Powder X-ray diffraction (XRD) data were collected at room temperature on a Rigaku Ultima diffractometer by using Cu Kα radiation. The diffractometer was operated at 40 kV and 40 mA with a scan rate of 2°/minute. Transmission electron microscopy (TEM) imaging was performed on a JEOL JEM-2100 transmission electron microscope at an acceleration voltage of 200 kV. Scanning electron microscopy (SEM) imaging was performed on a Hitachi S-4800 scanning electron microscope operating at 5 kV. UV-visible absorption spectra were collected on a UV-visible spectrophotometer (TU-9100, Beijing Purkinje General Instrument Co. Ltd., China). Nitrogen adsorption-desorption isotherms were performed on Micromeritics ASAP 2020 surface area and porosity analyzer, from which the nanozymes' surface areas were calculated with the Brunauer-Emmett-Teller (BET) method.
Jem 2100 transmission electron microscope
Manufactured by Hitachi
Sourced in Japan
The JEM-2100 is a transmission electron microscope manufactured by Hitachi. It is designed to provide high-resolution imaging and analysis of a wide range of materials at the nanoscale level. The JEM-2100 utilizes an electron beam to illuminate and magnify samples, enabling users to observe and study the internal structure and composition of materials with exceptional detail.
Automatically generated - may contain errors
Lab products found in correlation
S 4800 scanning electron microscope, by Hitachi (2 mentions)
Ultrospec 4300 pro uv visible spectrophotometer, by Cytiva (1 mentions)
F 4500 fluorescence spectrophotometer, by Hitachi (1 mentions)
F 4600 spectrometer, by Hitachi (1 mentions)
S 4800, by Hitachi (1 mentions)
Phi 5000 versaprobe, by Physical Electronics (1 mentions)
F 7000 fluorescence spectrophotometer, by Hitachi (1 mentions)
5 protocols using jem 2100 transmission electron microscope
1
Comprehensive Characterization of Nanozymes
2
Characterization of Graphene Oxide Nanoparticles
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The morphology and structure of the prepared GSPs were investigated using a JEOL JEM 2100 transmission electron microscope (TEM, Tokyo, Japan) and a Hitachi S-4800 scanning electron microscope (SEM, Tokyo, Japan). Dynamic light scattering (DLS) analysis was performed using a Zetasizer Nano-ZEN3700 instrument (Malvern, UK) to determine the size distribution of various GSPs. Ultraviolet-visible (UV-Vis) absorption spectra were obtained using an Amersham Pharmacia Ultrospec 4300 pro UV/visible spectrophotometer (England, UK). Fluorescence spectra were assessed with a Hitachi F-4500 fluorescence spectrophotometer (Tokyo, Japan). A commercial HG-8 strip reader was purchased from Shanghai Huguo Science Instrument Co., Ltd. (Shanghai, China).
3
Comprehensive Characterization of Nanomaterials
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Transmission electron microscopy (TEM) images were obtained by using a JEM-2100 transmission electron microscope at an acceleration voltage of 200 kV. Ultraviolet-visible (UV-Vis) absorption and fluorescence spectra were collected using a UV-Vis V3900H spectrometer and an F4600 spectrometer (HITACHI), respectively. The quantum yield was determined with Rhodamine B as a reference. X-ray photoelectron spectroscopy (XPS) was conducted on a PHI Quantera II electron microscope with a correction voltage of 284.6 eV. Fourier transform infrared (FT-IR) spectra were recorded with a HITACHI Z2012-350 infrared spectrometer. Confocal microscopy images were obtained using an SP5 (Leica) confocal microscope. Scanning electron microscopy images were recorded on an S-4800 (HITACHI) scanning electron microscope. The samples were freeze-dried using an ALPHA1-4/LD plus lyophilizer. The temperature was recorded with a FOTRIC 225s infrared thermal imager.
4
Structural Analysis of Ag(X):ZIS QDs
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The structural analysis of the samples was conducted using X-ray diffraction (XRD) with X’TRA and Cu Kα (ARL Co.) (D8ADVANCE, Bruker, Salbuluken, Germany) equipment. X-ray photoelectron spectroscopy (XPS) measurements were carried out utilizing a PHI 5000 Versa Probe (UlVAC-PHI Co., Chigasaki, Japan). For obtaining high-resolution transmission electron microscopy (HRTEM) images of the Ag (X): ZIS QDs, a JEOL JEM-2100 transmission electron microscope (Hitachi, Tokyo, Japan) was employed.
5
Optical and Structural Characterization
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Absorption spectra were recorded on a TU1901 UV-vis spectrophotometer (PUXI optical equipment factory, China) at room temperature. Fluorescence spectra were recorded on an F-7000 fluorescence spectrophotometer (Hitachi, Japan). Transmission electron microscopy (TEM) measurements were made on a JEM-2100 transmission electron microscope (Hitachi, Japan).
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