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72 protocols using xplora

1

Confocal Micro-Raman Spectroscopy for SERS

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LIQUISOR was operated indifferently on different confocal Micro-Raman Spectrometers: a LabRam HR800, a XploRA and a XploRA PLUS (Horiba, Kyoto, Japan). SERS experiments on BSA were carried out mainly on the HR800 at 632.8 nm. Optical printing and SERS of Hgb and Cat were carried out mainly on the XploRA PLUS at 638 nm. Experiments on aptamers and OTA were carried out mainly on an XploRA at 660 nm. The HR800 employed a He-Ne laser source (632.8 nm); the beam was focused by means of a 100× microscope objective (Olympus M-Plan, NA = 0.90, WD = 210 μm) on a ~ 600 nm diameter spot. The laser power on the sample was 5 mW, enough to apply a sufficient radiation pressure on the nanorods for process activation. The XploRA and XploRA PLUS setups used laser diode sources at 660 nm and 638 nm, respectively. Optical aggregation was accomplished with long working distance microscope objectives (Olympus LMPlanFl 50×, NA 0.5, WD = 10.6 mm; Olympus LUCPLFLN 60×, NA 0.7, WD = 1.5 mm), using higher laser power (13–18 mW). In all the cases, the SERS signal was collected via the same illumination objective, in backscattering, dispersed by a 600 lines/mm grating and detected through a Peltier-cooled silicon CCD (Synapse and Sincerity by Horiba Jobin Yvon or Andor iDus DU 420, (Belfast, UK). Spectra were acquired with integration times from seconds to tens of seconds.
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2

Microplastic Identification via Raman Spectroscopy

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The MPs analysis was subject to determine individual particles by using a Raman microscope (XploRA Horiba Scientific). The microscopic mode was used to observe shape, color and size of micro‐pieces and the number of microplastics with the total dimensions larger than 25 µm was noted down. The Raman spectrometer included a single beam laser operating at 532 nm of wavelength coupled with a charge‐coupled device detector. Every individual particle was analyzed in a wavelength range of 50–3600 cm−1 with an acquisition time of 15 s and a grating of 900 lines per mm. After identifying the polymer type based on Raman spectra, microplastics were categorized according to shape, polymer type and color.
The deionized water and saline solutions were filtered before used for washing steps. The air control samples were clean filter membranes on glass Petri dishes around the working area during the sampling handling and vacuum filtering stage. No microplastics were found on the controls, suggesting that fibers encountered in the study were not from clothing used in the laboratory.
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3

Raman Mapping of Gout Crystal Deposits

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Raman mapping of sample deposits was conducted using a commercial system (Xplora, Horiba Jobin Yvon, Edison, NJ) to investigate the distribution of clinical crystal deposits on the polypropylene filter-membrane. The system is composed of a laser source at 785 nm, and measurements were performed using a 1200 lines/mm grating, which provided a spectral dispersion of 1.25 pixels/cm−1. The Raman shift measured by the system was calibrated using the 520.7 cm−1 peak of a silicon wafer.
The chemical image map was recorded from the deposit obtained from a patient with confirmed presence of gout crystals following the elucidated digestion and filtration processes. The mapping covered ~1 mm diameter region using a X10 objective (Olympus). The laser power at the objective aperture was set at 30 mW. The 2D map had 25 μm step size along both axes, resulting in collection of 1444 spectra. Each spectrum was obtained as the average of 3 consecutive spectra each collected for 4 seconds each. Chemical image was reconstructed based on the intensity of the 631 cm−1 peak of MSU. Raw spectra were filtered and background subtraction was performed using a commercial software (Labspec v5, Horiba Jobin-Yvon, Edison, NJ).
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4

Tip-Enhanced Raman Spectroscopy Mapping

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TERS measurements were performed on a NanoRaman system consisting of an atomic force microscope (OmegaScope, formerly AIST-NT, now HORIBA Scientific) combined with a Raman spectrometer (XploRA, HORIBA Scientific, France) in side illumination geometry as schematically shown in Fig. 1. A 638 nm excitation laser was focussed on the sample at an angle of 60° using a ×100, 0.7 NA, 20 mm long working distance objective lens (Mitutoyo, Japan). TERS spectra were measured using a spectrometer grating with 600 lines/mm and an electron-multiplying charged-coupled device detector (Andor, Ireland) with a laser power of 100 µW at the sample.
For fast and efficient TERS mapping, TERS measurements were conducted in SpecTop™ TERS mapping mode in which TERS spectrum at a particular pixel in the TERS map is measured when the tip is in direct contact with the surface, with a typical interaction force of 2–10 nN and integration time of 0.05 s–0.5 s. Transition between the pixels of the TERS map is performed in semi-contact mode, which preserves both the sharpness and plasmonic enhancement of the tip eliminating lateral forces that might otherwise sweep aside or pick up loosely attached contaminants from the sample surface. All TERS measurements were performed using Au coated AFM TERS tips (k = 7 N/m, f = 150 kHz, formerly AIST-NT, now HORIBA Scientific).
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5

