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Snl 10 probe

Manufactured by Bruker
Sourced in Germany, United States

The SNL-10 probe is a laboratory equipment designed for nuclear magnetic resonance (NMR) spectroscopy. It functions as the sample holder and signal detection unit within an NMR spectrometer. The probe facilitates the interaction between the sample and the magnetic field, allowing for the analysis and characterization of the sample's chemical composition and molecular structure.

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12 protocols using snl 10 probe

1

Chondrons Phenotype and Structure Visualization

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Chondrons were imaged after fixation for cellular phenotype visualization, and after histological staining for chondrons’ structures visualization using AFM. AFM imaging was carried out using a NanoWizard IV AFM (JPK Instruments, Bruker, Billerica, MA, USA) with the CellHesion ™ module, which allows for a large z-range (100 µm) scanning. The AFM head was mounted on a Zeiss Axio Observer 3 Inverted Fluorescence Microscope (Carl Zeiss, Göttingen, Germany). All images were acquired in PBS. Images were acquired using a silicon nitride cantilever with a resonance frequency of 23kHZ and nominal spring constant of 0.12 N/m (SNL-10 probe, Bruker, Billerica, MA, USA). QI™ imaging mode was used to acquire AFM height images of 128 × 128 pixels with a z-length of 4.4 µm and a trigger set point of 3 nN. 3D topographical images were produced using NanoWizard data analysis software (JPK Instruments, Bruker, Billerica, MA, USA).
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2

Polymer Surface Topography Analysis

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The study and control samples of polymer samples (Hastalex, GORE-TEX) with area 0.5 × 0.5 cm2 were fixed with the specimen holders. The surface properties of the samples were estimated using the MultiMode 8 Atomic Force Microscope system (Bruker, Germany) in a tapping mode at ambient temperature and pressure. The SNL-10 probe (Bruker, Germany) was used in the study. Twenty images were obtained for each group of the samples. The data were processed with the Nanoscope Analysis 1.4 software (Bruker, Germany) to evaluate a 3D surface topography and height distribution profile.
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3

Characterizing Engineered Virus-Like Particles

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The VLP solution was diluted to a low concentration of 5 μg/mL, applied to a mica sample disc and left to dry. The dried sample was loaded onto a Multimode 8 instrument (Bruker, Billerica, MA, USA), and AFM tapping mode with an SNL-10 probe (Bruker) was used to record the shape of the prepared eVLPs. The results of the measurement were analyzed with NanoScope Analysis 1.5 software.
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4

Measuring Surface Roughness of Gels

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Surface roughness was determined by measuring the surface of the gel (n = 3) at 3 randomly selected positions (20×20 µm each measurement) before and after illumination (455 nm, 15 min) using an atomic force microscope (Bruker Bioscope Catalyst mounted on a Leica DMi6000B inverted optical microscope) in contact mode with a SNL‐10 probe (tip radius 2 nm, Bruker). Surface roughness (Rq) was calculated using the NanoScope Analysis software v150.
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5

Quantitative Nanomechanical Analysis of Phage-Infected Cells

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AFM images were acquired using JPKSPM (JPK Instruments AG, Berlin, Germany) with an SNL-10 probe (Bruker, Camarillo, CA) and a spring constant of 0.35 N/m in quantitative imaging (QI) mode at room temperature (25 °C). The AFM force vs. distance vs. time curves of entire cells were measured using a tipless cantilever (MIKROMASCH, Sofia, Bulgaria). The spring constant of the cantilever used here is 0.4 N/m. The deflection vs. displacement vs. time data were converted into force vs. relative distance vs. time graphs using the JPKSPM-data processing software.
Nanoscale images of random cells were captured by the AFM, while successful infection was confirmed in real time via Live/Dead staining. Fluorescent Live/Dead images of the samples on the substrates were captured by an epifluorescent microscope (Axio Zoom. V16, Zeiss, Germany) which is coupled with the AFM. Differently, infected cells were specifically chosen according to Live/Dead staining (appeared red) two hours since the addition of the T4 phages to determine the impact of T4 infection on the biomechanics of the cells.
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6

