Pw 1050 70 diffractometer

FTIR-spectroscopy (Genesis-II FT-IR spectrometer, ALT, San Diego, CA, USA) was used to illustrate the synthesized nano-composites. Moreover, scanning electron microscopy (SEM, Inspect S, FEI Company, Eindhoven, the Netherlands) and EDX (Quanta 200, FEL) tests were performed. Transmission electron microscopy (TEM) utilizing a JEM-HR-2001 model instrument (JEOL, Akishima, Japan) with an accelerating voltage of 200 kV was applied to gauge the materials’ particle sizes. In order to determine the materials’ compositions, X-ray diffraction (XRD) using a Philips PW 1050/70 diffractometer (Philips, Amsterdam, the Netherlands) was used.

Samples analyzed by XRD were prepared according to the procedure described in Section 2.4. Approx. 2 g of each sample was used in the study. The diffractograms were collected after 40 and 360 days of curing, using a Philips PW 1050/70 diffractometer (Cu/Ni lamp operating at 35 kV/16 mA, 2θ range of 10–60°, step size of 0.05°, Amsterdam, the The Netherlands) and analyzed using X’Pert HighScore Plus software (PDF2 database, Malvern, UK).