Jms ax505wa
The JMS-AX505WA is a scanning electron microscope (SEM) designed and manufactured by JEOL. It is capable of high-resolution imaging and analysis of a wide range of materials. The core function of the JMS-AX505WA is to provide detailed surface information and compositional analysis of samples at the micro- and nanoscale levels.
Lab products found in correlation
5 protocols using jms ax505wa
Characterization of Organometallic Complexes
Spectroscopic Characterization of Organic Compounds
and solvents from commercial sources
were used without further purification. Reactions were monitored by
thin-layer chromatography (TLC) using pre-coated silica gel plates
60F254 (Merck) in a UV light detector (254 nm). Flash column chromatography
was performed over a silica gel (70–230 mesh) purchased from
Merck. Melting points (mp) were measured in opened capillary tubes
using a Büchi B-540 without correction. 1H NMR and 13C{1H} NMR spectra were recorded on a Varian VNMRS500
(500 MHz) spectrometer using residual solvent peaks as an internal
standard (CHCl3: δ 7.26 ppm for proton, δ 77.16
ppm for carbon; DMSO: δ 2.50 ppm for proton, δ 39.97 ppm
for carbon). High-resolution mass spectra (HRMS) were obtained on
a JEOL JMS-AX 505wA, JEOL JMS-HX/HX 110A spectrometer.
Isolation and Structural Elucidation of Compounds from Three Plant Species
Characterization of NI Derivatives
Analytical Methods for Compound Characterization
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