The roughness of sputter craters produced in spun-cast films of polystyrene, PMMA, or a 50:50 blend, was determined by tapping-mode AFM. Craters measuring 600 × 600 μm were produced in polymer films by sputtering using the parameters described for ToF-SIMS data collection below for 3, 9 or 15 seconds. Crater bottoms and original polymer surfaces were analyzed using a Dimension Icon-PT AFM (Bruker). The instrument was operated in tapping mode using Tap300Al-G tips (Budget Sensors) with a resonant frequency of 300 kHz and a force constant of 40 N/m. Height images were collected across a 1 × 1 μm area with a scan rate of 1 Hz and 256 samples/line. Images were analyzed using NanoScope Analysis v1.5 (Bruker). Representative images (n=4) were flattened using a 1st order algorithm, and roughness (Rq) calculated across the whole image area, excluding any notable artifacts. Horizontal line scans were reconstructed from row 128 of the representative images.
Tap300al g tip
Manufactured by Budget Sensors
Sourced in United States
The Tap300Al-G tips are a type of laboratory equipment designed for precise liquid handling. They are made of high-quality aluminum alloy and are compatible with various pipette models. The core function of these tips is to facilitate the accurate and consistent transfer of liquid samples during laboratory procedures.
Automatically generated - may contain errors
Lab products found in correlation
Jupiter xr afm, by Oxford Instruments (2 mentions)
Dimension icon pt afm, by Bruker (1 mentions)
Nanoscope analysis v1, by Bruker (1 mentions)
Biolever mini tips, by Olympus (1 mentions)
Multimode spm, by Veeco (1 mentions)
Auriga 60, by Zeiss (1 mentions)
Jem 3010, by JEOL (1 mentions)
Dimension icon, by Bruker (1 mentions)
10 protocols using tap300al g tip
1
Characterization of Sputter Crater Roughness
2
Atomic Force Microscopy Characterization of Protein Surface Coverage
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Samples were immobilized to AFM discs with epoxy. Air tapping mode measurements were taken with Tap300Al-G tips (BudgetSensors), with a nominal spring constant 40 N m−1 at a scan rate of 2 Hz. Liquid AFM was performed on the Asylum Cypher in Fast Force Mapping mode with BioLever Mini tips (Olympus Corporation), with a nominal spring constant of 0.09 N m−1 at a set point of 250 pN and a Z rate of 299.40 Hz.
Wrinkle radii of curvature were determined by fitting a quadratic function to multiple line profiles of peaks and valleys and are reported as absolute values. Protein surface coverage was quantified by analysis of AFM images in Gwyddion software. A 140 × ∼800 nm region along each peak or valley was cropped, and a second-order flattening was performed to remove the curvature of the substrate's topography. A threshold with user selected cut-off was used to separate protein from substrate and quantify the surface coverage of the protein. Standard error was calculated by averaging measurements from 3 regions on the same sample. A t test was performed to determine significance of differences in peak/valley coverage, with p ≤ 0.05 being considered significant. Fast Fourier Transform (FFT) filtering was performed in Gwyddion software.
Wrinkle radii of curvature were determined by fitting a quadratic function to multiple line profiles of peaks and valleys and are reported as absolute values. Protein surface coverage was quantified by analysis of AFM images in Gwyddion software. A 140 × ∼800 nm region along each peak or valley was cropped, and a second-order flattening was performed to remove the curvature of the substrate's topography. A threshold with user selected cut-off was used to separate protein from substrate and quantify the surface coverage of the protein. Standard error was calculated by averaging measurements from 3 regions on the same sample. A t test was performed to determine significance of differences in peak/valley coverage, with p ≤ 0.05 being considered significant. Fast Fourier Transform (FFT) filtering was performed in Gwyddion software.
