Thermal unfolding curves were obtained by monitoring the decrease in ellipticity in a 25–80 °C temperature range (dependent on the peptide) at a wavelength where the CD spectra show a positive maximum (224 nm) at a heating rate of 10 °C/h. The derivative of the plotted unfolding curve was calculated using the JASCO Spectra Manager II software (JASCO Inc.). The minimum of the derivative indicates the steepest slope of the unfolding process and determines the helix-to-coil transition temperature (Tm) under the described conditions. All experiments were performed in duplicate or triplicate.
Spectra manager 2 software
Spectra Manager II software is a data analysis tool for laboratory equipment. It provides functions for data acquisition, processing, and management. The software is designed to work with a variety of laboratory instruments and supports multiple file formats.
Lab products found in correlation
23 protocols using spectra manager 2 software
Circular Dichroism Thermal Unfolding Protocol
Circular Dichroism Analysis of Peptides
Circular Dichroism Analysis of SGT1 Proteins
Circular Dichroism Spectroscopy of Proteins
Circular Dichroism Spectroscopy of Protein
Characterization of Magnetite Nanocomposites
The evaluation of the phase composition of the samples was performed using X-ray diffraction analyses, with a Rigaku SmartLab (Rigaku Corp., Tokyo, Japan), operated at 45 kV and 200 mA, with CuKα radiation (1.54059 Å), working in parallel beam configuration (2θ/θ scan mode), with the diffractograms being recorded in the range of 5–90° (2θ). The individual components were identified using the Rigaku Data Analysis Software PDXL 2 database provided by ICDD.
To investigate the morphology and dimensions of the nanostructured thin layers (obtained composites), the samples were sectioned using a diamond disc placed on a support and were introduced into an FEI Electron Microscope (SEM) (Hillsboro, OR, USA). The obtained images were recorded using secondary electron beams at an energy of 30 kV.
FTIR Spectroscopy for Material Analysis
Photophysical Characterization of Emitters
Fourier Transform Infrared Spectroscopy
Fabrication and Optical Characterization of C-dot Films
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