Atomic Force Microscopy Characterization

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For H4 and H6 solutions the method of Xu et al. was followed.73 (link) Briefly, silicon wafers were cleaned with a series of alcohols and subjected to sonication and incubation. The silicon wafers were then dried with nitrogen, placed on a glass slide with adhesive, and cooled before sample deposition. Excess sample was then removed using deionized water and dried for 20 min at room temperature. Three scans were taken for each measurement using an Agilent 5500 in tapping mode in air, with a Multi75a probe (Bruker MPP-21120-10).
H5 solutions were visualized using a MFP-3D-Bio AFM with a Nikon microscope (Asylum Research, Santa Barbara, CA). Measurements were made using contact mode in air with a SNL-10 probe (Bruker) on samples that were prepared on freshly cleaved mica. Samples were rinsed with deionized water and dried with argon prior to imaging. Data was analyzed using a combination of Gwyddion,87 WSXM,88 (link) and MATLAB89 software packages.
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7

Atomic Force Microscopy of Proteoliposomes

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The AFM topographs were collected on a Multimode 8 instrument equipped with a 15 μm scanner (E-scanner) coupled to a NanoScope V controller (Bruker). NanoScope software (v9.2, Bruker) was used for data collection and Gwyddion (v2.52, open-source software covered by GNU general public license, www.gwyddion.net) and OriginPro (v8.5.1, OriginLab Corp.) software packages were used for data processing and analysis. Proteoliposome samples were incubated on mica discs for 1 h at 4°C in adsorption buffer (20 mM MOPS pH 7.8, 20 mM NaCl and 5 mM MgCl2), then imaged in imaging buffer (20 mM MOPS pH 7.8 and 20 mM NaCl). AFM images were recorded in peak-force tapping mode at a peak-force frequency of 2 kHz, using SNL-10 probes (56 kHz, k∼0.24 Nm−1) (Bruker Nano). The peak-force amplitude was 10 nm and images were taken using either 256 × 256 or 512 × 512 pixel arrays. The peak-force set point varied between 50 and 1000 pN and the scan rate was between 0.5 and 1.0 Hz.
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8

Nanoscale Surface Topography Characterization

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Particles were scanned using Bruker SNL-10 probes with Silicon tip over Nitride lever. SNL-10 probes have four cantilevers A, B, C and D with resonance frequency 65, 23, 56 and 18 kHz, and spring constant 0.35, 0.12, 0.24 and 0.06 N/m. In this experiment we have chosen the cantilever A as it has produced better quality images in our test experiments. The scanning parameters were set to 2.03 Hz for scan rate, 1.54 μm for scan size, 1024 for sample lines, 357.79 mV for amplitude set point and 122.38 for drive amplitude. Five particles from each group were scanned. The scanned images were retrieved using NanoScope Analysis software and were processed to determine the roughness (Rq) values and 3-D topography representation.
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9

Nanoscale AFM Imaging of Surface Topography

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Samples were prepared on freshly cleaved mica and
dried at room temperature.
AFM images were acquired using a commercial AFM system (JPK NanoWizard
3 and 4). Measurements were performed in AC mode with SNL-10 probes
(Bruker) at 25 °C, 35–40% RH. AFM images were collected
with 1024 × 1024 pixels/frame. Each AFM tip was characterized
prior to usage. Analyses of AFM images were performed with JPK Data
Processing software. Note that for the height analyses of the AFM
images, the baseline height was leveled against the flat base plane
of the substrate. All AFM images were only subjected to the primary
first order flattening correction to remove sample tilt so that potential
artifacts induced by other image processing steps were avoided as
much as possible.
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10

Nanomechanical Characterization of Films

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experiments were performed on a JPK NanoWizard 3 (JPK, Germany). The roughness and mechanical properties of the films were measured under QI Advanced Mode using SNL-10 probes (resonance frequency of ~65 kHz; spring constant of ~0.34 N/m; Bruker, Germany) with the exception of the PLL coated surface where a TAP525 probe (resonance frequency of ~525 kHz; spring constant of ~200 N/m, Bruker, Germany) was used. The Young modulus of the films were calculated by fitting the approach curves with the Hertz model, using a paraboloid tip shape (applying a very short indentation range, 0.5–1 nm – to eliminate contribution of the underlying substrate). All the probes were calibrated by contact with the underlying surfaces, from which sensitivity was determined, and by fitting the cantilever resonance frequency. All the experiments were performed in air, while the surfaces were humidified using a drop of water.
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