All AFM scans were conducted using an Innova scanning probe microscope (Veeco, U.S.A.). Scans were performed in tapping mode at ambient temperature and pressure, using silicon cantilevers (MPP-31120-10, Veeco, U.S.A.) with a spring constant of 0.9 N m-1 and a resonance frequency of approximately 20 kHz. Scanning was performed perpendicular to the axis of the cantilever at a scan speed of 1 Hz. Initially, 10 μm × 10 μm fields of view were scanned in order to identify suitable analysis regions of the surface, prior to analysis at higher resolution. Scan areas were selected to closely match with the resolution of electron micrographs, as the distance between individual sampling points can affect the calculated roughness parameters (Brune et al., 1997 ; Crawford et al., 2012 (link)).
Innova scanning probe microscope
Manufactured by Veeco
Sourced in United States, Germany
The Innova scanning probe microscope is a versatile lab equipment designed for high-resolution imaging and characterization of surfaces at the nanoscale. It utilizes a probe to scan the sample surface, providing detailed topographical information.
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Lab products found in correlation
5 protocols using innova scanning probe microscope
1
Atomic Force Microscopy of Surface Topography
2
DNA-compound 4 complex analysis by AFM
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In a similar manner as described in [16 (link)], the samples were prepared by diluting a DNA stock solution (6 mM) in sodium cacodylate buffer (I = 0.05 M, pH 5.0) with water and for compound 4 (4 mM stock solution) at various molar ratios of compound 4 to DNA. For each measurement, 10 μL of the mixed solution were deposited onto a freshly cleaned mica surface (Plano GmbH). The sample was dried by means of a spin-coater (1 min at 20 rps and 2 min at 100 rps). For the AFM imaging operating in the tapping mode (scan rate 5 μm s−1) with N-type silicon cantilevers (AC-160TS, Olympus) a NanoDrive controller with an Innova scanning probe microscope (Veeco, Germany, Mannheim) was used. The analysis of the AFM images was carried out by use of the Gwyddion (version 2.19) software.
3
Investigating Nanoscale Morphology
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The overall morphology of 1 was investigated in tapping mode using a NanoDrive Controller with an Innova Scanning Probe Microscope (Veeco Germany, Mannheim) and a N‐type silicon cantilever (AC 160TS OLYMPUS). The AFM sample was prepared in water by drop casting onto a freshly cleaved mica surface (Plano GmbH) and drying properly before analysis.
4
Tapping Mode AFM Imaging on Mica
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Atomic force microscopy (AFM) images were performed in the tapping mode using a NanoDrive Controller with an Innova Scanning Probe Microscope (Veeco) and an N-type silicon cantilever (Olympus AC 16TS). The samples were prepared by drop-coating the solution (50 µM) on a freshly cleaned mica surface (Plano) and waiting for 12 h. The AFM data were analyzed using the Gwyddion-2.53 software.
5
Nanoscale Surface Topography Analysis
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AFM was used to study the topographical features of the surface at the nanoscale level using an Innova scanning probe microscope (Veeco, Bruker, Billerica, MA, USA) followed by a roughness analysis. The measurements were performed in tapping mode in air to minimise any damage to the tip from the interaction between tip and sample surface. The silicon cantilever used in the tapping mode (Cont20A, Veeco Probes) had a spring constant of 0.9 N m−1 and resonance frequency ranging between 18 kHz and 24 KHz. All samples were scanned over a 1 × 1 μm2 area to perform a roughness analysis of the surface. To study the surface topography, various surface roughness parameters—average roughness (Sa), root-mean-square roughness (Sq), maximum peak height (Smax), skewness (Ssk), and kurtosis (Sku)—were calculated using Gwyddion data processing software, and are presented in Table 1 [21 (link)]. The results obtained were expressed in terms of their mean values and the corresponding standard deviations following the commonly used protocol [22 (link),23 (link)].
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