Analyses were performed using a TESCAN MIRA 3 LMU Schottky Field Emission Scanning Electron Microscope, equipped with an Oxford Instrument X-max 80 mm2 EDS system, using the latest Silicon Drift Detector (SDD) technology to identify chemical phases. The very bright area in the images is associated with charging caused by the poor conductivity of the surface, since the glassy carbon working electrode is too long to fit into the sputter coater, and carbon tape alone was not sufficient to dissipate the charge.
X max 80 mm2 eds system
Manufactured by Oxford Instruments
The X-max 80 mm2 EDS system is a compact and versatile energy-dispersive X-ray spectroscopy (EDS) detector designed for elemental analysis in electron microscopy applications. The X-max 80 mm2 system features a large active area, providing high-resolution X-ray detection capabilities for a wide range of sample types and analysis needs.
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Lab products found in correlation
2 protocols using x max 80 mm2 eds system
1
Scanning Electron Microscopy with EDS
2
Scanning Electron Microscopy with EDS
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Analyses were performed using a TESCAN MIRA 3 LMU Schottky Field Emission Scanning Electron Microscope, equipped with an Oxford Instrument X-max 80 mm2 EDS system, using the latest Silicon Drift Detector (SDD) technology to identify chemical phases. The very bright area in the images is associated with charging caused by the poor conductivity of the surface, since the glassy carbon working electrode is too long to fit into the sputter coater, and carbon tape alone was not sufficient to dissipate the charge.
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