Excitation and Temperature-Dependent Fluorescence Study of Carbon Dots

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For the measurements of the excitation-dependent fluorescence spectra, CDs suspension were measured using a FluoroLog®-3 spectrofluorometer (HORIBA, Kyoto, Japan) equipped with a xenon lamp (CW 450 W), a detector photomultiplier (model R928P) and using an excitation wavelength ranging from 310 to 532 nm. The CDs suspension was externally heated at 303 and 453 K. After solubilize, the fluorescence was measured for both cases at room temperature.
For the measurements of the temperature-dependent fluorescence spectra, CDs film were recorded using a Xplora (HORIBA, Kyoto, Japan) equipped with a laser of 532 nm, lens 10× objective (NA = 0.3 and WD = 17.5 mm). A heater (INSTEC hot and cold stage) was coupled to the Xplora. The spectra were collected during sample heating from 303 K to 453 K, varying of 30k. After the first cycle heating, the sample was cooled to room temperature.
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6

Characterization of Au@TiO2 Nanoparticles

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The morphology of the Au@TiO2 NPs was characterized by transmission electron microscopy (TEM, JEOL JEM 1400; HR-TEM, JEOL JEM 2100). EDS mapping analysis was performed on a field emission transmission electron microscope (TEM, Philips TECNAI F30). Absorption spectra were collected on an ultraviolet-visible spectrophotometer (UNICO, UV2012C/PC/PCS). X-ray diffraction (XRD) studies were carried out on an X-ray diffractometer (Rigaku IV) using Cu K radiation (λ = 1.5418 Å). A confocal Raman spectrometer (HORIBA, X-plora) was used to record Raman signals.
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7

Characterization of Boron Nitride Nanosheets

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Morphologies of
the samples were investigated by field emission scanning electron
microscopy (SEM, FEI, Quanta FEG250, USA) and transmission electron
microscopy (TEM, FEI, Tecnai G2 F20, USA). The Fourier translation
infrared spectra were recorded on an FT-IR spectrometer (FT-IR, PerkinElmer,
Spectrum Two, USA), using the KBr pelleting method. The crystalline
phases of the samples were determined by an X-ray diffractometer (XRD,
PANalytical B.V., Thermo Scientific, Netherlands). Atomic force microscopy
(AFM) analysis was performed by employing an atomic force microscope
(AFM, Multimode 8 Nanoscope V system, USA). EDS measurement was performed
using a Zeiss EVO ED15 microscope coupled with an Oxford X-MaxN EDS
detector. Surface compositions of BNNSs were observed by X-ray photoelectron
spectroscopy (XPS, Kratos Axis Ultra DLD). The Raman spectra were
obtained from a Horiba xplora. The yield of BNNSs was calculated using
the following equation:
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8

Characterization of Graphene-Based Materials

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These tested samples are all industrial, commercial materials that were obtained from five different suppliers. They include a total of 22 GBMs: 15 GNPs and 7 RGOs. Their specific surface area was determined with the BET technique (adsorption of nitrogen, with degassing system Micromeritics, Norcross, GA, USA). Their surface oxidation was determined with XPS (X-ray Photo Spectroscopy, Quantera Scanning XPS microprobe, Physical Electronics, Chanhassen, MN, USA). Lateral size was determined with electronic microscopy (Field Emission Scanning Electron Microscope, from JEOL, Tokyo, Japan). Surface defects were estimated with the ID/IG intensity ratio, calculated with Raman spectroscopy (XploRA, Horiba Scientific, Kyoto, Japan). For comparison, we also tested two samples of carbon black and one sample of amorphous silica.
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9

Raman Spectroscopy of Cultured Cells

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Spontaneous Raman scattering spectra are acquired on an upright confocal Raman microspectrometer (Xplora, Horiba Jobin Yvon) with 532 nm diode laser source and 1800 lines per millimeter grating at room temperature. The excitation power is ~40 mW after passing through a 50× air objective (MPlan N, 0.75 N.A., Olympus), and 40 s acquisition time accumulated by 22 was used to collect Raman spectra of all samples at a single point under identical conditions. For cultured cells, the Raman background of water and cover glass is removed from all cell spectra by subtracting the signal at empty space from the signals collected from cells.
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10

Structural Characterization and SERS Analysis

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Structural characterization of diatom valves as well as of the ultrathin gold layer was performed with a Hitachi SU8030 scanning electron microscope, supported with a secondary electron detector.
For SERS measurements, about 7 µL of 1 mM Rhodamine 6G (R6G) in ethanol was dropped on top of the gold and left to dry at ambient conditions. SERS measurements and mapping were carried out with a backscattering configuration on a Horiba XploRA confocal Raman instrument equipped with a charge-coupled device (CCD) detector. The spectra acquisition was carried out using an excitation laser wavelength of 638 nm of ca. 40 mW power, in a spectral range of 500–2100 cm−1, with an integration time of 15 s per spectrum and averaged over 5 accumulations. Raman mapping was performed with a 1 μm step in the case of Aula and a 0.5 μm step in the cases of Cosc and Gomp, with an integration time of 1 s per step. For focusing the light, the 100x objective (NA = 0.9) was used, giving a beam size of approximately 0.5 μm. Grating was set to 1200 grooves/mm.
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