Xplora
The XploRA is a compact and versatile Raman microscope system developed by Horiba. It is designed to provide high-quality Raman spectroscopy data for a wide range of applications. The system features a user-friendly interface, advanced optics, and a range of available configurations to meet the specific needs of researchers and laboratories.
Lab products found in correlation
72 protocols using xplora
Confocal Micro-Raman Spectroscopy for SERS
Microplastic Identification via Raman Spectroscopy
The deionized water and saline solutions were filtered before used for washing steps. The air control samples were clean filter membranes on glass Petri dishes around the working area during the sampling handling and vacuum filtering stage. No microplastics were found on the controls, suggesting that fibers encountered in the study were not from clothing used in the laboratory.
Raman Mapping of Gout Crystal Deposits
Tip-Enhanced Raman Spectroscopy Mapping
For fast and efficient TERS mapping, TERS measurements were conducted in SpecTop™ TERS mapping mode in which TERS spectrum at a particular pixel in the TERS map is measured when the tip is in direct contact with the surface, with a typical interaction force of 2–10 nN and integration time of 0.05 s–0.5 s. Transition between the pixels of the TERS map is performed in semi-contact mode, which preserves both the sharpness and plasmonic enhancement of the tip eliminating lateral forces that might otherwise sweep aside or pick up loosely attached contaminants from the sample surface. All TERS measurements were performed using Au coated AFM TERS tips (k = 7 N/m, f = 150 kHz, formerly AIST-NT, now HORIBA Scientific).
Excitation and Temperature-Dependent Fluorescence Study of Carbon Dots
For the measurements of the temperature-dependent fluorescence spectra, CDs film were recorded using a Xplora (HORIBA, Kyoto, Japan) equipped with a laser of 532 nm, lens 10× objective (NA = 0.3 and WD = 17.5 mm). A heater (INSTEC hot and cold stage) was coupled to the Xplora. The spectra were collected during sample heating from 303 K to 453 K, varying of 30k. After the first cycle heating, the sample was cooled to room temperature.
Characterization of Au@TiO2 Nanoparticles
Characterization of Boron Nitride Nanosheets
the samples were investigated by field emission scanning electron
microscopy (SEM, FEI, Quanta FEG250, USA) and transmission electron
microscopy (TEM, FEI, Tecnai G2 F20, USA). The Fourier translation
infrared spectra were recorded on an FT-IR spectrometer (FT-IR, PerkinElmer,
Spectrum Two, USA), using the KBr pelleting method. The crystalline
phases of the samples were determined by an X-ray diffractometer (XRD,
PANalytical B.V., Thermo Scientific, Netherlands). Atomic force microscopy
(AFM) analysis was performed by employing an atomic force microscope
(AFM, Multimode 8 Nanoscope V system, USA). EDS measurement was performed
using a Zeiss EVO ED15 microscope coupled with an Oxford X-MaxN EDS
detector. Surface compositions of BNNSs were observed by X-ray photoelectron
spectroscopy (XPS, Kratos Axis Ultra DLD). The Raman spectra were
obtained from a Horiba xplora. The yield of BNNSs was calculated using
the following equation:
Characterization of Graphene-Based Materials
Raman Spectroscopy of Cultured Cells
Structural Characterization and SERS Analysis
For SERS measurements, about 7 µL of 1 mM Rhodamine 6G (R6G) in ethanol was dropped on top of the gold and left to dry at ambient conditions. SERS measurements and mapping were carried out with a backscattering configuration on a Horiba XploRA confocal Raman instrument equipped with a charge-coupled device (CCD) detector. The spectra acquisition was carried out using an excitation laser wavelength of 638 nm of ca. 40 mW power, in a spectral range of 500–2100 cm−1, with an integration time of 15 s per spectrum and averaged over 5 accumulations. Raman mapping was performed with a 1 μm step in the case of Aula and a 0.5 μm step in the cases of Cosc and Gomp, with an integration time of 1 s per step. For focusing the light, the 100x objective (NA = 0.9) was used, giving a beam size of approximately 0.5 μm. Grating was set to 1200 grooves/mm.
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