A NanoDrop oneC spectrophotometer (Thermo Scientific, Waltham, MA, USA) was used to record UV-vis absorption spectra. A JEM-200CX transmission electron microscope (TEM, JEOL, Tokyo, Japan) was used for imaging particle aggregation. Vibrational spectra were obtained with a Fourier transform infrared spectrometer (FT-IR-8400, Shimadzu, Kyoto, Japan).
Jem 200cx transmission electron microscope
The JEM-200CX is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging of samples at the nanoscale level. The JEM-200CX can produce detailed images of the internal structure and morphology of a wide range of materials, including biological specimens, metals, and semiconductors.
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7 protocols using jem 200cx transmission electron microscope
Analytical Characterization of Nanomaterials
A NanoDrop oneC spectrophotometer (Thermo Scientific, Waltham, MA, USA) was used to record UV-vis absorption spectra. A JEM-200CX transmission electron microscope (TEM, JEOL, Tokyo, Japan) was used for imaging particle aggregation. Vibrational spectra were obtained with a Fourier transform infrared spectrometer (FT-IR-8400, Shimadzu, Kyoto, Japan).
Comprehensive Characterization of Nanomaterials
The Ni dispersion was measured by CO chemisorption on an AutoChem II 2920 instrument (Micromeritics, Norcross, GA, USA). Prior to CO chemisorption, the samples were reduced at 500 °C for 1 h in flowing H2, followed by He purging for another 30 min. Subsequently, the sample was cooled to 50 °C, and then, 10% CO/He was pulsed into the reactor through the six port valve until a constant CO peak area was reached.
Synthesis and Characterization of Functionalized Iron Oxide Nanoparticles
Visualizing D-Fe3O4@PMn Uptake in Pancreatic Cancer
Catalyst Characterization Techniques
Characterization of Gold Nanoparticles
UV-Vis absorption spectra were recorded on a NanoDrop One© spectrophotometer (Thermo ScientificManufacturer, City, Country, Waltham, MA USA). Transmission electron microscopy was performed using a JEM-200CX transmission electron microscope (TEM, JEOL, Tokyo, Japan). A Fourier transform infrared spectrometer (FT-IR-8400, Shimadzu, Kyoto, Japan) was used to record Fourier transform infrared spectra.
Multimodal Characterization of Nanomaterials
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