Dimension icon pt afm

Manufactured by Bruker

The Dimension Icon-PT AFM is a high-resolution atomic force microscope designed for precision surface imaging and analysis. It is capable of operating in various modes, including contact, tapping, and PeakForce Tapping modes, to capture detailed topographical and material property information of samples at the nanoscale.

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Lab products found in correlation

Nanoscope analysis v1, by Bruker (2 mentions) Tap300al g tip, by Budget Sensors (1 mentions) Jsm 6400, by JEOL (1 mentions) Scanasyst air tip, by Bruker (1 mentions)

4 protocols using dimension icon pt afm

Characterization of Sputter Crater Roughness

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The roughness of sputter craters produced in spun-cast films of polystyrene, PMMA, or a 50:50 blend, was determined by tapping-mode AFM. Craters measuring 600 × 600 μm were produced in polymer films by sputtering using the parameters described for ToF-SIMS data collection below for 3, 9 or 15 seconds. Crater bottoms and original polymer surfaces were analyzed using a Dimension Icon-PT AFM (Bruker). The instrument was operated in tapping mode using Tap300Al-G tips (Budget Sensors) with a resonant frequency of 300 kHz and a force constant of 40 N/m. Height images were collected across a 1 × 1 μm area with a scan rate of 1 Hz and 256 samples/line. Images were analyzed using NanoScope Analysis v1.5 (Bruker). Representative images (n=4) were flattened using a 1^st order algorithm, and roughness (R_q) calculated across the whole image area, excluding any notable artifacts. Horizontal line scans were reconstructed from row 128 of the representative images.

Taylor A.J., Graham D.J, & Castner D.G. (2015). Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates. The Analyst, 140(17), 6005-6014.

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Comprehensive Nanomaterial Characterization

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We characterized our sample by the measurements of STEM, SEM, CL, PL and AFM. STEM was performed using a FEI Titan 80–300 kV electron microscopy operated at 300 keV. CL investigations were carried out using a custom-build system based on an SEM JEOL JSM 6400 equipped with a monochromator and an intensified Si-diode array. For TRPL measurements, a streak camera (OPTRONIS SC101) was used as the detector, and the sample was excited by a Ti:sapphire fs laser with an excitation wavelength of 237 nm and an excitation power density of ~50 W/cm². The surface morphology was characterized by Bruker Dimension ICON-PT AFM.

Ma D., Rong X., Zheng X., Wang W., Wang P., Schulz T., Albrecht M., Metzner S., Müller M., August O., Bertram F., Christen J., Jin P., Li M., Zhang J., Yang X., Xu F., Qin Z., Ge W., Shen B, & Wang X. (2017). Exciton emission of quasi-2D InGaN in GaN matrix grown by molecular beam epitaxy. Scientific Reports, 7, 46420.

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Polymer Film Thickness Measurement by AFM

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Thickness of polymer films was measured by AFM profiling. Trenches were prepared in polymer films by scoring with the back of a scalpel blade. At least n=3 trenches per film type were profiled using a Dimension Icon-PT AFM (Bruker). The instrument was operated in ScanAsyst mode using ScanAsyst-Air tips (Bruker) with a resonant frequency of 50–90 kHz and a force constant of 0.4 N/m. Height images were collected across a 90 μm × 90 μm area with scan rate of 0.6 Hz and 256 samples/line. Images were analyzed using NanoScope Analysis v1.5 (Bruker). Representative images (n=3) were flattened using a 1^st order algorithm, pre-selecting areas known to represent the film surface. Trench depth was measured using the step measurement tool.

Taylor A.J., Graham D.J, & Castner D.G. (2015). Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates. The Analyst, 140(17), 6005-6014.

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Atomic Force Microscopy of Nanoparticles

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AFM measurements
were carried out
directly on the GC substrates as well as directly on the TEM grids
using a Bruker Dimension Icon-Pt AFM in the tapping mode (TappingMode
in Air, Steps non HAR) using the tip: Tap150Al-G silicon probe with
aluminum reflex coating, resonant frequency 150k Hz, force constant
5 N/m, tip radius ∼10 nm. The heights of the NPs were measured
by measuring individual line profiles and taking the height from a
Gaussian fitting. The details of the data analysis in Gwyddion^{42 (link)} and images for all NPs sizes are giving in Section S.2 in the Supporting Information.

Sedano Varo E., Egeberg Tankard R., Kryger-Baggesen J., Jinschek J., Helveg S., Chorkendorff I., Damsgaard C.D, & Kibsgaard J. (2024). Gold Nanoparticles for CO2 Electroreduction: An Optimum Defined by Size and Shape. Journal of the American Chemical Society, 146(3), 2015-2023.

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