3
Multi-modal Characterization of Nanotubes
4
Tapping Mode Phase Contrast AFM Analysis
5
Atomic Force Microscopy of PSA Coatings
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Surface morphology of the PSA dried coatings was analyzed by AC-mode phase contrast AFM. Images were taken with an Oxford Instruments Asylum Research Jupiter XR AFM (Asylum Research, Santa Barbara, CA, USA) using BudgetSensors Tap300Al-G tips. The cantilever was tuned to a free amplitude of 300 mV and operated at a set point optimized to obtain the highest possible average phase, ensuring the images were obtained in attractive mode at a phase well above 90°.
6
Surface Morphology Analysis of PSA Coatings
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Surface morphology of the PSA dried coatings was analysed by tapping mode phase contrast AFM. Images were taken with an Oxford Instruments Asylum Research Jupiter XR AFM (Asylum Research, US) using BudgetSensors Tap300Al-G tips. The cantilever was tuned to a free amplitude of 300mV and operated at a set point optimised to obtain the highest possible average phase, ensuring the images were obtained in attractive mode within a range of phase between 100-180 degrees. AFM was performed on a sample from each batch of ThermoTape to ensure that each batch would perform as expected in the trial.
7
Topographic Characterization of Substrate Surfaces
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Substrate surfaces were examined using an atomic force microscope (AFM) on a
Veeco Dimension 3100 instrument. The AFM was used in tapping mode using Tap300Al-G tips from Budget Sensors (Sofia, Bulgaria) and high aspect ratio images were measured using Improved Super Cone tips from Team Nanotec (Villingen-Schwenningen, Germany). Both tips had a resonant frequency of 300 kHz and force constant of 40 Nm -1 . Images were analysed using WSxM software. 40
Veeco Dimension 3100 instrument. The AFM was used in tapping mode using Tap300Al-G tips from Budget Sensors (Sofia, Bulgaria) and high aspect ratio images were measured using Improved Super Cone tips from Team Nanotec (Villingen-Schwenningen, Germany). Both tips had a resonant frequency of 300 kHz and force constant of 40 Nm -1 . Images were analysed using WSxM software. 40
8
Atomic Force Microscopy of Enzyme-Treated Films
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Film morphology was examined by dynamic force mode (tapping mode) AFM in air at 25 • C using a Dimension-Icon, Brüker apparatus equipped with Tap 300 Al-G tips from Budget Sensors. Films were prepared as described in 2.2.1 in the absence and 2.2.2 in the presence of enzyme. In each case, the mixtures were left to dry on microscope slides instead of petri dishes. Each sample was observed in different scan sizes adapted to the observation (going from 300 × 300 nm2 to 60 × 60 µm2). Height and phase images were recorded, simultaneously. The roughness is estimated through Rq the root-mean-square roughness of the sample over a 100 µm 2 area.
9
Quantitative Nanomechanical Mapping of Thin Films
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Quantitative Nano mechanical Mapping (QNM) in peak force mode was used to image 5 × 5 μm areas recording surface topography, deformation, dissipation, adhesion and DMT Modulus of each film in dry conditions. For each set of measurements (n = 3), a single Tap300Al-G tip (Budget Sensors) was used for which deflection sensitivity was calibrated on a sapphire substrate and AFM parameters set to fit a PS-LDPE standard. Nano Scope Scan Asyst was used to optimise gain, scan rate and set point. A second set of films was produced on borosilicate microscope cover slips (Scientific Laboratory Supplies) to verify observed trends and check for substrate effects (n = 3). Complete information from all QNM channels are presented in ESI, Fig. 1–9.†
10
Characterization of Graphene Oxide Paper
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The morphology of the dispersed GO was probed by tapping mode atomic force microscopy (AFM, Agilent) with a Tap300Al-G tip from Budget Sensors. The topography of the GO and rGO paper was further characterized by scanning electron microscopy (SEM) using a Quanta FEG 200 ESEM electron microscope from FEI with TX microscope Control Software. The surface resistance of the graphene paper was characterized using a four-point probe (FPP) from a Jandel Model RM3 test station. The elemental composition of the GO paper and rGO paper before and after annealing was analyzed by X-ray photoelectron spectroscopy (XPS) using a Thermo Scientific XPS System with the operating and data analyzing software Advantage.
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