elemental composition, and distribution of the samples were directly
characterized with SEM (JEOL JSM-7900F), TEM (JEOL JEM-F200), and
EDS (Bruker EDS QUANTAX). The lattice structures of composite were
registered using an X’Pert PRC diffractometer (Netherlands,
PANalytical) with Cu Kα radiation at a scanning rate of 5°
min–1 (λ = 0.15418 nm). The distribution and
valence state situation of various elements on the film surface were
analyzed via X-ray photoelectron spectroscopy (XPS, ThermoFisher ESCALAB
XI+). Electron paramagnetic resonance (EPR) measurement was carried
out on a Bruker ELEXSYS-II E500 spectrometer. The Raman spectra of
the samples were tested by a HJY LabRAM Aramis spectrometer with a
laser diode at an excitation wavelength of 532 nm.