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Axis ultra dld apparatus

Manufactured by Shimadzu
Sourced in United Kingdom

The Axis Ultra DLD apparatus is a high-performance scientific instrument used for surface analysis. It is designed to provide accurate and detailed information about the chemical composition and electronic structure of material surfaces. The core function of the Axis Ultra DLD is to perform X-ray photoelectron spectroscopy (XPS), a widely used analytical technique in various scientific and industrial applications.

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4 protocols using axis ultra dld apparatus

1

Characterization of Pd-TiO2 Photocatalysts

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Using X-ray diffraction (XRD), we examined the surface morphology and scanning rate of Pd–TiO2 plasmonic photocatalysts prepared with different Pd–TiO2 combinations, with 30 mA, 40 kV, and 50 Hz scanning rates. To identify the morphology of nanomaterials prepared, a transmission electron microscope (TEM) JEM-2000EX (JEOL, Japan) with an acceleration voltage of 200 kV and a field emission gun (C-FEG) was utilized. The filament used in this TEM is a sharpened lanthanum hexaboride (LaB6) crystal. A Jasco V-650 double-beam spectrophotometer was used to record UV-vis/DR spectra.
In this study, a BELSORP MINI X surface area and pore size analyzer was applied to determine the surface area and pore size distribution (adsorption–desorption of N2 gas at 77 K). Under a nitrogen atmosphere, the samples were degassed at 150 °C for five hours before analysis. The X-ray photoelectron spectra (XPS) were retrieved using monochromatic Al K radiation and the Kratos Axis Ultra DLD apparatus (225 W, 15 mA, 15 kV), with a pass energy of 50 eV. The binding energy (BE) of adventitious carbon C ls (284.9 eV) was computed as a baseline.
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2

Spectroscopic Analysis of Lyophilized Samples

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FTIR spectra were acquired on a Jasco 4100 series (Jasco Inc., Easton, MO, USA). Lyophilized samples and potassium bromide (KBr) were prepared as KBr pellets and scanned using blank KBr pellet as background. XPS analysis of all lyophilized samples was conducted on an axis ultra DLD apparatus (Kratos, Manchester, UK).
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3

XPS Analysis of Surface Composition

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X-ray photoelectron spectroscopy (XPS) analysis was used to investigate the chemical composition of the surface through Axis Ultra DLD apparatus (Kratos Analytical, Manchester, UK). Monochromated AlKα radiation (hv = 1486.6 eV) was used for bombardment of the surface to elicit the emission of photoelectrons with element-specific binding energy (BE). Each sample was observed at the energy range of 0–1350 eV. The measured BE peak position and areas determined the elements and groups according to Shirley background subtraction.
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4

Comprehensive Spectroscopic Characterization of Catalysts

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1 H NMR spectra were recorded on a Bruker UltraShield 500 MHz spectrometer. Powder X-ray diffraction patterns were recorded with a Shimadzu XRD 7000 diffractometer using Cu K a radiation (l ¼ 1.5418 Å, 40 kV, 40 mA) at a scanning speed of 0.10 min À1 in the 5-80 2q range. The leaching of metals from the catalyst was monitored by induced coupled plasma analysis on an Agilent Technologies 715 ICP-OES apparatus. XPS analysis was carried out using Kratos AXIS Ultra DLD apparatus equipped with a monochromated Al K a X-ray source, a charge neutralizer and a hemispherical electron energy analyzer with a pass energy of 160 eV. Background subtraction was performed using a Shirley background, and CasaXPS soware was employed to treat the data. The XPS was referenced to the aliphatic C 1s feature at 284.8 eV.
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