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Fourier transform infrared spectrometer ft ir

Manufactured by Shimadzu
Sourced in Japan

The Fourier Transform Infrared Spectrometer (FT-IR) is a laboratory instrument used for the identification and analysis of chemical compounds. It operates by measuring the absorption of infrared radiation by a sample, and then using Fourier transform mathematical techniques to convert the raw data into a usable infrared spectrum.

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3 protocols using fourier transform infrared spectrometer ft ir

1

Enhanced Pyrophosphate Assay Protocol

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A pyrophosphate
assay kit with enhanced selectivity (AAT Bioquest); disodium hydrogen
phosphate (ACS reagent, ≥99.0%, Sigma); calcium chloride dihydrate
(AR, 99%, Bioss antibodies); sodium pyrophosphate (PPi) (AR, 99%,
Aladdin); hydrochloric acid (AR, 36.0–38.0%, Sinopharm Chemical
Reagent); sodium hydroxide (AR, 99%, Aladdin); ethylene glycol (AR,
98%, RHAWN); potassium bromide anhydrous (AR, 99%, Aladdin); newborn
calf serum (AusgeneX, Australia); and Alizarin red S solution (0.2%,
Solarbio) were used.
A pH meter (PXSJ-216F, Leici, China); SpectraMaxiD5
(Molecular Devices); collective heat magnetic stirrer (DF-101S, VRERA,
China); microporous filter (0.45 μM, Millipore); Fourier transform
infrared spectrometer (FTIR) (Shimadzu Corporation, Tokyo, Japan);
mini-pellet press (GS01150, UHUA TECHNOLOGY, China); Mikro-Spritzenpumpen
(LINZ-9B, Leien, China); transmission electron microscope (TEM, JEOLJEM-2100,
Japan) eqipped with selected area electron diffraction (SAED); and
turbidimeter (LH-Z10A, LOHAND, China) were used.
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2

Comprehensive Characterization of Nanomaterials

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The phase and size of the as-prepared samples were determined from powder X-ray diffraction (PXRD) using D8 X-ray diffractometer (Bruker) at a scanning rate of 12°m in -1 in the 2θ range from 10° to 70°, with Cu Kα radiation (λ = 0.15405 nm). Scanning electron microscopy (SEM) micrographs of the samples were recorded on FEI Nova Nano SEM 450. High Resolution Transmission Electron Microscopy (HRTEM) was recorded on Tecnai G2 20 S-TWIN Transmission Electron Microscope with a field emission gun operating at 200 kV. The samples for TEM measurements were prepared by evaporating a drop of the colloid onto a carbon coated copper grid. The infrared spectra were recorded on Shimadzu Fourier Transform Infrared Spectrometer (FT-IR) over the range of wave number 4000-400 cm -1 and the standard KBr pellet technique was employed. The magnetic moment as a function of applied field was recorded using Vibrating Sample Magnetometer (VSM), Lakeshore 7410. All the measurements were performed at room temperature.
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3

Comprehensive Characterization of Nanoparticle Samples

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The phase and size of the as prepared samples were determined from powder X-ray diffraction (PXRD) using D8 X-ray diffractometer (Bruker) at a scanning rate of 12° min -1 in the 2θ range from 10° to 80°, with Cu Kα radiation (λ = 0.15405 nm). Scanning electron microscopy (SEM) micrographs of the samples were recorded on FEI Nova Nano SEM 450. High Resolution Transmission Electron Microscopy (HRTEM) was recorded on Tecnai G2 20 S-TWIN Transmission Electron Microscope with a field emission gun operating at 200 kV. The samples for TEM measurements were prepared by evaporating a drop of the colloid onto a carbon coated copper grid. The infrared spectra were recorded on Shimadzu Fourier Transform Infrared Spectrometer (FT-IR) over the range of wave number 4000-400 cm -1 and the standard KBr pellet technique was employed. All the measurements were performed at room temperature.
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