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Fe sem 4800sem

Manufactured by Hitachi
Sourced in Japan

The FE-SEM 4800 is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to provide high-resolution imaging and analysis capabilities for a variety of materials and applications. The FE-SEM 4800 utilizes a field emission electron source to generate a focused electron beam, enabling the instrument to achieve high-resolution imaging at low accelerating voltages.

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2 protocols using fe sem 4800sem

1

Fabrication of Tunable Titanium Nanotubes

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The nanotubular structures were obtained on 0.125 mm thick Ti foil (99.6% pure temper annealed, ADVENT, Oxford, UK). The Ti foils were cut into 2.5 × 2.5 cm and cleaned by successive ultrasonication (acetone, ethanol, water) and dried in a N2 stream.
The anodization experiments (two-electrode configuration) were performed in optimized conditions [46 (link)], briefly close-packed nanotubes with 20 nm intertube spacing (TNT20)—Glycerol (>99.7% p.a. Roth, Karlsruhe, Germany):H2O (70:30 vol.%) + 0.5 wt.% NH4F (>98% p.a. Roth, Karlsruhe, Germany), 20 V, and spaced nanotubes with 80 nm intertube spacing (TNT80)—Diethylene glycol (>99.5% p.a. Roth, Karlsruhe, Germany) + 4 wt.% HF (HF 40%, Sigma Aldrich, Germany) + 0.3 wt.% NH4F + 7 wt.% H2O, 27 V, 4 h, 30 °C. For additional information, see experimental details in previous work [46 (link)].
The morphology of the samples was evaluated by scanning electron microscope (SEM, FE-SEM 4800SEM, Hitachi, Japan). The contact-angle measurements were performed by a contact angle measurement system (DSA100, Kruss, Germany), as described previously [109 (link)].
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2

Comprehensive Material Characterization

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Samples morphology was characterized by scanning electron microscope (SEM, FE-SEM 4800SEM, Hitachi, Japan) coupled with an energy-dispersive X-ray Spectroscope (EDAX Genesis, fitted to the SEM chamber), while their chemical composition and chemical state was investigated by using X-ray photoelectron spectroscopy (XPS, PHI 5600, Physical Electronics, US)—peaks were shifted to C1s 284.8eV.
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