Snl 10 probe
The SNL-10 probe is a laboratory equipment designed for nuclear magnetic resonance (NMR) spectroscopy. It functions as the sample holder and signal detection unit within an NMR spectrometer. The probe facilitates the interaction between the sample and the magnetic field, allowing for the analysis and characterization of the sample's chemical composition and molecular structure.
Lab products found in correlation
12 protocols using snl 10 probe
Chondrons Phenotype and Structure Visualization
Polymer Surface Topography Analysis
Characterizing Engineered Virus-Like Particles
Measuring Surface Roughness of Gels
Quantitative Nanomechanical Analysis of Phage-Infected Cells
Nanoscale images of random cells were captured by the AFM, while successful infection was confirmed in real time via Live/Dead staining. Fluorescent Live/Dead images of the samples on the substrates were captured by an epifluorescent microscope (Axio Zoom. V16, Zeiss, Germany) which is coupled with the AFM. Differently, infected cells were specifically chosen according to Live/Dead staining (appeared red) two hours since the addition of the T4 phages to determine the impact of T4 infection on the biomechanics of the cells.
Atomic Force Microscopy Characterization
H5 solutions were visualized using a MFP-3D-Bio AFM with a Nikon microscope (Asylum Research, Santa Barbara, CA). Measurements were made using contact mode in air with a SNL-10 probe (Bruker) on samples that were prepared on freshly cleaved mica. Samples were rinsed with deionized water and dried with argon prior to imaging. Data was analyzed using a combination of Gwyddion,87 WSXM,88 (link) and MATLAB89 software packages.
Atomic Force Microscopy of Proteoliposomes
Nanoscale Surface Topography Characterization
Nanoscale AFM Imaging of Surface Topography
dried at room temperature.
AFM images were acquired using a commercial AFM system (JPK NanoWizard
3 and 4). Measurements were performed in AC mode with SNL-10 probes
(Bruker) at 25 °C, 35–40% RH. AFM images were collected
with 1024 × 1024 pixels/frame. Each AFM tip was characterized
prior to usage. Analyses of AFM images were performed with JPK Data
Processing software. Note that for the height analyses of the AFM
images, the baseline height was leveled against the flat base plane
of the substrate. All AFM images were only subjected to the primary
first order flattening correction to remove sample tilt so that potential
artifacts induced by other image processing steps were avoided as
much as possible.
Nanomechanical Characterization of Films
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