 467). The mechanical properties of the TIMs were measured using a universal testing machine (Instron, Norwood, MA, USA, E3000LT).

The material properties of the synthesized Au@Ag-DNFs/Si were characterized using cold-field emission scanning electron microscopy (SEM, SU-8010, Hitachi, Tokyo, Japan), energy-dispersive X-ray spectroscopy (EDX, SU-8010, Hitachi, Tokyo, Japan), and X-ray diffraction (XRD, D8 Discover, Bruker, Billerica, MA, USA). An ultraviolet (UV)-visible reflection spectrophotometer (UV-3101PC, Shimadzu, Kyoto, Japan) with a spherical light integrator was used to measure the reflection spectra of the samples. High-performance Brunauer–Emmett–Teller (BET) surface area and pore size analyzer (Micro 100C, 3P Instruments GmbH & Co. KG, Odelzhausen, Germany) [43 (link)] was also utilized to measure the multilayer adsorption on the external surface area of various Ag-DNFs/Si samples.

The surface morphology of NASS and NASS-N samples were examined using a field emission scanning electron microscopy (FESEM, Hitachi SU8010, Tokyo, Japan). A small amount of powder was scratched from stainless-based samples. The powder was further mixed with ethanol followed by 15 mins’ ultrasonic dispersion, forming a homogeneous solution for further transmission electron microscope (TEM, JEOL JEM-2100F, Tokyo, Japan) observation. The crystal structures were tested by an X-ray diffraction (XRD, Rigaku SmartLab 9, Tokyo, Japan) in the 2θ range of 10–70 degree with CuKα (λ = 1.54 Å) radiation. The chemical analysis was evaluated under an X-ray photoelectron spectroscopy (XPS, Thermo VG Escalab 250Xi, New York, NY, USA). The elemental compositions and species were studied through an energy dispersive spectrometry (EDS, Hitachi SU8010, Tokyo, Japan) equipped in the same SEM.

An optical contact angle (CA) meter (JGW‐360A, China) was used to measure the CA of the surface. A scanning electron microscope (SEM, Hitachi SU8010, Japan) and an energy dispersive spectrometer (EDS, Hitachi SU8010, Japan) were used to study the micro structures of the etched surface and the chemical composition of the prepared samples, respectively. The thickness of the functional thin film of these samples was measured by the coating thickness gauge (Fisher MPO, Bad Salzuflen, Germany). The solar and IR reflectivity R(λ) were measured using the UV–Vis–NIR Spectrometer (SHIMADZU, Kyoto, Japan) and Fourier transform infrared spectrometer (FT‐IR, Frontier, PerkinElmer LLC), respectively. The thermal images were taken by an infrared thermal imaging camera (FLIR A615).

The morphology of GLP, GLP-HV, GLP-H, and GLP-V were analyzed by SEM (SU 8010, Hitachi, Japan) [38 (link)]. These samples were dipped in a small amount of powder with conductive tape and pasted on the sample table. After spraying gold for 30–60 s, the samples were vacuumized and tested on the machine. The images were taken by SU 8010 Hitachi scanning electron microscope and the magnifications were 1000-fold and 200-flod, respectively.