Smartlab 3 kw x

X-ray diffraction patterns (XRD) were obtained using a Rigaku Smartlab 3 KW X-ray diffractometer with Cu Kα radiation in the 2θ range from 10° to 80° at a scan rate of 10°/min. Scanning electron microscopy (SEM) images were captured using a ZEISS Sigma 300. X-ray photoelectron spectroscopy (XPS) analysis was performed on the Thermo Scientific K−Alpha (USA). A Bruker EMXplus−6/1 was used to record the electron paramagnetic resonance (EPR) spectra. Transmission electron microscopy (TEM) images were acquired from JEOL JEM 2100 (operational voltage of 200 kV). Absorbance was determined by a UV−8000 ultraviolet−visible (UV−vis) spectrophotometer. The pH value of the buffer solution was measured using a PHS−3D pH meter.

The P-E loops of PMN-PT were measured using a Radiant Technologies Precision Premier II system. The strain properties were measured using a strain gauge glued on the PMN-PT^{58 (link)}. XRD with in situ electric fields was characterized by a Rigaku SmartLab 3 kW X-ray diffractometer with a Cu Kα radiation. The morphology was characterized by atomic force microscopy using a commercial scanning probe microscope system (Multimode 8 SPM, Bruker).