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Lfa 467 hyperflash instrument

Manufactured by Netzsch

The LFA 467 HyperFlash instrument is a thermal conductivity analyzer designed for the measurement of thermal diffusivity, thermal conductivity, and specific heat capacity of solid materials. The instrument utilizes the flash method to determine these properties across a wide range of temperatures.

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2 protocols using lfa 467 hyperflash instrument

1

Thermal Conductivity Measurement of Phase-Changing Materials

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The thermal conductivity of each sample was measured by the flash diffusivity method (ASTM E1461-13) using a Netzsch LFA 467 HyperFlash instrument (Supplementary Fig. 42). The samples were prepared in pellets of approximately 12.9 mm in diameter and 1 mm thickness. The measurements were carried out under a Helium atmosphere at 10 °C below and 15 °C above the transition temperature for the LT and HT phases, respectively, of (DA)2MnCl4, and at 10 °C below and above the transition temperature for the LT and HT phases, respectively, of (NA)2CuBr4. The measurement results were not corrected for thermal expansion due to phase changes.
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2

Characterization of Thermoelectric Materials

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To investigate the electrical
and thermal transport properties parallel and perpendicular to the
sintering direction, the sintered samples were cut and polished into
disks (10 mm diameter and ∼1.5 mm thickness, perpendicular
to the pressing direction) and cuboids of 8 × 8 × 2 mm3 parallel to the pressing direction for Hall effect and thermal
diffusivity measurements and bars of 2 × 2 × 10 mm3 (parallel and perpendicular to the pressing direction) for electrical
property measurements. The total thermal conductivity (κtotal) was calculated from the thermal diffusivity (D), heat capacity (Cp) and density
(ρ): κtotal = DCpρ. The temperature-dependent thermal diffusivity D was measured on disk-shaped samples by a laser flash diffusivity
method using a Netzsch LFA-467 Hyperflash instrument. The temperature-dependent
heat capacity was derived using a standard sample (Pyroceram-9060).
The directions of measurement and sample shapes are illustrated in Figure 1. X-ray powder diffraction
analysis was performed with a PANalytical X’Pert PRO instrument,
using Cu Kα1 radiation (λ = 1.54059 Å) to identify
the crystal structure of each sample. Rietveld refinement was performed
using GSAS-II43 (link) to obtain the lattice parameters
for all samples.
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